Papers - Katsunori Makihara
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Characterization of Electronic Charged States of Si-Based Quantum Dots and Their Application to Floating Gate Memories Reviewed
S. Miyazaki, M. Ikeda and K. Makihara
ECS TRANSACTIONS Vol. 2 ( 1 ) page： 157-164 2006
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Fabrication of Multiply-Stacked Si Quantum Dots for Floating Gate MOS Devices Reviewed
K. Makihara, M. Ikeda, T. Nagai, H. Murakami, S. Higashi and S. Miyazaki
Transaction of MRS-J Vol. 31 ( 1 ) page： 133-136 2006
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Decay Characteristics of Electronic Charged States of Si Quantum Dots as Evaluated by an AFM/Kelvin Probe Technique Reviewed
J. Nishitani, K. Makihara, M. Ikeda, H. Murakami, S. Higashi and S. Miyazaki
Thin Solid Films Vol. 508 ( 1-2 ) page： 190-194 2006
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Control of the Nucleation Density of Si Quantum Dots by Remote Hydrogen Plasma Treatment Reviewed
K. Makihara, H. Deki, H. Murakami, S. Higashi and S. Miyazaki
Applied Surface Science Vol. 244 ( 1-4 ) page： 75-78 2005
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Formation of Microcrystalline Germanium (mc-Ge:H) Films From Inductively-Coupled Plasma CVD Reviewed
Y. Okamoto, K. Makihara, H. Murakami, S. Higashi and S. Miyazaki
Applied Surface Science Vol. 244 ( 1-4 ) page： 12-15 2005
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Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique Reviewed
K. Makihara, Y. Okamoto, H. Murakami, S. Higashi and S. Miyazaki
IEICE TRANSACTIONS on Electronics Vol. E88-C ( 4 ) page： 705-708 2005
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Electrical Characterization of Ge Microcrystallites by Atomic Force Microscopy Using a Conducting Probe Reviewed
K. Makihara, Y. Okamoto, H. Nakagawa, M. Ikeda, H. Murakami, S. Higashi and S. Miyazaki
Thin Solid Films Vol. 457 page： 103-108 2004
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Structural Defects effect on Ferromagnetism of Layered Oxysulfide (La1-xCaxO)Cu1-xNixS Reviewed
K. Takase, T. Shimizu, K. Makihara, Y. Takahashi, Y. Takano, K. Sekizawa, Y. Kuroiwa, S. Aoyagi, and A. Utsumi
Physica B Vol. 329-333 ( 2 ) page： 961-962 2003
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Electrical Resistivity and Photoemission Spectra of Layered Oxysulfide (La1-xCaxO)Cu1-xNixS Reviewed
K. Takase, T. Shimizu, K. Makihara, H. Sato, H. Negishi, Y. Takahashi, Y. Takano, K. Sekizawa, Y. Kuroiwa, S. Aoyagi, A. Utsumi, A. Wada, A. Ino, H. Namatame, M. Taniguchi
Physica B Vol. 329-333 ( 2 ) page： 898-899 2003
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Electrical Resistivity and Photoluminescence Spectrum of Layered Oxysulfide (LaO)CuS Reviewed
K. Takase, M. Koyano, T. Shimizu, K. Makihara, Y. Takahashi, Y. Takano, and K. Sekizawa
Solid State Communications Vol. 123 page： 531-534 2002