Papers - MUTO, Shunsuke
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Application of spline wavelet transformation to the analysis of extended energy-loss fine structure Reviewed
S. Muto
Journal of Electron Microscopy Vol. 49 page： 525-529 2000.4
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Temperature effect of electron-irradiation-induced structural modification in graphite Reviewed
S. Muto and T. Tanabe
Journal of Nuclear Materials Vol. 283-287 page： 917-921 2000
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Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
S. Muto, K. M. Yu, W. Walukiewicz, H-C. Jin and J. R. Abelson
Proceedings of 12th European Congress on Electron Microscopy, EUREM-2000 Vol. 1 page： 319-320 2000
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TEM study on deuterium irradiation-induced defects in tungsten and molybdenum Reviewed
T. Matsui, S. Muto and T. Tanabe
Journal of Nuclear Materials Vol. 283-287 page： 1139-1143 2000
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Wavelet analysis of extended energy-loss fine structure
S. Muto
Proceedings 12th European Congress on Electron Microscopy, EUREM-2000 Vol. 1 page： 321-322 2000
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Structural Change in Graphite under Electron Irradiation at Low Temperatures
Journal of Nuclear Materials Vol. 271&272 page： 280-284 1999.4
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Local structures of Ga atoms in amorphous silicon and hydrogenated amorphous silicon before and after synchrotron X-ray irradiation
K. M. Yu, W. Walukiewicz, S. Muto, H.-G. Jin, J. R. Abelson, C. Clerc, C. J. Glover and M. C. Ridgway
Applied Physics Letters Vol. 75 ( 21 ) page： 3282-3284 1999.4
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Fragmentation of graphite crystals by electron irradiation at elevated temperatures
S. Muto and T. Tanabe
Journal of Electron Microscopy Vol. 48 ( 5 ) page： 519-523 1999.4
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Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
S. Muto, S. Horibuchi and T. Tanabe
Journal of Electron Microscopy Vol. 48 ( 6 ) page： 767-776 1999.4
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Change in Chemical Bonding States in Electron-Irrodiated Graphite(共著)
Japanese Journal of Applied Physics Part(]G0001[) Vol. 38 ( 3A ) page： 1514-1515 1999
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On EXELFS data analysis for obtaining reliable structural parameters
Y. Kobayashi, S. Muto, C. J. Echer and T. Tanabe
Journal of Electron Microscopy Vol. 48 ( 5 ) page： 525-529 1999
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The effects of X-ray induced structural changes on the microstructure of a-Si after thermal crystallization
K. M. Yu, W. Walukiewicz, S. Muto, H-C. Jin and J. R. Abelson
Applied Physics Letters Vol. 75 ( 14 ) page： 2032-2034 1999
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TEM Analysis of Surface Ridge Network in an Ion-Irradiated Graphite Thin Film
S. Muto, T. Tanabe, M. Takeuchi, Y. Kobayashi, S. Furuno and K. Hojou
Journal of Nuclear Materials Vol. 271&272 page： 285-289 1999
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Molecular Dynamics Study on Local Atomic Displacements Associated with Point Defects and Displacive Phase Transformations(共著)
Materials Transactions, JIM Vol. 40 ( 6 ) page： 514-521 1999
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The Influence of X-ray Irradiation on Structural Relaxation and Crystallization of Amorphous Silicon films
S. Muto, Y. Kobayashi, K.-M. Yu, W. Walukiewicz, C.J. Echer, S. McCormick and J.R. Abelson
Japanese Journal of Applied Physics Vol. 37 ( 11 ) page： 5890-5893 1998.4
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HREM-EELS Study of Structural Changes in Electron Irradiated Graphite (共著)
Proceedings of 14th International Congress on Electron Microscopy page： 119 1998
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Lacal Atom Displacements Around Crystal Lattice Defects Inducing Phase Transformation Studies by Molecular Dynamics Simulation (共著)
Proceedings of Pacific Rim International Conference on Advanced Materials and Processing page： 1461 1998
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Spatial and Structural Modification in Graphite by High-Energy Electron Irradiation (共著)
Proceedings of 5-th NIRIM International Symposium on Advanced Materials page： 129 1998
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TEM-EELS法による黒鉛の電子照射誘起構造変化 Invited Reviewed
まてりあ Vol. 37 ( 10 ) page： 873-879 1998
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A New Microscopic Model of Electron Irradiation Damage in Graphite
S. Muto, M. Takeuchi and T. Tanabe
Journal of Surface Analysis Vol. 3 ( 2 ) page： 420-425 1997.4