Papers - MUTO, Shunsuke
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Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials: its applicability Reviewed
S. Muto and T. Tanabe
Journal of Electron Microscopy Vol. 52 page： 125-132 2003
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Cross sectional TEM observation of gas-ion-irradiation induced surface blisters and their precursors in SiC Reviewed
S. Muto, T. Tanabe and T. Maruyama
Materials Transactions Vol. 44 ( 12 ) page： 2599-2604 2003
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Experimental and full multiple scattering approaches to energy-loss near-edge structures for c-Si, a-Si and a-Si:H Reviewed
K. Hayakawa, T. Fujikawa and S. Muto
Chemical Physics Letters Vol. 371 page： 498-503 2003
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Local structures and damage processes of electron irradiated α-SiC studied with transmission electron microscopy and electron energy-loss spectroscopy Reviewed
S. Muto and T. Tanabe
Journal of Applied Physics Vol. 93 page： 3765-3775 2003
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Damaging process of α-SiC under electron irradiation studied with electron microscopy and spectroscopy Reviewed
S. Muto, T. Tanabe, T. Shibayama, and H. Takahashi
Nuclear Instruments and Methods for Physics Research B Vol. 191 page： 519-523 2002
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Development of new TEM specimen holder for cathodoluminescence detection Reviewed
T. Tanabe, S. Muto and S. Tohtake
Journal of Electron Microscopy Vol. 51 page： 311-313 2002
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Surface Blistering of Ion Irradiated SiC studied by Grazing Incidence Electron Microscopy Reviewed
S. Igarashi, S. Muto T. Tanabe and T. Maruyama
Journal of Nuclear Materials Vol. 307-311 page： 1126-1129 2002
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TEM and EELS characterization of carbon dust and co-deposited layers from the TEXTOR tokamak Reviewed
Journal of Nuclear Materials Vol. 307-311 page： 1289-1293 2002
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In-situ Observation of Surface Blistering in Silicon by Deuterium and Helium Ion Irradiation Reviewed
S. Igarashi, S. Muto, T. Tanabe, J. Aihara and K. Hojou
Surface and Coatings Technology Vol. 158-159C page： 421-425 2002
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Chemical effects of hydrogen on surface damaging process in gas-ion irradiated alumina Reviewed
J. Asami, S. Muto and T. Tanabe
Surface and Coatings Technology Vol. 158-159C page： 518-521 2002
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RHEED study of irradiation-induced surface damage processes in Si and α-Al2O3 Reviewed
S. Muto, J. Asami and T. Tanabe
Nuclear Instruments and Methods for Physics Research B Vol. 196 page： 324-332 2002
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透過電子エネルギー損失分光における内殻励起スペクトルを利用した軽元素材料の局所領域構造解析 Reviewed
武藤俊介、田辺哲朗
表面科学 Vol. 23 page： 381-388 2002
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Formation of Si clusters in electron-irradiated SiC studied by electron energy-loss spectroscopy Reviewed
N. Asaoka, S. Muto and T. Tanabe
Diamond and Related Materials Vol. 10 page： 1247-1250 2001.4
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低角度入射電子顕微鏡法による表面微小構造体の非破壊分析 Reviewed
五十嵐慎一、武藤俊介、田辺哲朗
日本金属学会誌「分析電子顕微鏡法による材料評価」 Vol. 65 ( 5 ) page： 423-426 2001
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Non-Destructive Structural Analysis of Surface Blistering by TEM and EELS in a Reflection Configuration Reviewed
S. Muto, T. Matsui and T. Tanabe
Journal of Nuclear Materials Vol. 290-293 page： 131-134 2001
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Energy-Filtered Image of Surface Blisters by Grazing Incidence Electron Microscopy Reviewed
S. Igarashi, S. Muto, T. Tanabe and T. Maruyama
Materials Transactions Vol. 42 ( 10 ) page： 2131-2132 2001
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TEM-EXELFS法の効用：EXAFSとの対比 Invited
武藤俊介
電子顕微鏡 Vol. 36 ( 1 ) page： 65-67 2001
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エネルギー損失広域微細構造による短距離構造相関の解析―二体分布から多体分布導出へ―
武藤俊介、田辺哲朗
日本金属学会誌「分析電子顕微鏡法による材料評価」 Vol. 65 ( 5 ) page： 332-337 2001
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Detailed Structure Analysis of Deposit Layer in TEXTOR by Means of TEM Techniques Reviewed
S. Muto, N. Yokoya and T. Tanabe
Journal of Nuclear Materials Vol. 290-293 page： 295-298 2001
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Observation of Surface Blistering by Grazing Incidence Electron Microscopy
S. Muto, T. Matsui and T. Tanabe
Japanese Journal of Applied Physics Vol. 39 ( 6A ) page： 3555-3556 2000.4