Updated on 2021/11/17

写真a

 
ISHIDA Takafumi
 
Organization
Institute of Materials and Systems for Sustainability Advanced Measurement Technology Center (AMTC) Electron Nanoscopy Section Assistant Professor
Graduate School
Graduate School of Engineering
Title
Assistant Professor

Degree 1

  1. 博士(工学) ( 2015.3   名古屋大学 ) 

Research Areas 1

  1. Others / Others  / 電子顕微鏡

Current Research Project and SDGs 2

  1. 高速ダイレクト電子検出器の開発と時間分解電子顕微鏡観察への応用

  2. フォトカソード電子銃をもちいた新規電子顕微鏡法の開発

Research History 2

  1. Nagoya University   Assistant Professor

    2015.10

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    Country:Japan

  2. Nagoya University   Researcher

    2015.4 - 2015.9

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    Country:Japan

Education 3

  1. Nagoya University   Graduate School, Division of Engineering

    2013.4 - 2015.3

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    Country: Japan

  2. Meijo University   Graduate School, Division of Science and Engineering

    2011.4 - 2013.3

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    Country: Japan

  3. Meijo University   Faculty of Science and Engineering

    2007.4 - 2011.3

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    Country: Japan

Professional Memberships 3

  1. 日本顕微鏡学会   会員

  2. 応用物理学会   会員

  3. 日本物理学会   会員

Committee Memberships 3

  1. 公益社団法人 応用物理学会   プログラム委員(電子顕微鏡関連)  

    2020.10   

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    Committee type:Academic society

  2. 公益社団法人 日本顕微鏡学会   若手研究部会 幹事  

    2020.4   

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    Committee type:Academic society

  3. 公益社団法人 日本顕微鏡学会   第75回学術講演会 プログラム委員  

    2019.3 - 2019.6   

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    Committee type:Academic society

 

Papers 14

  1. Observation of domain wall bimerons in chiral magnets Reviewed

    T. Nagase, Y. So, H. Yasui, T. ishida, H. Yoshida, Y. Tanaka, K. Saitoh, N. Ikarashi, Y. Kawaguchi, M. Kuwahara, M. Nagao

    Nature Communications   Vol. 12 ( 1 ) page: 3490   2021.6

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    Language:English   Publishing type:Research paper (scientific journal)  

  2. Performance of a silicon-on-insulator direct electron detector in a low-voltage transmission electron microscope Reviewed

    Takafumi Ishida, Akira Shinozaki, Makoto Kuwahara, Toshinobu Miyoshi, Koh Saitoh, Yasuo Arai

    Microscopy   Vol. 70 ( 3 ) page: 321 - 325   2021.6

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1093/jmicro/dfaa072

  3. Intensity Interference in a Coherent Spin-Polarized Electron Beam Reviewed

    M. Kuwahara, Y. Yoshida, W. Nagata, K. Nakakura, M. Furui, T. Ishida, K. Saitoh, T. Ujihara, N. Tanaka

    Physical Review Letters   Vol. 126   page: 125501   2021.3

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1103/PhysRevLett.126.125501

  4. Development of a voltage-applicable heating specimen holder for in situ observations of solid oxide fuel cells with an environmental transmission electron microscope Reviewed

    Ishida Takafumi, Hiroshima Hideto, Higuchi Kimitaka, Tomita Masahiro, Saitoh Koh, Tanji Takayoshi

    SURFACE AND INTERFACE ANALYSIS   Vol. 52 ( 9 ) page: 584 - 590   2020.8

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1002/sia.6788

    Web of Science

  5. Time-resolved Transmission Electron Microscope Using Pulsed Electron Waves

    Kuwahara Makoto, Yokoi Rina, Mizuno Lira, Togashi Nobutaka, Yoshida Yuya, Nagata Wataru, Furui Masato, Nakakura Kojiro, Ishida Takafumi

    KENBIKYO   Vol. 55 ( 3 ) page: 131 - 138   2020

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    Language:Japanese   Publisher:The Japanese Society of Microscopy  

