Updated on 2024/09/27

写真a

 
ISHIDA Takafumi
 
Organization
Institute of Materials and Systems for Sustainability Advanced Measurement Technology Center (AMTC) Electron Nanoscopy Section Assistant Professor
Graduate School
Graduate School of Engineering
Title
Assistant Professor

Degree 1

  1. 博士(工学) ( 2015.3   名古屋大学 ) 

Research Areas 1

  1. Others / Others  / 電子顕微鏡

Current Research Project and SDGs 2

  1. 高速ダイレクト電子検出器の開発と時間分解電子顕微鏡観察への応用

  2. フォトカソード電子銃をもちいた新規電子顕微鏡法の開発

Research History 2

  1. Nagoya University   Assistant Professor

    2015.10

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    Country:Japan

  2. Nagoya University   Researcher

    2015.4 - 2015.9

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    Country:Japan

Education 3

  1. Nagoya University   Graduate School, Division of Engineering

    2013.4 - 2015.3

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    Country: Japan

  2. Meijo University   Graduate School, Division of Science and Engineering

    2011.4 - 2013.3

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    Country: Japan

  3. Meijo University   Faculty of Science and Engineering

    2007.4 - 2011.3

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    Country: Japan

Professional Memberships 3

  1. 日本顕微鏡学会   会員

  2. 応用物理学会   会員

  3. 日本物理学会   会員

Awards 4

  1. The Japanese Society of Microscopy Award for the Scientific Paper (FUNDAMENTALS) in 2023

    2023.6   The Japanese Society of Microscopy  

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    Award type:Honored in official journal of a scientific society, scientific journal 

  2. 風戸研究奨励賞

    2023.3   公益財団法人 風戸研究奨励会   SOI技術をもちいた高速電子直接検出器の開発

    石田高史

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    Award type:Award from publisher, newspaper, foundation, etc.  Country:Japan

  3. 日本顕微鏡学会和文誌賞

    2022.5   公益社団法人 日本顕微鏡学会   パルス電子波を用いた時間分解透過電子顕微鏡

    桒原真人、横井里奈、水野りら、冨樫将孝、吉田優也、永田渉、古井雅人、中蔵虎二郎、石田高史

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    Award type:Award from Japanese society, conference, symposium, etc.  Country:Japan

  4. 11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17 Excellent Presentation Award

    2017.12   11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17   Development of a voltage applying and heating specimen holder for observation of solid oxide fuel cell's reactions in environmental TEM

    Takafumi Ishida

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    Award type:Award from international society, conference, symposium, etc.  Country:Japan

 

Papers 20

  1. Development of silicon-on-insulator direct electron detector with analog memories in pixels for sub-microsecond imaging Invited Reviewed

    Takafumi Ishida , Kosei Sugie , Toshinobu Miyoshi , Yuichi Ishida , Koh Saitoh , Yasuo Arai , Makoto Kuwahara

    Microscopy     2024.6

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1093/jmicro/dfae029

  2. Carbonization of a Molybdenum Substrate Surface and Nanoparticles by a One-Step Method of Femtosecond Laser Ablation in a Hexane Solution Reviewed

    Yoshiki Tanaka, Xi Yu, Shusaku Terakawa, Takafumi Ishida, Koh Saitoh, Hongwei Zhang, Toru Asaka, Fumihiro Itoigawa, Makoto Kuwahara, Shingo Ono

    ACS Omega   Vol. 8 ( 8 ) page: 7932 - 7939   2023.2

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1021/acsomega.2c07697

  3. Static Hydrophobic Cuprous Oxide Surface Fabricated via One-Step Laser-Induced Oxidation of a Copper Substrate Reviewed

    Xi Yu, Yoshiki Tanaka, Tomoki Kakiuchi, Takafumi Ishida, Koh Saitoh, Fumihiro Itoigawa, Makoto Kuwahara, Shingo Ono

    Micromachines   Vol. 14 ( 1 ) page: 185   2023.1

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.3390/mi14010185

  4. Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy Reviewed

    Takafumi Ishida, Takeshi Owaki, Masahiro Ohtsuka, Makoto Kuwahara, Koh Saitoh, Tadahiro Kawasaki

    Applied Physics Express   Vol. 15 ( 11 ) page: 115001   2022.11

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.35848/1882-0786/ac96ce

    Web of Science

    Scopus

  5. Transient electron energy-loss spectroscopy of optically stimulated gold nanoparticles using picosecond pulsed electron beam Reviewed

    Makoto Kuwahara , Lira Mizuno , Rina Yokoi , Hideo Morishita , Takafumi Ishida , Koh Saitoh , Nobuo Tanaka , Shota Kuwahara , Toshihide Agemura

    Applied Physics Letters   Vol. 121 ( 14 ) page: 143503   2022.10

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/5.0108266

    Web of Science

    Scopus

  6. Thin film growth of Ba(Zn,Fe)(2)As-2 by molecular beam epitaxy Reviewed

    Ikegami R., Hatano T., Kiyozawa T., Ishida T., Tomizawa Y., Iida K., Ikuta H.

