Papers - TABUCHI, Masao
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In situ X-ray investigation of changing barrier growth temperatures on InGaN single quantum wells in metal-organic vapor phase epitaxy Reviewed
Guangxu Ju, Yoshio Honda, Masao Tabuchi, Yoshikazu Takeda, and Hiroshi Amano
J. Appl. Phys. Vol. 115 page： 094906 2014
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In situ X-ray Reflectivity Measurements on Annealed InxGa1-xN Epilayer Grown by Metalorganic Vapor Phase Epitaxy Reviewed
Guangxu Ju, Shingo Fuchi, Masao Tabuchi, and Yoshikazu Takeda
Jpn. J. Appl. Phys. Vol. 52 page： 08JB12 2013
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Analysis of Cs/GaAs NEA surface by XAFS Reviewed
K. Tsubota, M. Tabuchi, T. Nishitani, A. Era, Y. Takeda
J. Phys.: Conf. Ser. Vol. 430 page： 012079 2013
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Critical current density and grain boundary property of BaFe2(As,P)2 thin films Reviewed
A. Sakagami, T. Kawaguchi, M. Tabuchi, T. Ujihara, Y. Takeda, H. Ikuta
Physica C Vol. 494 page： 181-184 2013
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In situ X-ray reflectivity of indium supplied on GaN templates by metal organic vapor phase epitaxy Reviewed
G. Ju, S. Fuchi, M. Tabuchi, and Y. Takeda
J. Appl. Phys. Vol. 114 page： 124906 2013
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Proximity effects and exchange bias in Co/MnF2(111) heterostructures studied by x-ray magnetic circular dichroism Reviewed
S. Suturin, V. Fedorov, A. Banshchikov, D. Baranov, K. Koshmak, P. Torelli, J. Fujii, G. Panaccione, K. Amemiya, M. Sakamaki, T. Nakamura, M. Tabuchi, L. Pasquali, N. Sokolov
J. Phys.: Condens. Matter Vol. 25 page： 046002 2013
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In-situ X-ray measurements of MOVPE growth of InGaN single quantum wells Reviewed
G. Ju, S. Fuchi, M. Tabuchi, Y. Takeda
J. Cryst. Growth Vol. 370 page： 36-41 2013
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Substrate dependence of the superconducting properties of NdFeAs(O,F) thin films
H. Uemura, T. Kawaguchi, T. Ohno, M. Tabuchi, T. Ujihara, Y. Takeda, H. Ikuta
Solid State Communications Vol. 152 page： 735-739 2012
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Composition fluctuations in InP/GaInAs/InP heterostructures -- X-ray CTR scattering and cross-sectional STM measurement
Y. Takeda, M. Masuda, M. Tabuchi, and A. Nakamura
IOP Conf. Ser. Vol. 24 page： 012004 2011
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X-ray characterization of GaN and related materials at growth temperatures -- system design and measurements
Y. Takeda, K. Ninoi, G. Ju, H. Kamiya, T. Mizuno, S. Fuchi, and M. Tabuchi
IOP Conf. Ser. Vol. 24 page： 012003 2011
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Evaluation of newly developed X-ray diffractometer equipped with Johansson monochromator
M. Tabuchi, H. Tameoka, T. Kawase, and Y. Takeda
IOP Conf. Ser. Vol. 24 page： 012007 2011
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Initial Stages of High-Temperature CaF2/Si(001) Epitaxial Growth Studied by Surface X-Ray Diffraction
S. Suturin, N. Sokolov, A. Banshchikov, R. Kyutt, O. Sakata, T. Shimura, J. Harada, M. Tabuchi, and Y. Takeda
J. Nanoscience and Nanotechnology Vol. 11 ( 4 ) page： 2990-2996 2011
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Molecular Beam Epitaxy Growth of Superconducting NdFeAs(O,F) Thin Films Using a F-Getter and a Novel F-Doping Method
T. Kawaguchi, H. Uemura, T. Ohno, M. Tabuchi, T. Ujihara, Y. Takeda, and H. Ikuta
Appl. Phys. Express Vol. 4 page： 083102 2011
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A study of an electron affinity of cesium telluride thin film
H. Sugiyama, K. Ogawa, J. Azuma, K. Takahashi, M. Kamada, T. NishitaniM. Tabuchi, T. Motoki, K. Takashima, A. Era, and Y. Takeda,,
Journal of Physics:ConferenceSeries Vol. 298 page： 012014 2011
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Superlattice Photocathode for High Brightness and Long NEA-surface lifetime
T. Nishitani, M. Tabuchi, K. Motoki, T. Takashima, A. Era, and Y. Takeda
Journal of Physics:ConferenceSeries Vol. 298 page： 012010 2011
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A study on EXAFS analysis of Cs/GaAs NEA surface
A. Era, M. Tabuchi, T. Nishitani, and Y. Takeda
Journal of Physics:ConferenceSeries Vol. 298 page： 012012 2011
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X-ray characterization at growth temperatures of InxGa1-xN growth by MOVPE
G. Ju , K. Ninoi, H. Kamiya, S. Fuchi, M. Tabuchi, and Y. Takeda
Journal of Crystal Growth Vol. 318 page： 1143-1146 2011
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Novel system for X-ray CTR scattering measurement on in-situ observation of OMVPE growth of nitride semiconductor heterostructures
K. Ninoi, G. Ju, H. Kamiya, S. Fuchi, M. Tabuchi, and Y. Takeda
Journal of Crystal Growth Vol. 318 page： 1139-1142 2011
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Development of X-ray diffractometer for in-situ observation of thin-film crystal growth equipped with focusing monochromator Reviewed
H. Tameoka, T. Kawase, M. Tabuchi, and Y. Takeda
Physica Status Solidi C Vol. 8 ( 2 ) page： 294-296 2011
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Ga and As composition profiles in InP/GaInAs/InP heterostructures -- x-ray CTR scattering and cross-sectional STM measurements
Y. Takeda, M. Tabuchi, and A. Nakamura
J. Phys.: Cond. Mat. Vol. 22 page： 474011 2010