    <p>Pulsed electron wave-packet had been applied to a transmission electron microscopy (TEM) to improve the time-resolution. The pulsed electrons are created by photoemission process using a combination of a photocathode material and pulsed laser. We review time-scales of phenomena, performance of photocathodes and recent researches of time-resolved TEM. Especially the energy and momentum spreads of photocathode is discussed by our experimental result of time-resolved TEM using an NEA semiconductor photocathode. To introduce a novel electron microscopy using a quantum effect, we explain quantum physics in TEM involving special relativity, Dirac equation and a notation of two component spinor. Finally, we discuss key technologies and significant parameters for high temporal and high spatial resolutions.</p>

    DOI: 10.11410/kenbikyo.55.3_131

    CiNii Article

  6. Efficient Measurement of the Orbital-Angular-Momentum Spectrum of an Electron Beam via a Dammann Vortex Grating Reviewed

    Noguchi Yuuki, Nakayama Shota, Ishida Takafumi, Saitoh Koh, Uchida Masaya

    PHYSICAL REVIEW APPLIED   Vol. 12 ( 6 )   2019.12

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevApplied.12.064062

    Web of Science

  7. Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co8.5Zn7.5Mn4(110) Thin Film Reviewed

    Nagase T., Komatsu M., So Y. G., Ishida T., Yoshida H., Kawaguchi Y., Tanaka Y., Saitoh K., Ikarashi N., Kuwahara M., Nagao M.

    PHYSICAL REVIEW LETTERS   Vol. 123 ( 13 )   2019.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevLett.123.137203

    Web of Science

  8. Operando STEM-EELS Observation of Anodic Reactions in Solid Oxide Fuel Cells Reviewed

      Vol. 6   page: 112-113   2019

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    Authorship:Lead author   Language:English   Publishing type:Research paper (international conference proceedings)  

  9. Enhanced Hollow-cone Illumination TEM technique for Dynamical Observations of Light-elemens in Matereials Reviewed

    T. Kawasaki, T. Ishida, A. Kuwabara and Y. Ikuhara

    AMTC Letters   Vol. 6   page: 114-115   2019

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    Language:English   Publishing type:Research paper (scientific journal)  

  10. Phase-contrast Imaging by Annularly Arrayed Detectors in Hollow-cone Illumination STEM

    Ishida Takafumi, Kawasaki Tadahiro, Tanji Takayoshi, Ikuta Takashi

    KENBIKYO   Vol. 52 ( 1 ) page: 13 - 18   2017

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    Language:Japanese   Publisher:The Japanese Society of Microscopy  

    <p>We have developed a method that is able to reveal the phase shifts of electron waves using an annular aperture and annularly arrayed detectors in scanning transmission electron microscopy (STEM). The reconstructed phase image using this method will have the potential for the observation of thick crystalline specimens within the kinematical approximation, since this technique has an expanded focal depth, which reduces the blurring. In this paper, we will introduce details of this method and the STEM system, and recent results.</p>

    DOI: 10.11410/kenbikyo.52.1_13

    CiNii Article

  11. In situ Observation of Interfaces between Metal Electrode and Solid Oxide Electrolyte Prepared by FIB Reviewed

    T. Ishida, T. Tanji, M. Tomita, K, Higuchi, K. Saitoh

    AMTC Letters   Vol. 5   page: 46-47   2016

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

  12. Development of electrostatic spherical aberration corrector using annular and circular electrodes Reviewed

    T. Kawasaki, T. Ishida, Y. Takai, Y. Ogawa, M. Lomita, T. Matsutani, T. Kodama, T. Ikuta

    Surface and Interface Analysis   Vol. 48 ( 11 ) page: 1160-1165   2016

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    Language:English   Publishing type:Research paper (scientific journal)  