    THIN SOLID FILMS   Vol. 758   2022.9

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:Thin Solid Films  

    We have grown Ba(Zn1-xFex)2As2 thin films by molecular beam epitaxy. Epitaxial thin films with various Fe contents up to x = 0.16 were obtained by employing fluoride substrates and supplying Zn and As in excess. The film of the parent compound BaZn2As2 showed a metallic behavior in the temperature range of 50–300 K, although semiconducting behavior with a bandgap of 0.23 eV has been reported for a polycrystalline bulk sample. The metallic behavior can be ascribed to a defect layer near the film/substrate interface that was found by a cross-sectional microstructure observation. For the Fe-substituted films, on the other hand, no such defect layer was observed, and the temperature dependence of resistivity showed semiconducting behavior. BaZn2As2 is known as a parent compound of diluted magnetic semiconductors, but the magnetization measurements of the Fe doped films showed no evidence of ferromagnetic order.

    DOI: 10.1016/j.tsf.2022.139420

    Web of Science

    Scopus

  7. Observation of domain wall bimerons in chiral magnets Reviewed

    T. Nagase, Y. So, H. Yasui, T. ishida, H. Yoshida, Y. Tanaka, K. Saitoh, N. Ikarashi, Y. Kawaguchi, M. Kuwahara, M. Nagao

    Nature Communications   Vol. 12 ( 1 ) page: 3490   2021.6

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    Language:English   Publishing type:Research paper (scientific journal)  

  8. Performance of a silicon-on-insulator direct electron detector in a low-voltage transmission electron microscope Reviewed

    Takafumi Ishida, Akira Shinozaki, Makoto Kuwahara, Toshinobu Miyoshi, Koh Saitoh, Yasuo Arai

    Microscopy   Vol. 70 ( 3 ) page: 321 - 325   2021.6

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1093/jmicro/dfaa072

  9. Intensity Interference in a Coherent Spin-Polarized Electron Beam Reviewed

    M. Kuwahara, Y. Yoshida, W. Nagata, K. Nakakura, M. Furui, T. Ishida, K. Saitoh, T. Ujihara, N. Tanaka

    Physical Review Letters   Vol. 126   page: 125501   2021.3

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1103/PhysRevLett.126.125501

  10. Development of a voltage-applicable heating specimen holder for in situ observations of solid oxide fuel cells with an environmental transmission electron microscope Reviewed

    Ishida Takafumi, Hiroshima Hideto, Higuchi Kimitaka, Tomita Masahiro, Saitoh Koh, Tanji Takayoshi

    SURFACE AND INTERFACE ANALYSIS   Vol. 52 ( 9 ) page: 584 - 590   2020.8

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1002/sia.6788

    Web of Science

  11. Time-resolved Transmission Electron Microscope Using Pulsed Electron Waves

    Kuwahara Makoto, Yokoi Rina, Mizuno Lira, Togashi Nobutaka, Yoshida Yuya, Nagata Wataru, Furui Masato, Nakakura Kojiro, Ishida Takafumi

    KENBIKYO   Vol. 55 ( 3 ) page: 131 - 138   2020

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    Language:Japanese   Publisher:The Japanese Society of Microscopy  

    <p>Pulsed electron wave-packet had been applied to a transmission electron microscopy (TEM) to improve the time-resolution. The pulsed electrons are created by photoemission process using a combination of a photocathode material and pulsed laser. We review time-scales of phenomena, performance of photocathodes and recent researches of time-resolved TEM. Especially the energy and momentum spreads of photocathode is discussed by our experimental result of time-resolved TEM using an NEA semiconductor photocathode. To introduce a novel electron microscopy using a quantum effect, we explain quantum physics in TEM involving special relativity, Dirac equation and a notation of two component spinor. Finally, we discuss key technologies and significant parameters for high temporal and high spatial resolutions.</p>

    DOI: 10.11410/kenbikyo.55.3_131

  12. Efficient Measurement of the Orbital-Angular-Momentum Spectrum of an Electron Beam via a Dammann Vortex Grating Reviewed

    Noguchi Yuuki, Nakayama Shota, Ishida Takafumi, Saitoh Koh, Uchida Masaya

    PHYSICAL REVIEW APPLIED   Vol. 12 ( 6 )   2019.12

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevApplied.12.064062

    Web of Science

  13. Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co8.5Zn7.5Mn4(110) Thin Film Reviewed

    Nagase T., Komatsu M., So Y. G., Ishida T., Yoshida H., Kawaguchi Y., Tanaka Y., Saitoh K., Ikarashi N., Kuwahara M., Nagao M.

