Papers - MUTO, Shunsuke
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透過電子エネルギー損失分光における内殻励起スペクトルを利用した軽元素材料の局所領域構造解析 Reviewed
武藤俊介、田辺哲朗
表面科学 Vol. 23 page： 381-388 2002
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Formation of Si clusters in electron-irradiated SiC studied by electron energy-loss spectroscopy Reviewed
N. Asaoka, S. Muto and T. Tanabe
Diamond and Related Materials Vol. 10 page： 1247-1250 2001.4
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低角度入射電子顕微鏡法による表面微小構造体の非破壊分析 Reviewed
五十嵐慎一、武藤俊介、田辺哲朗
日本金属学会誌「分析電子顕微鏡法による材料評価」 Vol. 65 ( 5 ) page： 423-426 2001
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TEM-EXELFS法の効用：EXAFSとの対比 Invited
武藤俊介
電子顕微鏡 Vol. 36 ( 1 ) page： 65-67 2001
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エネルギー損失広域微細構造による短距離構造相関の解析―二体分布から多体分布導出へ―
武藤俊介、田辺哲朗
日本金属学会誌「分析電子顕微鏡法による材料評価」 Vol. 65 ( 5 ) page： 332-337 2001
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Detailed Structure Analysis of Deposit Layer in TEXTOR by Means of TEM Techniques Reviewed
S. Muto, N. Yokoya and T. Tanabe
Journal of Nuclear Materials Vol. 290-293 page： 295-298 2001
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Non-Destructive Structural Analysis of Surface Blistering by TEM and EELS in a Reflection Configuration Reviewed
S. Muto, T. Matsui and T. Tanabe
Journal of Nuclear Materials Vol. 290-293 page： 131-134 2001
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Energy-Filtered Image of Surface Blisters by Grazing Incidence Electron Microscopy Reviewed
S. Igarashi, S. Muto, T. Tanabe and T. Maruyama
Materials Transactions Vol. 42 ( 10 ) page： 2131-2132 2001
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Observation of Surface Blistering by Grazing Incidence Electron Microscopy
S. Muto, T. Matsui and T. Tanabe
Japanese Journal of Applied Physics Vol. 39 ( 6A ) page： 3555-3556 2000.4
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Application of spline wavelet transformation to the analysis of extended energy-loss fine structure Reviewed
S. Muto
Journal of Electron Microscopy Vol. 49 page： 525-529 2000.4
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Temperature effect of electron-irradiation-induced structural modification in graphite Reviewed
S. Muto and T. Tanabe
Journal of Nuclear Materials Vol. 283-287 page： 917-921 2000
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Wavelet analysis of extended energy-loss fine structure
S. Muto
Proceedings 12th European Congress on Electron Microscopy, EUREM-2000 Vol. 1 page： 321-322 2000
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TEM study on deuterium irradiation-induced defects in tungsten and molybdenum Reviewed
T. Matsui, S. Muto and T. Tanabe
Journal of Nuclear Materials Vol. 283-287 page： 1139-1143 2000
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Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
S. Muto, K. M. Yu, W. Walukiewicz, H-C. Jin and J. R. Abelson
Proceedings of 12th European Congress on Electron Microscopy, EUREM-2000 Vol. 1 page： 319-320 2000
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Structural Change in Graphite under Electron Irradiation at Low Temperatures
Journal of Nuclear Materials Vol. 271&272 page： 280-284 1999.4
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Local structures of Ga atoms in amorphous silicon and hydrogenated amorphous silicon before and after synchrotron X-ray irradiation
K. M. Yu, W. Walukiewicz, S. Muto, H.-G. Jin, J. R. Abelson, C. Clerc, C. J. Glover and M. C. Ridgway
Applied Physics Letters Vol. 75 ( 21 ) page： 3282-3284 1999.4
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Fragmentation of graphite crystals by electron irradiation at elevated temperatures
S. Muto and T. Tanabe
Journal of Electron Microscopy Vol. 48 ( 5 ) page： 519-523 1999.4
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Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
S. Muto, S. Horibuchi and T. Tanabe
Journal of Electron Microscopy Vol. 48 ( 6 ) page： 767-776 1999.4
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Change in Chemical Bonding States in Electron-Irrodiated Graphite(共著)
Japanese Journal of Applied Physics Part(]G0001[) Vol. 38 ( 3A ) page： 1514-1515 1999
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Molecular Dynamics Study on Local Atomic Displacements Associated with Point Defects and Displacive Phase Transformations(共著)
Materials Transactions, JIM Vol. 40 ( 6 ) page： 514-521 1999