  13. Phase reconstruction in annular bright-field scanning transmission electron microscopy Reviewed

    T. Ishida, T. Kawasaki, T. Tanji, T. Kodama, T. Matsutani, K. Ogai, T. Ikuta

    Microscopy   Vol. 64   page: 69–76   2015

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

  14. Quantitative evaluation of annular bright-field phase images in STEM Reviewed

    T. Ishida, T. Kawasaki, T. Tanji, T. Ikuta

    Microscopy   Vol. 64   page: 121–128   2015

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

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Presentations 17

  1. レーザー駆動型電子銃およびダイレクト電子検出器を搭載した透過電子顕微鏡による時間分解観察 Invited

    石田高史

    2021年度WEBシンポジウム  2021.11.17  日本顕微鏡学会学際的顕微研究領域若手研究部会

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    Event date: 2021.11

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:Online   Country:Japan  

  2. Dynamic Observation of Reversible Phenomena in A Time-resolved Transmission Electron Microscope using An Optical-frequency Stabilization Technique International conference

    Masato Furui, Kojiro Nakakura, Yuya Yoshida, Wataru Nagata, Takafumi Ishida, Koh Saitoh, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Poster presentation  

    Venue:Online   Country:Japan  

  3. Time-resolved measurement in ultrafast transmission electron microscopy International conference

    Makoto Kuwahara, Kojiro Nakakura, Masato Furui, Takafumi Ishida, Koh Saitoh

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

  4. Sub-microsecond Electron Imaging using a Time-resolved Transmission Electron Microscope with an SOI Pixel Detector International conference

    Takafumi Ishida, Akira Shinozaki, Toshinobu Miyoshi, Koh Saitoh, Yasuo Arai, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

  5. Single-Shot Imaging in TEM with a High-Charge Bunched Beam International conference

    Kojiro Nakakura, Masato Furui, Yuya Yoshida, Wataru Nagata, Takafumi Ishida, Koh Saitoh, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Poster presentation  

    Venue:Online   Country:Japan  

  6. 透過電子顕微鏡による先端時間分解計測技術の研究開発 Invited

    石田高史

    東海NFRW・東海地区若手チャプタージョイントワークショップ  2021.10.19  応用物理学会

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    Event date: 2021.10

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:名古屋、オンライン   Country:Japan  

  7. Application of SOI integration-type pixel sensors and up-to-date process

    Toshinobu Miyoshi, Yasuo Arai, Kazuhiko Hara, Toshiaki Inada, Takafumi Ishida, Yoshio Kamiya, Tsutomu Mibe, Shingo Mitsui, Ryutaro Nishimura, Toshihiko Sasaki, Takehiro Takayanagi, Toru Tsuboyama, Miho Yamada, Taha Youssef

    2021 IEEE Nuclear Science Symposium and Medical Imaging Conference  2021.10.21  IEEE Nuclear & Plasma Sciences Society

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    Event date: 2021.10

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Virtual (online)   Country:Japan  

  8. 光電陰極電子源を用いた100kVパルス透過電子顕微鏡による時間分解計測

    桑原真人、水野りら、中蔵虎次郞、古井雅人、森下英郎、石田高史、長沖功、揚村寿英

    第82階応用物理学会秋季学術講演会  2021.9.10  応用物理学会

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    Event date: 2021.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン  

  9. 電子ベッセルビームをもちいたADF-STEMにおける焦点深度拡大

    石田高史、大塚真弘、桑原真人、齋藤晃、川崎忠寛

    第82回応用物理学会秋季学術講演会  2021.9.10  応用物理学会

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    Event date: 2021.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン  

  10. 低加速透過電子顕微鏡による SOI ダイレクト電子検出器の性能評価

    石田高史,篠崎 暉,桑原真人,三好敏喜,齋藤 晃,新井康夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:つくば国際会議場   Country:Japan  

  11. フォトカソードを用いた透過電子顕微鏡における干渉性と時間分解計測への応用

    桑原真人,横井里奈,永田 渉,古井雅人,中蔵虎二郎,石田高史,齋藤 晃,田中信夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Presentation type:Oral presentation (invited, special)  

    Venue:つくば国際会議場   Country:Japan  

  12. パルス透過電子顕微鏡を用いた時間分解計測

    桑原真人,水野りら,横井里奈,吉田優也,桒原彰太,石田高史,齋藤 晃,田中信夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Presentation type:Oral presentation (invited, special)  

    Venue:つくば国際会議場   Country:Japan  

  13. 周波数安定化パルスレーザーを用いた可逆反応の動的TEM観察

    古井雅人,中蔵虎二郎,吉田優也,永田渉,石田高史,齋藤 晃,桑原真人

    日本顕微鏡学会第77回学術講演会  2021.6  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Poster presentation  