    PHYSICAL REVIEW LETTERS   Vol. 123 ( 13 )   2019.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevLett.123.137203

    Web of Science

  14. Enhanced Hollow-cone Illumination TEM technique for Dynamical Observations of Light-elemens in Matereials Reviewed

    T. Kawasaki, T. Ishida, A. Kuwabara and Y. Ikuhara

    AMTC Letters   Vol. 6   page: 114-115   2019

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    Language:English   Publishing type:Research paper (scientific journal)  

  15. Operando STEM-EELS Observation of Anodic Reactions in Solid Oxide Fuel Cells Reviewed

      Vol. 6   page: 112-113   2019

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    Authorship:Lead author   Language:English   Publishing type:Research paper (international conference proceedings)  

  16. Phase-contrast Imaging by Annularly Arrayed Detectors in Hollow-cone Illumination STEM

    Ishida Takafumi, Kawasaki Tadahiro, Tanji Takayoshi, Ikuta Takashi

    KENBIKYO   Vol. 52 ( 1 ) page: 13 - 18   2017

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    Language:Japanese   Publisher:The Japanese Society of Microscopy  

    <p>We have developed a method that is able to reveal the phase shifts of electron waves using an annular aperture and annularly arrayed detectors in scanning transmission electron microscopy (STEM). The reconstructed phase image using this method will have the potential for the observation of thick crystalline specimens within the kinematical approximation, since this technique has an expanded focal depth, which reduces the blurring. In this paper, we will introduce details of this method and the STEM system, and recent results.</p>

    DOI: 10.11410/kenbikyo.52.1_13

  17. Development of electrostatic spherical aberration corrector using annular and circular electrodes Reviewed

    T. Kawasaki, T. Ishida, Y. Takai, Y. Ogawa, M. Lomita, T. Matsutani, T. Kodama, T. Ikuta

    Surface and Interface Analysis   Vol. 48 ( 11 ) page: 1160-1165   2016

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    Language:English   Publishing type:Research paper (scientific journal)  

  18. In situ Observation of Interfaces between Metal Electrode and Solid Oxide Electrolyte Prepared by FIB Reviewed

    T. Ishida, T. Tanji, M. Tomita, K, Higuchi, K. Saitoh

    AMTC Letters   Vol. 5   page: 46-47   2016

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

  19. Phase reconstruction in annular bright-field scanning transmission electron microscopy Reviewed

    T. Ishida, T. Kawasaki, T. Tanji, T. Kodama, T. Matsutani, K. Ogai, T. Ikuta

    Microscopy   Vol. 64   page: 69–76   2015

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

  20. Quantitative evaluation of annular bright-field phase images in STEM Reviewed

    T. Ishida, T. Kawasaki, T. Tanji, T. Ikuta

    Microscopy   Vol. 64   page: 121–128   2015

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

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Presentations 46

  1. SOIピクセル検出器を用いた単電子検出による電子線干渉実験

    石田 裕一 , 石田 高史 , 桑原 真人 , 新井 康夫 , 齋藤 晃

    第85回 応用物理学会秋季学術講演会  2024.9.17  応用物理学会

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    Event date: 2024.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:新潟   Country:Japan  

  2. SOI技術を用いた高速撮影可能なダイレクト電子検出器の開発

    石田 高史 , 石田 裕一 , 桑原 真人 , 新井 康夫 , 齋藤 晃

    第85回 応用物理学会秋季学術講演会  2024.9.17  応用物理学会

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    Event date: 2024.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:新潟   Country:Japan  

  3. 透過型電子顕微鏡における SOI ピクセル検出器 INTPIX4 のイメージング性能評価

    石田 裕一 , 石田 高史 , 桑原 真人 , 新井 康夫 , 齋藤 晃

    日本顕微鏡学会第80回学術講演会  2024.6.5  日本顕微鏡学会

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    Event date: 2024.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:幕張メッセ  

