Papers - MUTO, Shunsuke

透過電子エネルギー損失分光における内殻励起スペクトルを利用した軽元素材料の局所領域構造解析 Reviewed

武藤俊介、田辺哲朗

表面科学   Vol. 23   page： 381-388   2002

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Formation of Si clusters in electron-irradiated SiC studied by electron energy-loss spectroscopy Reviewed

N. Asaoka, S. Muto and T. Tanabe

Diamond and Related Materials   Vol. 10   page： 1247-1250   2001.4

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低角度入射電子顕微鏡法による表面微小構造体の非破壊分析 Reviewed

五十嵐慎一、武藤俊介、田辺哲朗

日本金属学会誌「分析電子顕微鏡法による材料評価」   Vol. 65 ( 5 ) page： 423-426   2001

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TEM-EXELFS法の効用：EXAFSとの対比 Invited

武藤俊介

電子顕微鏡   Vol. 36 ( 1 ) page： 65-67   2001

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エネルギー損失広域微細構造による短距離構造相関の解析―二体分布から多体分布導出へ―

武藤俊介、田辺哲朗

日本金属学会誌「分析電子顕微鏡法による材料評価」   Vol. 65 ( 5 ) page： 332-337   2001

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Detailed Structure Analysis of Deposit Layer in TEXTOR by Means of TEM Techniques Reviewed

S. Muto, N. Yokoya and T. Tanabe

Journal of Nuclear Materials   Vol. 290-293   page： 295-298   2001

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Non-Destructive Structural Analysis of Surface Blistering by TEM and EELS in a Reflection Configuration Reviewed

S. Muto, T. Matsui and T. Tanabe

Journal of Nuclear Materials   Vol. 290-293   page： 131-134   2001

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Energy-Filtered Image of Surface Blisters by Grazing Incidence Electron Microscopy Reviewed

S. Igarashi, S. Muto, T. Tanabe and T. Maruyama

Materials Transactions   Vol. 42 ( 10 ) page： 2131-2132   2001

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Observation of Surface Blistering by Grazing Incidence Electron Microscopy

S. Muto, T. Matsui and T. Tanabe

Japanese Journal of Applied Physics   Vol. 39 ( 6A ) page： 3555-3556   2000.4

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Application of spline wavelet transformation to the analysis of extended energy-loss fine structure Reviewed

S. Muto

Journal of Electron Microscopy   Vol. 49   page： 525-529   2000.4

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We propose a new analysis method of the extended energy-loss fine structure (EXELFS), applying the multi-resolution analysis (MRA) in the wavelet transformation. We select the cardinal spline wavelet where the rank-4 cardinal spline function is used as a scaling function to construct the mother wavelet. In contrast with the conventional analysis method, the present method is efficient in filtering out the high-frequency noise and low-frequency components introduced by the numerical analysis process without distorting the original signal components, which promises quantitative analyses with less uncertainties.

Temperature effect of electron-irradiation-induced structural modification in graphite Reviewed

S. Muto and T. Tanabe

Journal of Nuclear Materials   Vol. 283-287   page： 917-921   2000

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TEM study on deuterium irradiation-induced defects in tungsten and molybdenum Reviewed

T. Matsui, S. Muto and T. Tanabe

Journal of Nuclear Materials   Vol. 283-287   page： 1139-1143   2000

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Wavelet analysis of extended energy-loss fine structure

S. Muto

Proceedings 12th European Congress on Electron Microscopy, EUREM-2000   Vol. 1   page： 321-322   2000

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Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS

S. Muto, K. M. Yu, W. Walukiewicz, H-C. Jin and J. R. Abelson

Proceedings of 12th European Congress on Electron Microscopy, EUREM-2000   Vol. 1   page： 319-320   2000

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Structural Change in Graphite under Electron Irradiation at Low Temperatures

Journal of Nuclear Materials   Vol. 271&272   page： 280-284   1999.4

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Local structures of Ga atoms in amorphous silicon and hydrogenated amorphous silicon before and after synchrotron X-ray irradiation

K. M. Yu, W. Walukiewicz, S. Muto, H.-G. Jin, J. R. Abelson, C. Clerc, C. J. Glover and M. C. Ridgway

Applied Physics Letters   Vol. 75 ( 21 ) page： 3282-3284   1999.4

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Fragmentation of graphite crystals by electron irradiation at elevated temperatures

S. Muto and T. Tanabe

Journal of Electron Microscopy   Vol. 48 ( 5 ) page： 519-523   1999.4

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Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy

S. Muto, S. Horibuchi and T. Tanabe

Journal of Electron Microscopy   Vol. 48 ( 6 ) page： 767-776   1999.4

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Change in Chemical Bonding States in Electron-Irrodiated Graphite(共著)

Japanese Journal of Applied Physics Part(]G0001[)   Vol. 38 ( 3A ) page： 1514-1515   1999

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TEM Analysis of Surface Ridge Network in an Ion-Irradiated Graphite Thin Film

S. Muto, T. Tanabe, M. Takeuchi, Y. Kobayashi, S. Furuno and K. Hojou

Journal of Nuclear Materials   Vol. 271&272   page： 285-289   1999

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