    Venue:つくば国際会議場   Country:Japan  

  14. 高密度パルス電子線によるシングルショットイメージング

    中蔵虎二郎, 古井雅人, 吉田優也, 永田渉, 石田高史, 齋藤 晃, 桑原真人

    日本顕微鏡学会第77回学術講演会  2021.6  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Poster presentation  

    Venue:つくば国際会議場   Country:Japan  

  15. MBE法によるBa(Zn,Fe)2As2薄膜の作製及び物性評価

    池上 諒,清澤知正,畑野敬史,石田高史,浦田隆広,飯田和昌,生田博志

    第68回応用物理学会 春季学術講演会  2021.3.18  応用物理学会

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    Event date: 2021.3

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン開催   Country:Japan  

  16. カイラル磁性薄膜におけるドメインウォールスキルミオンの観測

    長瀬知輝, 肖英紀, 安井隼太, 石田高史, 吉田紘行, 田仲由喜夫, 齋藤晃, 五十嵐信行, 川口由紀, 桑原真人, 長尾全寛

    日本物理学会2020年秋季大会  日本物理学会

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    Event date: 2020.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン開催   Country:Japan  

  17. SOI ピクセル検出器をもちいたサブマイクロ秒 シングルショットイメージング

    石田高史,篠崎暉,桑原真人,三好敏喜,新井康夫,齋藤晃

    日本顕微鏡学会第76回学術講演会  2020.5  日本顕微鏡学会

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    Event date: 2020.5

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:紙面上開催   Country:Japan  

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KAKENHI (Grants-in-Aid for Scientific Research) 4

  1. Ultra-fast operando measurement using pulse electron beam

    Grant number:21H04637  2021.4 - 2025.3

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    Authorship:Coinvestigator(s) 

  2. 空間電荷制限下で動作する薄膜フォトカソード電子銃における雑音低減の研究

    Grant number:21K14535  2021.4 - 2023.3

    科学研究費補助金   若手研究

    石田 高史

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    Authorship:Principal investigator 

    Grant amount:\4680000 ( Direct Cost: \3600000 、 Indirect Cost:\1080000 )

    従来の電子源は放出電子数にばらつきがあり、そのばらつきが雑音となり電子顕微鏡像の像質を制限してきた。本研究ではこの制限を克服するためにこれまで電子源の電子放出性能を低下させるとされてきた空間電荷効果を活用し、放出電子を整列させることで量子雑音の低減を目指す。具体的には、空間電荷制限下で動作する薄膜フォトカソード電子銃を作製し、量子雑音が低減された連続・パルス電子線の生成および観測を行う。

  3. Development of a novel spin-analysis using a coherent spin-polarized electron beam

    Grant number:17H02737  2017.4 - 2021.3

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    Authorship:Coinvestigator(s)  Grant type:Competitive

  4. Development of time-resolved transmission electron microscopy using highly coherent pulsed electron beams for obversion of magnetic skyrmion motion

    Grant number:17K14117  2017.4 - 2020.3

    Grant-in-Aid for Scientific Research  Grant-in-Aid for Young Scientists(B)

    Ishida Takafumi

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    Authorship:Principal investigator  Grant type:Competitive

    Grant amount:\4290000 ( Direct Cost: \3300000 、 Indirect Cost:\990000 )

    In order to observe motion of fine magnetic strictures such as magnetic skyrmions, a method of time-resolved observation by a pulsed electron beam with a photocathode type electron gun and a direct electron detector was developed in a low-voltage transmission electron microscope. We have succeeded in generating sub-micro second pulsed electron beams at high intensity. In addition, we have realized single-shot imaging at high signal-to-noise ratio using synchronous measurement. A time-resolved transmission electron microscopy with continuous image acquisition at 500 ns interval was established by using high-speed deflector.

 

Teaching Experience (On-campus) 3

  1. 物理工学実験第2

    2020

  2. 物理工学実験第1

    2020

  3. 物理工学実験第3

    2020