  4. Development of advanced direct electron detection cameras using SOI technology Invited

    Takafumi Ishida , Kosei Sugie , Yuichi Ishida , Koh Saitoh , Yasuo Arai , Makoto Kuwahara

    The 80th Annual Meeting of The Japanese Society of Microscopy  2024.6.2  The Japanese Society of Microscopy

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    Event date: 2024.6

    Language:English   Presentation type:Oral presentation (invited, special)  

    Venue:Makuhar messe   Country:Japan  

  5. マルチスライス法へのスピン偏極効果の導入

    中根 爽太 , 齋藤 晃 , 石田 高史 , 桑原 真人

    日本顕微鏡学会第80回学術講演会  2024.6.4  日本顕微鏡学会

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    Event date: 2024.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:幕張メッセ   Country:Japan  

  6. ピコ秒パルス電子線を用いた金ナノ粒子のレーザー照射下における超高速構造変化の観察

    永見 洸陽 , 牧元 翔太郎 , 齋藤 晃 , 石田 高史 , 桑原 真人

    日本顕微鏡学会第80回学術講演会  2024.6.4  日本顕微鏡学会

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    Event date: 2024.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:幕張メッセ  

  7. サブマイクロ秒時間分解観察のための SOI 直接電子検出器の開発

    石田 高史 , 杉江 晃成 , 石田 裕一 , 齋藤 晃 , 新井 康夫 , 桑原 真人

    日本顕微鏡学会第80回学術講演会  2024.6.5  日本顕微鏡学会

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    Event date: 2024.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:幕張メッセ   Country:Japan  

  8. Robust Principal Component Analysis Applied to Dynamic Observation in Time-Resolved Transmission Electron Microscope International conference

    Hiroki Yamaguchi, Shotaro Makimoto, Ryosuke Mori, Koh Saitoh, Takafumi Ishida and Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  9. Elucidation of Annealing Effect on a Laser-Irradiated ZnO Subsrate Surface by Transmission Electctron Microscope International conference

    Koyo Nagami, Xi Yu, Takafumi Ishida, Koh Saitoh and Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  10. Development of a data acquisition system for a silicon-on-insulator detector with analog memories for high-speed electron imaging International conference

    Kosei Sugie, Takafumi Ishida, Makoto Kuwahara, Yasuo Arai and Koh Saitoh

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  11. In-situ observation of electric potential in time-resolved transmission electron microscopy International conference

    Shotaro Makimoto, Kazuko Uchida, Koh Saitoh Takafumi Ishida and Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  12. Development of a Measurement Method for Critical Current Density of Poly-crystalline Superconductors Using Electron Backscatter Diffraction International conference

    R. Hikosaka, K. Shimada, T. Hatano, T. Ishida, S. Tokuda, Y. Hasegawa, A. Yamamoto, K. Iida, K. Saitoh, M. Kuwahara and H. Ikuta

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  13. Development of a transmission photocathode using thin film lanthanum hexaboride International conference

    Takafumi Ishida, Makoto Kuwahara and Koh Saitoh

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  14. Introduction of Spin-Polarization Effects into Multislice Methods International conference

    Sota Nakane, Takahumi Ishida, Koh Saito and Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2023  2023.12.2  Organizing committee of ICMaSS2023, Nagoya University

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    Event date: 2023.12

    Language:English   Presentation type:Poster presentation  

    Venue:Nagoya, Japan  

  15. Development of high-speed electron-beam imaging using SOI image sensors Invited

    2023.9.28 

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    Event date: 2023.9

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Country:Japan  

  16. Development of 100-kV time-resolved TEM using a semiconductor photocathode and observation of transient phenomena in energy-loss spectrum International conference

    M.Kuwahara, T.Ishida, K.Smith, H.Morishita, S.Kuwahara, T.Agemura

    The 20th International Microscopy Congress  2023.9  IFSM,KOREAN SOCIETY OF MICROSCOPY

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    Event date: 2023.9

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Busan, Korea  

  17. Transient Phenomena of Plasmons on Gold Nanoparticle Investigated by Time-resolved TEM International conference

    M. Kuwahara, T. Ishida, H. Morishita, S. Kuwahara, and T. Agemur

    IAMNano2023 実⾏委員会  2023.6 

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    Event date: 2023.6 - 2023.7

    Language:English   Presentation type:Poster presentation  

  18. Elucidation of Annealing Effect on a Laser-irradiated ZnO Substrate Surface by Transmission Electron Microscope International conference

