Faculty Profiles - KOJIMA Hiroki

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中野裕介，小島寛樹，土屋賢治，早川直樹

平成26年電気学会基礎・材料・共通部門大会

汲田将之，小島寛樹，吉田昌展，早川直樹

平成26年電気学会基礎・材料・共通部門大会

Quench-induced Dynamic Breakdown Characteristics of LN₂ and LN₂/PPLP Composite Electrical Insulation System for Superconducting Power Apparatus International conference

N. Hayakawa, T. Matsuoka, S. Nishimachi, H. Kojima, M. Hanai

Applied Superconductivity Conference

Fault Current Limiting Cooperation in Power Transmission System with Superconducting Fault Current Limiting Cables (SFCLC) International conference

H. Kojima, T. Osawa, M. Hanai, N. Hayakawa

Applied Superconductivity Conference

Breakdown Characteristics and Size Effect in Sub-Cooled Liquid Nitrogen International conference

N. Hayakawa, S. Nishimachi, T. Matsuoka, H. Kojima, M. Hanai, H. Okubo

18th International Conference on Dielectric Liquids 2014.7.3 IEEE Dielectrics and Electrical Insulation Society

Event date： 2014.6 - 2014.7

Language：English Presentation type：Oral presentation (general)

Venue：Bled Country：Slovenia

We systematically investigated and discussed the ac breakdown (BD) characteristics and mechanisms of liquid nitrogen (LN2) for different pressures (0.1-0.3 MPa) and temperatures (65-77 K) under quasi-uniform electric field (field utilization factor ζ = 0.986-0.674). The BD strength (EB) in sub-cooled LN2 (SLN2) was analyzed and discussed in terms of size effect, taking account of the stressed liquid volume (SLV) with the electric field distribution in SLN2. We also included the other reseachers' data on BD characteristics of LN2, and extended the evaluation by applying the concept of α % SLV (SLV with the electric field strength higher than the decisive electric field factor (α) of the highest electric field strength). As the result, we found that EB with the 50 % probability decreased linearly with the increase in α % SLV on a universal line, i.e. EB = 78.4 × (α % SLV) -1/8.15, irrespective of the pressure and temperature of LN2.

DOI： 10.1109/ICDL.2014.6893087

Scopus

Other Link： https://www.webofscience.com/wos/woscc/full-record/WOS:000360485100018

空気中の絶縁破壊チャネル発生に及ぼす部分放電残留電荷の影響

北村卓也，小島寛樹，小林金也，加藤達朗，六戸敏昭，早川直樹

平成26年電気学会全国大会