論文 - 大塚 真弘
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Nonlocality in spherical-aberration-corrected HAADF STEM images 査読有り
Masahiro Ohtsuka, Takashi Yamazaki, Yasutoshi Kotaka, Hironori Fujisawa, Masaru Shimizu, Koichiro Honda, Iwao Hashimoto, Kazuto Watanabe
69 巻 頁： 289-296 2013年4月
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Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEM 査読有り
Masahiro Ohtsuka, Takashi Yamazaki, Yasutoshi Kotaka, Iwao Hashimoto, Kazuto Watanabe
Ultramicroscopy 120 巻 頁： 48-55 2012年9月
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Comparison of Interface Characterization between Ag(In,Ga)Se2 and Cu(In,Ga)Se2 Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy 査読有り
Zhang Xianfeng, Tsuyoshi Kobayashi, Yasuyoshi Kurokawa, Yoshiyuki Tashiro, Masahiro Ohtsuka, Tomoyuki Yamada, Akira Yamada
Japanese Journal of Applied Physics 50 巻 頁： 126603 2011年11月
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Effect of convergent beam semiangle on image intensity in HAADF STEM images 査読有り
Koji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, Masahiro Ohtsuka, Iwao Hashimoto, Kazuto Watanabe
Acta Crystallographica Section A 66 巻 頁： 10-16 2010年
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Many-beam dynamical simulation for multilayer structures without a superlattice cell 査読有り
Masahiro Ohtsuka, Takashi Yamazaki, Iwao Hashimoto, Kazauto Watanabe
Acta Crystallographica Section A 65 巻 頁： 135-140 2009年
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Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images 査読有り
Koji Kuramochi, Yasutoshi Kotaka, Takashi Yamazaki, Masahiro Ohtsuka, Iwao Hashimoto, Kazuto Watanabe
Ultramicroscopy 110 巻 頁： 36-42 2009年
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Quantitative and easy estimation of a crystal bending effect using low-order CBED patterns 査読有り
Takashi Yamazaki, Akihiro Kashiwagi, Koji Kuramoshi, Masahiro Ohtsuka, Iwao Hashimoto, Kazuto Watanabe
Journal of Electron Microscopy 57 巻 頁： 181-187 2008年