    K. Nagami, X. Yu, T. Ishida, K. Saitoh, and M. Kuwahara

    IAMNano 2023 International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices  2023.6  IAMNano2023 実⾏委員会

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    Event date: 2023.6 - 2023.7

    Language:Japanese   Presentation type:Poster presentation  

    Venue:Kunibiki Messe, Shimane, Japan  

  19. 環状暗視野走査透過電子顕微鏡法における電子 ベッセルビームの焦点深度拡大効果

    石田 高史 , 大塚 真弘 , 桑原 真人 , 齋藤 晃 , 川崎 忠寛

    日本顕微鏡学会第79回学術講演会  2023.6.26  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:松江   Country:Japan  

  20. 透過電子顕微鏡を用いたZnO材料の熱処理効果の解明

    永見 洸陽 , 余 希 , 石田 高史 , 齋藤 晃 , 桑原 真人

    日本顕微鏡学会第79回学術講演会  2023.6.28  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:松江   Country:Japan  

  21. 100kV時間分解TEMを用いた電子エネルギー損失分光におけるピコ秒過渡現象の観測

    桒原 真人 , 牧元 翔太郎 , 山口 紘輝 , 中根 爽太 , 永見 洸陽 , 石田 高史 , 齋藤 晃 , 森下 英郎 , 長沖 功 , 桒原 彰太 , 揚村 寿英

    日本顕微鏡学会第79回学術講演会  2023.6.28  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:松江  

  22. メモリを搭載したSOI検出器のデータ収集システムの開発

    杉江 晃成 , 石田 高史 , 桑原 真人 , 新井 康夫 , 齋藤 晃

    日本顕微鏡学会第79回学術講演会  2023.6.28  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:松江   Country:Japan  

  23. 100kV時間分解TEMにおける電圧印加ホルダー の開発とpn接合のその場観察への応用

    牧元 翔太郎 , 内田 和子 , 齋藤 晃 , 石田 高史 , 桑原 真人

    日本顕微鏡学会第79回学術講演会  2023.6.28  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (general)  

  24. 低加速透過電子顕微鏡によるSOI技術を用いた ダイレクト電子検出器の性能評価 Invited

    石田 高史 , 篠崎 暉 , 三好 敏喜 , 齋藤 晃 , 桑原 真 , 新井 康夫

    日本顕微鏡学会第79回学術講演会  2023.6.27  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:松江   Country:Japan  

  25. SOI-CMOS技術を用いた電子顕微鏡用半導体イ メージセンサの開発 Invited

    新井 康夫 , 石田 高史 , 桑原 真人

    日本顕微鏡学会第79回学術講演会  2023.6.26  日本顕微鏡学会

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    Event date: 2023.6

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:松江   Country:Japan  

  26. LaB6薄膜をもちいた透過光型フォトカソード電子銃の開発

    石田高史、桑原真人、齋藤晃

    第70回 応用物理学会春季学術講演会  2023.3.16  応用物理学会

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    Event date: 2023.3

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:上智大学   Country:Japan  

  27. フェムト秒レーザーパルスによる酸化亜鉛の表面劈開

    余 希、武田 有真、濱崎 周太、石田 高史、桑原 真人、齋藤 晃、糸魚川 文広、小野 晋吾

    レーザー学会学術講演会第43回年次大会  2023.1.18  レーザー学会

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    Event date: 2023.1

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:名古屋   Country:Japan  

  28. ワンステップレーザー照射による銅基板表面の撥水性形成

    余 希、田中 良樹、垣内 智貴、石田 高史、齋藤 晃、糸魚川 文広、桑原 真人、小野 晋吾

    レーザー学会学術講演会第43回年次大会  2023.1.18  レーザー学会

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    Event date: 2023.1

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:名古屋   Country:Japan  

  29. Surface cleavage of zinc oxide induced by femtosecond laser irradiation International conference

    Xi Yu, Yuma Takeda, Shuta Hamasaki, Takafumi Ishida, Makoto Kuwahara, Koh Saitoh, Fumihiro Itoigawa, Shingo Ono

    The 15th Pacific Rim Conference on Lasers and Electro-Optics (CLEO-PR 2022)  2022.8.4  CLEO-PR2022 Organizing Committee

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    Event date: 2022.7 - 2022.8

