論文 - 中塚 理
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Defect evaluation in strain-relaxed Ge<sub>0.947</sub>Sn<sub>0.053</sub> grown on (001) Si 査読有り
Gupta, S; Shimura, Y; Richard, O; Douhard, B; Simoen, E; Bender, H; Nakatsuka, O; Zaima, S; Loo, R; Heyns, M
APPLIED PHYSICS LETTERS 113 巻 ( 19 ) 2018年11月
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Formation of epitaxial Hf digermanide/Ge(001) contact and its crystalline properties 査読有り
Nakatsuka, O; Suzuki, A; McVittie, J; Nishi, Y; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 7 ) 2018年7月
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Suzuki, A; Nakatsuka, O; Sakashita, M; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 6 ) 2018年6月
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Yamamoto, T; Taoka, N; Ohta, A; Truyen, NX; Yamada, H; Takahashi, T; Ikeda, M; Makihara, K; Nakatsuka, O; Shimizu, M; Miyazaki, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 6 ) 2018年6月
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Takahashi, K; Kurosawa, M; Ikenoue, H; Sakashita, M; Nakatsuka, O; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 4 ) 2018年4月
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Takahashi, K; Kurosawa, M; Ikenoue, H; Sakashita, M; Nakatsuka, O; Zaima, S
APPLIED PHYSICS LETTERS 112 巻 ( 6 ) 2018年2月
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Ike, S; Takeuchi, W; Nakatsuka, O; Zaima, S
THIN SOLID FILMS 645 巻 頁: 57 - 63 2018年1月
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Takeuchi, W; Yamamoto, K; Sakashita, M; Nakatsuka, O; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 1 ) 2018年1月
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Takeuchi, W; Washizu, T; Ike, S; Nakatsuka, O; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 1 ) 2018年1月
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Peng, Y; Miao, L; Li, C; Huang, R; Urushihara, D; Asaka, T; Nakatsuka, O; Tanemura, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 1 ) 2018年1月
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Formation of SiC thin films by chemical vapor deposition with vinylsilane precursor 査読有り
Doi, T; Takeuchi, W; Jin, Y; Kokubun, H; Yasuhara, S; Nakatsuka, O; Zaima, S
JAPANESE JOURNAL OF APPLIED PHYSICS 57 巻 ( 1 ) 2018年1月
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The morphological study of porous silicon formed by electrochemical anodization method
Suryana R., Sandi D. K., Nakatsuka O.
INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS FOR BETTER FUTURE 2017 333 巻 2018年
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A New Application of Ge<sub>1-<i>x</i></sub>Sn<i><sub>x</sub></i>: Thermoelectric Materials 査読有り
Kurosawa, M; Imai, Y; Iwahashi, T; Takahashi, K; Sakashita, M; Nakatsuka, O; Zaima, S
SIGE, GE, AND RELATED COMPOUNDS: MATERIALS, PROCESSING, AND DEVICES 8 86 巻 ( 7 ) 頁: 321 - 328 2018年
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Ike, S; Takeuchi, W; Nakatsuka, O; Zaima, S
SEMICONDUCTOR SCIENCE AND TECHNOLOGY 32 巻 ( 12 ) 2017年12月
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Kurosawa, M; Kato, M; Takahashi, K; Nakatsuka, O; Zaima, S
APPLIED PHYSICS LETTERS 111 巻 ( 19 ) 2017年11月
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Si1-xGex Bulk Single Crystals for Substrates of Electronic Devices 査読有り
K. Kinoshita, Y. Arai, T. Maeda, and O. Nakatsuka
Mater. Sci. Semicond. Proc. 70 巻 ( 1 ) 頁: 12-16 2017年11月
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Modulation of Fermi level pining position at metal/n-Ge interface by semimetal Ge1-xSnx and Sn interlayers 査読有り
A. Suzuki, M. Sakashita, O. Nakatsuka, and S. Zaima
Mater. Sci. Semicond. Proc. 70 巻 ( 1 ) 頁: 162-166 2017年11月
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Formation and characterization of Ge1-x-ySixSny/ Ge1-xSnx/Ge1-x-ySixSny double heterostructures with strain-controlled Ge1-x-ySixSny layers 査読有り
M. Fukuda, T. Yamaha, T. Asano, S. Fujinami, Y. Shimura, M. Kurosawa, O. Nakatsuka, and S. Zaima
Mater. Sci. Semicond. Proc. 70 巻 ( 1 ) 頁: 156-161 2017年11月
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Low-temperature crystallization of Ge-rich GeSn layers on Si3N4 substrate 査読有り
I. Yoshikawa, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
Mater. Sci. Semicond. Proc. 70 巻 ( 1 ) 頁: 151-155 2017年11月
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EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz 査読有り
Y. Shimura, T. Asano, T. Yamaha, M. Fukuda, W. Takeuchi, O. Nakatsuka, and S. Zaima
Mater. Sci. Semicond. Proc. 70 巻 ( 1 ) 頁: 133-138 2017年11月