論文 - PRISTOVSEK Markus
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Novel organopalladium material formed on a sulfur-terminated GaAs(001) surface 査読有り
Arisawa M, Tsukamoto S, Shimoda M, Pristovsek M, Nishida A
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 41 巻 ( 11A ) 頁: L1197-L1199 2002年11月
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Structure analysis of the Ga-stabilized GaAs(001)-c(8x2) surface at high temperatures 査読有り
Ohtake A, Tsukamoto S, Pristovsek M, Koguchi N, Ozeki M
PHYSICAL REVIEW B 65 巻 ( 23 ) 2002年6月
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Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1-xAs growth in MOVPE 査読有り
Haberland K, Kaluza A, Zorn M, Pristovsek M, Hardtdegen H, Weyers M, Zettler JT, Richter W
JOURNAL OF CRYSTAL GROWTH 240 巻 ( 1-2 ) 頁: 87-97 2002年4月
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In-situ determination of the carrier concentration of (001) GaAs by Reflectance Anisotropy Spectroscopy 査読有り
Pristovsek M, Tsukamoto S, Koguchi N, Han B, Haberland K, Zettler JT, Richter W, Zorn M, Weyers M
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH 188 巻 ( 4 ) 頁: 1423-1429 2001年12月
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In situ investigation of GaAs (001) intrinsic carbon p-doping in metal-organic vapour phase epitaxy 査読有り
Pristovsek M, Han B, Zettler JT, Richter W
JOURNAL OF CRYSTAL GROWTH 221 巻 頁: 149-155 2000年12月
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Surface structure of ordered InGaP(001): The (2x4) reconstruction 査読有り
Vogt P, Ludge K, Zorn M, Pristovsek M, Braun W, Richter W, Esser N
PHYSICAL REVIEW B 62 巻 ( 19 ) 頁: 12601-12604 2000年11月
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Diffusion of Ga on the GaAs (113) surface in the [1(1)over-bar-0] direction during MOVPE growth 査読有り
Pristovsek M, Menhal H, Zettler JT, Richter W
APPLIED SURFACE SCIENCE 166 巻 ( 1-4 ) 頁: 433-436 2000年10月
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Dynamic study of the surfaces of (001) gallium arsenide in metal-organic vapor-phase epitaxy during arsenic desorption 査読有り
Pristovsek M, Trepk T, Klein M, Zettler JT, Richter W
JOURNAL OF APPLIED PHYSICS 87 巻 ( 3 ) 頁: 1245-1250 2000年2月
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Atomic structure and composition of the (2X4) reconstruction of InGaP(001) 査読有り
Vogt P, Ludge K, Zorn M, Pristovsek M, Braun W, Richter W, Esser N
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 18 巻 ( 4 ) 頁: 2210-2214 2000年
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(2x4) GaP(001) surface: Atomic structure and optical anisotropy 査読有り
Frisch AM, Schmidt WG, Bernholc J, Pristovsek M, Esser N, Richter W
PHYSICAL REVIEW B 60 巻 ( 4 ) 頁: 2488-2494 1999年7月
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GaP(001) and InP(001): Reflectance anisotropy and surface geometry 査読有り
Esser N, Schmidt WG, Bernholc J, Frisch AM, Vogt P, Zorn M, Pristovsek M, Richter W, Bechstedt F, Hannappel T, Visbeck S
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 17 巻 ( 4 ) 頁: 1691-1696 1999年
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Comparative study of the GaAs (113), (115), (001), ((1)over-bar(1)over-bar(5)over-bar), ((1)over-bar(1)over-bar(3)over-bar), and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy 査読有り
Pristovsek M, Menhal H, Schmidtling T, Esser N, Richter W
MICROELECTRONICS JOURNAL 30 巻 ( 4-5 ) 頁: 449-453 1999年
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Photoluminescence scanning near-field optical microscopy on III-V quantum dots 査読有り
Pahlke D, Poser F, Steimetz E, Pristovsek M, Esser N, Richter W
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH 170 巻 ( 2 ) 頁: 401-410 1998年12月
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Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques 査読有り
Zettler JT, Haberland K, Zorn M, Pristovsek M, Richter W, Kurpas P, Weyers M
JOURNAL OF CRYSTAL GROWTH 195 巻 ( 1-4 ) 頁: 151-162 1998年12月
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Reconstructions of the GaAs (1 1 3) surface 査読有り
Pristovsek M, Menhal H, Wehnert T, Zettler JT, Schmidtling T, Esser N, Richter W, Setzer C, Platen J, Jacobi K
JOURNAL OF CRYSTAL GROWTH 195 巻 ( 1-4 ) 頁: 1-5 1998年12月
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In situ characterization of GaAs growth in nitrogen atmosphere during MOVPE: a comparison to hydrogen atmosphere 査読有り
Hardtdegen H, Pristovsek M, Menhal H, Zettler JT, Richter W, Schmitz D
JOURNAL OF CRYSTAL GROWTH 195 巻 ( 1-4 ) 頁: 211-216 1998年12月
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Atomic structure of InP(001)-(2x4): A dimer reconstruction 査読有り
Schmidt WG, Bechstedt F, Esser N, Pristovsek M, Schultz C, Richter W
PHYSICAL REVIEW B 57 巻 ( 23 ) 頁: 14596-14599 1998年6月
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Response of the surface dielectric function to dynamic surface modifications: application of reflectance anisotropy spectroscopy and spectroscopic ellipsometry 査読有り
Zettler JT, Pristovsek M, Trepk T, Shkrebtii A, Steimetz E, Zorn M, Richter W
THIN SOLID FILMS 313 巻 頁: 537-543 1998年2月
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Ellipsometric and reflectance-anisotropy measurements on rotating samples 査読有り
Haberland K, Hunderi O, Pristovsek M, Zettler JT, Richter W
THIN SOLID FILMS 313 巻 頁: 620-624 1998年2月
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Structure of InP (001) surfaces prepared by decapping and by ion bombardment and annealing 査読有り
Pahlke D, Kinsky J, Schultz C, Pristovsek M, Zorn M, Esser N, Richter W
PHYSICAL REVIEW B 56 巻 ( 4 ) 頁: R1661-R1663 1997年7月