    Language:English   Presentation type:Poster presentation  

    Venue:Sapporo   Country:Japan  

  30. レーザー駆動型電子銃およびダイレクト電子検出器を搭載した透過電子顕微鏡による時間分解観察 Invited

    石田高史

    2021年度WEBシンポジウム  2021.11.17  日本顕微鏡学会学際的顕微研究領域若手研究部会

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    Event date: 2021.11

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:Online   Country:Japan  

  31. Dynamic Observation of Reversible Phenomena in A Time-resolved Transmission Electron Microscope using An Optical-frequency Stabilization Technique International conference

    Masato Furui, Kojiro Nakakura, Yuya Yoshida, Wataru Nagata, Takafumi Ishida, Koh Saitoh, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Poster presentation  

    Venue:Online   Country:Japan  

  32. Time-resolved measurement in ultrafast transmission electron microscopy International conference

    Makoto Kuwahara, Kojiro Nakakura, Masato Furui, Takafumi Ishida, Koh Saitoh

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

  33. Sub-microsecond Electron Imaging using a Time-resolved Transmission Electron Microscope with an SOI Pixel Detector International conference

    Takafumi Ishida, Akira Shinozaki, Toshinobu Miyoshi, Koh Saitoh, Yasuo Arai, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Online   Country:Japan  

  34. Single-Shot Imaging in TEM with a High-Charge Bunched Beam International conference

    Kojiro Nakakura, Masato Furui, Yuya Yoshida, Wataru Nagata, Takafumi Ishida, Koh Saitoh, Makoto Kuwahara

    International Conference on Materials and Systems for Sustainability 2021  2021.11.5  Nagoya University

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    Event date: 2021.11

    Language:English   Presentation type:Poster presentation  

    Venue:Online   Country:Japan  

  35. 透過電子顕微鏡による先端時間分解計測技術の研究開発 Invited

    石田高史

    東海NFRW・東海地区若手チャプタージョイントワークショップ  2021.10.19  応用物理学会

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    Event date: 2021.10

    Language:Japanese   Presentation type:Oral presentation (invited, special)  

    Venue:名古屋、オンライン   Country:Japan  

  36. Application of SOI integration-type pixel sensors and up-to-date process

    Toshinobu Miyoshi, Yasuo Arai, Kazuhiko Hara, Toshiaki Inada, Takafumi Ishida, Yoshio Kamiya, Tsutomu Mibe, Shingo Mitsui, Ryutaro Nishimura, Toshihiko Sasaki, Takehiro Takayanagi, Toru Tsuboyama, Miho Yamada, Taha Youssef

    2021 IEEE Nuclear Science Symposium and Medical Imaging Conference  2021.10.21  IEEE Nuclear & Plasma Sciences Society

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    Event date: 2021.10

    Language:English   Presentation type:Oral presentation (general)  

    Venue:Virtual (online)   Country:Japan  

  37. 光電陰極電子源を用いた100kVパルス透過電子顕微鏡による時間分解計測

    桑原真人、水野りら、中蔵虎次郞、古井雅人、森下英郎、石田高史、長沖功、揚村寿英

    第82階応用物理学会秋季学術講演会  2021.9.10  応用物理学会

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    Event date: 2021.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン  

  38. 電子ベッセルビームをもちいたADF-STEMにおける焦点深度拡大

    石田高史、大塚真弘、桑原真人、齋藤晃、川崎忠寛

    第82回応用物理学会秋季学術講演会  2021.9.10  応用物理学会

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    Event date: 2021.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン  

  39. 低加速透過電子顕微鏡による SOI ダイレクト電子検出器の性能評価

    石田高史,篠崎 暉,桑原真人,三好敏喜,齋藤 晃,新井康夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:つくば国際会議場   Country:Japan  

  40. フォトカソードを用いた透過電子顕微鏡における干渉性と時間分解計測への応用

    桑原真人,横井里奈,永田 渉,古井雅人,中蔵虎二郎,石田高史,齋藤 晃,田中信夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Presentation type:Oral presentation (invited, special)  

    Venue:つくば国際会議場   Country:Japan  

  41. パルス透過電子顕微鏡を用いた時間分解計測

    桑原真人,水野りら,横井里奈,吉田優也,桒原彰太,石田高史,齋藤 晃,田中信夫

    日本顕微鏡学会第77回学術講演会  2021.6.16  日本顕微鏡学会

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    Event date: 2021.6

    Presentation type:Oral presentation (invited, special)  

    Venue:つくば国際会議場   Country:Japan  

  42. 高密度パルス電子線によるシングルショットイメージング

    中蔵虎二郎, 古井雅人, 吉田優也, 永田渉, 石田高史, 齋藤 晃, 桑原真人

    日本顕微鏡学会第77回学術講演会  2021.6  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Poster presentation  

