Papers - MUTO, Shunsuke
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シリコン表面の水素イオン照射誘起ブリスターの非破壊構造解析と内部ガス圧評価 Reviewed
中野伸祐、榎本成晟、武藤俊介、田辺哲朗
日本金属学会会報「まてりあ」 Vol. 43 ( 12 ) page： 1008 2004.4
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Synthesis of boron nitride nanolayers encapsulating iron fine particles and boron nitride nanotubes Reviewed
H. Tokoro, S. Fujii, T. Oku and S. Muto
Materials Research Society Symposium Proceedings Vol. 789 page： N3.34-39 2004
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Valence Change of Cerium Ion associated with Redox reactions of Ceria-Zirconia Solid Solution by Electron Energy-Loss Spectroscopy Reviewed
S. Arai, S. Muto, J. Murai, T. Sasaki, Y. Ukyo, K. Kuroda and H. Saka
Mater.Trans. Vol. 45 page： 2951-2955 2004
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TEM analysis of blisters on Si surface formed by hydrogen ion irradiation Reviewed
S. Muto, T. Tanabe and S. Igarashi
Physica Scripta Vol. T108 page： 19-22 2004
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ブリスタリングによる応力変調を利用した局所シリコン酸化の観察 Reviewed
五十嵐慎一、板倉明子、北島正弘、中野伸祐、武藤俊介、田辺哲朗、山本博之、北條喜一
表面科学 Vol. 25 page： 562-567 2004
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Crystal Structure of Ce2Zr2O7 and β-Ce2Zr2O7.5 Reviewed
T. Sasaki, Y. Ukyo, K. Kuroda, S. Arai, S. Muto and H. Saka
Journal of ceramics society of Japan Vol. 112 ( 8 ) page： 440-444 2004
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電子エネルギー損失分光法によるセリア－ジルコニア固溶体の規則相の解析 Reviewed
荒井重勇、武藤俊介、村井盾哉、佐々木厳、右京良雄、黒田光太郎、坂公恭
日本金属学会誌 Vol. 68 ( 5 ) page： 264-268 2004
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EXELFS/ELNES study of electron irradiation induced oxidation of α-SiC Reviewed
S. Muto, H. Sugiyama, T. Kimura, T. Tanabe and T. Maruyama
Vol. 218C page： 117-122 2004
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Structure of an Oxygen-Related Defect Complex in SiC Studied with Electron Energy-Loss Spectroscopy Reviewed
S. Muto, H. Sugiyama, T. Kimura and T. Tanabe
Japanese Journal of Applied Physics Vol. 43 page： 1076-1080 2004
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Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials: its applicability Reviewed
S. Muto and T. Tanabe
Journal of Electron Microscopy Vol. 52 page： 125-132 2003
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Cross sectional TEM observation of gas-ion-irradiation induced surface blisters and their precursors in SiC Reviewed
S. Muto, T. Tanabe and T. Maruyama
Materials Transactions Vol. 44 ( 12 ) page： 2599-2604 2003
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Experimental and full multiple scattering approaches to energy-loss near-edge structures for c-Si, a-Si and a-Si:H Reviewed
K. Hayakawa, T. Fujikawa and S. Muto
Chemical Physics Letters Vol. 371 page： 498-503 2003
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Local structures and damage processes of electron irradiated α-SiC studied with transmission electron microscopy and electron energy-loss spectroscopy Reviewed
S. Muto and T. Tanabe
Journal of Applied Physics Vol. 93 page： 3765-3775 2003
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Damaging process of α-SiC under electron irradiation studied with electron microscopy and spectroscopy Reviewed
S. Muto, T. Tanabe, T. Shibayama, and H. Takahashi
Nuclear Instruments and Methods for Physics Research B Vol. 191 page： 519-523 2002
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Development of new TEM specimen holder for cathodoluminescence detection Reviewed
T. Tanabe, S. Muto and S. Tohtake
Journal of Electron Microscopy Vol. 51 page： 311-313 2002
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Surface Blistering of Ion Irradiated SiC studied by Grazing Incidence Electron Microscopy Reviewed
S. Igarashi, S. Muto T. Tanabe and T. Maruyama
Journal of Nuclear Materials Vol. 307-311 page： 1126-1129 2002
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TEM and EELS characterization of carbon dust and co-deposited layers from the TEXTOR tokamak Reviewed
Journal of Nuclear Materials Vol. 307-311 page： 1289-1293 2002
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In-situ Observation of Surface Blistering in Silicon by Deuterium and Helium Ion Irradiation Reviewed
S. Igarashi, S. Muto, T. Tanabe, J. Aihara and K. Hojou
Surface and Coatings Technology Vol. 158-159C page： 421-425 2002
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Chemical effects of hydrogen on surface damaging process in gas-ion irradiated alumina Reviewed
J. Asami, S. Muto and T. Tanabe
Surface and Coatings Technology Vol. 158-159C page： 518-521 2002
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RHEED study of irradiation-induced surface damage processes in Si and α-Al2O3 Reviewed
S. Muto, J. Asami and T. Tanabe
Nuclear Instruments and Methods for Physics Research B Vol. 196 page： 324-332 2002