    Venue:つくば国際会議場   Country:Japan  

  43. 周波数安定化パルスレーザーを用いた可逆反応の動的TEM観察

    古井雅人,中蔵虎二郎,吉田優也,永田渉,石田高史,齋藤 晃,桑原真人

    日本顕微鏡学会第77回学術講演会  2021.6  日本顕微鏡学会

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    Event date: 2021.6

    Language:Japanese   Presentation type:Poster presentation  

    Venue:つくば国際会議場   Country:Japan  

  44. MBE法によるBa(Zn,Fe)2As2薄膜の作製及び物性評価

    池上 諒,清澤知正,畑野敬史,石田高史,浦田隆広,飯田和昌,生田博志

    第68回応用物理学会 春季学術講演会  2021.3.18  応用物理学会

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    Event date: 2021.3

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン開催   Country:Japan  

  45. カイラル磁性薄膜におけるドメインウォールスキルミオンの観測

    長瀬知輝, 肖英紀, 安井隼太, 石田高史, 吉田紘行, 田仲由喜夫, 齋藤晃, 五十嵐信行, 川口由紀, 桑原真人, 長尾全寛

    日本物理学会2020年秋季大会  日本物理学会

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    Event date: 2020.9

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:オンライン開催   Country:Japan  

  46. SOI ピクセル検出器をもちいたサブマイクロ秒 シングルショットイメージング

    石田高史,篠崎暉,桑原真人,三好敏喜,新井康夫,齋藤晃

    日本顕微鏡学会第76回学術講演会  2020.5  日本顕微鏡学会

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    Event date: 2020.5

    Language:Japanese   Presentation type:Oral presentation (general)  

    Venue:紙面上開催   Country:Japan  

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Research Project for Joint Research, Competitive Funding, etc. 1

  1. SOI技術をもちいた高速電子直接検出器の開発

    2023.4 - 2025.3

    公益財団法人 風戸研究奨励会  風戸研究奨励賞 

    石田高史

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    Authorship:Principal investigator  Grant type:Competitive

    Grant amount:\2000000

KAKENHI (Grants-in-Aid for Scientific Research) 5

  1. 光電コヒーレント転写による電子線の波動関数制御の研究

    Grant number:22H03868  2022.4 - 2026.3

    科学研究費助成事業  基盤研究(B)

    齋藤 晃, 石田 高史

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    Authorship:Coinvestigator(s) 

    本研究では、空間中を伝播する電子の波動関数を自在に操る技術の構築を目指し、光から電子への状態転写を利用したまったく新しい電子波の波動関数制御の可能性を実験的に検証する。応募者のグループがこれまで開発してきたスピン偏極パルス透過電子顕微鏡は、電子源として負の電気親和性をもつ半導体フォトカソード型電子銃を搭載している。このフォトカソードに振幅および位相に構造をもつレーザー光を入射し、光から電子への状態転写を利用して振幅および位相に構造をもつ電子線を生成する。この技術を利用した「ZコントラストTEM法」、 「電子らせん波の生成」および「構造化照明電子顕微鏡法」などの新しい電子顕微鏡法の開発を目指す。

  2. Ultra-fast operando measurement using pulse electron beam

    Grant number:21H04637  2021.4 - 2025.3

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    Authorship:Coinvestigator(s) 

  3. 空間電荷制限下で動作する薄膜フォトカソード電子銃における雑音低減の研究

    Grant number:21K14535  2021.4 - 2023.3

    科学研究費助成事業  若手研究

    石田 高史

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    Authorship:Principal investigator 

    Grant amount:\4680000 ( Direct Cost: \3600000 、 Indirect Cost:\1080000 )

    従来の電子源は放出電子数にばらつきがあり、そのばらつきが雑音となり電子顕微鏡像の像質を制限してきた。本研究ではこの制限を克服するためにこれまで電子源の電子放出性能を低下させるとされてきた空間電荷効果を活用し、放出電子を整列させることで量子雑音の低減を目指す。具体的には、空間電荷制限下で動作する薄膜フォトカソード電子銃を作製し、量子雑音が低減された連続・パルス電子線の生成および観測を行う。
    本研究では電子銃から放出される電子線の雑音を低減可能な薄膜フォトカソード電子銃の開発を目的に、本年度は1)薄膜フォトカソードの作製、2)電子銃の電極設計・製作および真空チャンバーの立ち上げを主に進めた。1)薄膜フォトカソードの作製では、パルスレーザー堆積法を用いて酸化マグネシウム基板上に六ホウ化ランタンを成膜した。本薄膜は走査透過電子顕微鏡により結晶構造観察と組成分析を行った。六ホウ化ランタン薄膜は多結晶として成膜され、フォトカソードとして利用可能な結晶性薄膜であることがわかった。また基板と薄膜の界面は不純物が析出しておりターゲットの純度の向上が求められることもわかった。2)電子銃の電極設計・製作では、上記の薄膜フォトカソードが搭載可能な電極の設計・製作を進めた。薄膜フォトカソード表面の酸化膜を取り除くために真空中で1300度以上の高温での加熱が必要となる。そのため電極には高融点材料あるモリブデンをもちいた。薄膜フォトカソードの加熱機構にはタングステンワイヤーによる抵抗加熱方式を採用した。真空チャンバーにヒータ付き電極を搭載し-1kVの電圧印加と1400度を超える加熱が可能であることを確認した。真空チャンバーの立ち上げでは、スパッタイオンポンプに加え非蒸発型ゲッタポンプを真空チャンバーに搭載した。本真空チャンバーはベーキングにより超高真空が容易に達成され、光電子放出に十分な真空を準備することができた。
    当初の計画では2021年度は1)薄膜フォトカソードの作製と2)電極の設計・作製を予定していた。1)については酸化マグネシウム基板上に六ホウ化ランタンを蒸着し、薄膜の作製に成功した。また2)にいてもアノードおよびカソードや加熱機構の開発が完了した。以上のように従来の目的は達成された。これに加えて半導体検出器やレンズステージの設計も完了し次年度の計画の遂行に過不足ない状況である。
    高効率な電子線検出が可能な半導体検出器およびフォトカソードへの入射光をマイクロメートルオーダまで集光するためのレンズを真空内に保持するためのホルダーを作製した後、真空チャンバーに搭載し本フォトカソードでの電子放出特性を測定する。フォトカソードの結晶性の向上や電子銃の電極の改良についても実験の進捗に合わせ進める。

  4. Development of a novel spin-analysis using a coherent spin-polarized electron beam

    Grant number:17H02737  2017.4 - 2021.3

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    Authorship:Coinvestigator(s)  Grant type:Competitive

  5. Development of time-resolved transmission electron microscopy using highly coherent pulsed electron beams for obversion of magnetic skyrmion motion

    Grant number:17K14117  2017.4 - 2020.3

    Grant-in-Aid for Scientific Research  Grant-in-Aid for Young Scientists(B)

    Ishida Takafumi

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    Authorship:Principal investigator  Grant type:Competitive

    Grant amount:\4290000 ( Direct Cost: \3300000 、 Indirect Cost:\990000 )

    In order to observe motion of fine magnetic strictures such as magnetic skyrmions, a method of time-resolved observation by a pulsed electron beam with a photocathode type electron gun and a direct electron detector was developed in a low-voltage transmission electron microscope. We have succeeded in generating sub-micro second pulsed electron beams at high intensity. In addition, we have realized single-shot imaging at high signal-to-noise ratio using synchronous measurement. A time-resolved transmission electron microscopy with continuous image acquisition at 500 ns interval was established by using high-speed deflector.

 

Teaching Experience (On-campus) 12

  1. Physical Science and Engineering Laboratory 2

    2023

  2. Physical Science and Engineering Laboratory 1

    2023

  3. Physical Science and Engineering Laboratory 3

    2023

  4. Physical Science and Engineering Laboratory 3

    2022

  5. 物理工学実験第2

    2022

  6. 物理工学実験第1

    2022

  7. 物理工学実験第3

    2021

  8. 物理工学実験第2

    2021

  9. 物理工学実験第1

    2021

  10. 物理工学実験第2

    2020

  11. 物理工学実験第1

    2020

  12. 物理工学実験第3

    2020

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Academic Activities 3

  1. 応用物理学会学術講演会プログラム編集委員(電子顕微鏡関連)

    Role(s):Planning, management, etc.

    応用物理学会  2020.9

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    Type:Competition, symposium, etc. 

  2. 日本顕微鏡学会学際的顕微研究領域若手研究部会幹事

    Role(s):Planning, management, etc.

    2020.4 - 2023.3

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    Type:Academic society, research group, etc. 

  3. 日本顕微鏡学会第75回学術講演会プログラム委員

    Role(s):Planning, management, etc.

    日本顕微鏡学会  2019.3 - 2019.6

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    Type:Competition, symposium, etc.