講演・口頭発表等 - 中塚 理
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界面層挿入が低仕事関数金属/n型4H-SiC界面のSBHに与える影響
土井拓馬, 柴山茂久, 坂下満男, 清水三聡, 中塚理
第68回応用物理学会春季学術講演会 2021年3月18日
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Si(001)基板上におけるSi1−xSnx薄膜のエピタキシャル成長
黒澤昌志, 丹下龍志, 中塚理
第68回応用物理学会春季学術講演会 2021年3月18日
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ウェット熱処理によるZrO2薄膜の強誘電相発現機構
柴山茂久, 永野丞太郎, 安坂幸師, 坂下満男, 中塚理
第68回応用物理学会春季学術講演会 2021年3月17日
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高温堆積におけるZrO2薄膜結晶相の下地依存性
永野丞太郎, 柴山茂久, 坂下満男, 中塚理
第68回応用物理学会春季学術講演会 2021年3月16日
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Heterostructure design favorable for n+-Ge1−xSnx pseudo-direct transition layer for optoelectronic application 招待有り 国際会議
S. Zhang, M. Fukuda, S. Shibayama, and O. Nakatsuka
13th International Symposium on Advanced Plasma Scienceand its Applications for Nitrides and Nanomaterials / 14th International Conference on Plasma-Nano Technology & Science, (ISPlasma2021/IC-PLANTS2021)
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Epitaxial growth of strain‐relaxed and high-Sn-content n-Ge1-xSnx on Si(111) substrate with Ge buffer layer 招待有り 国際会議
A. Huang, S. Shibayama, and O. Nakatsuka
The 8th Asian Conference on Crystal Growth and Crystal Technology (CGCT)
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HfO2-ZrO2系の強誘電相発現におけるウェット熱処理の効果
柴山茂久, 永野丞太郎, 坂下満男, 中塚理
応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第26回) 2021年1月23日
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低仕事関数金属/4H-SiC界面におけるMIGSの影響
土井拓馬, 柴山茂久, 坂下満男, 清水三聡, 中塚理
応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「電子デバイス界面テクノロジー研究会―材料・プロセス・デバイス特性の物理―」(第26回) 2021年1月26日
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低仕事関数金属を用いたn型4H-SiCに対する低ショットキー障壁コンタクトの実現
土井拓馬, 柴山茂久, 坂下満男, 清水三聡, 中塚理
先進パワー半導体分科会第7回講演会 2021年1月22日
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GeSn系Ⅳ族混晶半導体の創製と結晶・電子物性制御 招待有り
中塚理
第5回TIA-EXA広域エレクトロニクス融合セミナー ~革新デバイスに向けた新材料と集積技術~ 2020年12月9日
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Heteroepitaxy and Strain Engineering of Germanium-Silicon-Tin Ternary Alloy Semiconductor Thin Films for Energy Band Design 招待有り 国際会議
O. Nakatsuka, S. Shibayama, M. Kurosawa, and M. Sakashita
Pacificrim Meeting on Electrochemical and Solid-State Science (PRiME2020)
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Crystal Growth of Epitaxial 3C-SiC Thin Film on Si Substrate By Chemical Vapor Deposition using Single Precursor of Vinylsilane 国際会議
T. Doi, K. Hashimoto, W. Takeuchi, and O. Nakatsuka
Pacificrim Meeting on Electrochemical and Solid-State Science (PRiME2020)
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Understanding wet annealing effect on phase transition and ferroelectric phase formation for Hf1-xZrxO2 film 国際会議
S. Shibayama, J. Nagano, M. Sakashita, and O. Nakatsuka
2020 Inthernational Conference on Solid State Devices and Materials (SSDM2020)
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コンタクト抵抗率低減のための金属/IV族半導体界面制御技術 招待有り
中塚理, 柴山茂久, 坂下満男
第84回半導体・集積回路技術シンポジウム
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Ge1-xSnx溶融成長時に生じる偏析現象の理解
中尾天哉, 西島泰樹, 清水智, 角田功, 中塚理, 黒澤昌志
第81回応用物理学会秋季学術講演会
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多層ゲルマナンフレークからの水素脱離
伊藤麻維, 洗平昌晃, 大田晃生, 中塚理, 黒澤昌志
第81回応用物理学会秋季学術講演会 2020年9月9日
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GaAs(001)基板上におけるGe1−x−ySixSny薄膜のエピタキシャル成長
中田壮哉, 詹天卓, 富田基裕, 渡邉孝信, 中塚理, 黒澤昌志
第81回応用物理学会秋季学術講演会 2020年9月9日
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絶縁膜上における極薄Ge薄膜の固相成長
大石遼, 黒澤昌志, 中塚理
第81回応用物理学会秋季学術講演会 2020年9月9日
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GeSn系IV族混晶ヘテロ構造の結晶成長と光電物性制御 招待有り
中塚 理
阪大CSRN 第二回異分野研究交流会 「半導体・ナノカーボン系」 2020年8月28日
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In-situ Sb Doping into Ge1−xSnx Epitaxial Layer toward Enhancement of Photoluminescence Intensity 国際会議
M. Fukuda, J. Jeon, M. Sakashita, S. Shibayama, M. Kurosawa, and O. Nakatsuka
The 8th International Symposium on Control of Semiconductor Interfaces (ISCSI-VIII)
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Crystal Growth and Characterization of Group-IV Alloy Semiconductor Heterostructures for Future Electronic Devices 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, S. Shibayama, and M. Sakashita, S. Zaima
The 8th International Symposium on Control of Semiconductor Interfaces (ISCSI-VIII)
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Ferroelectric Phase Evolution of Undoped ZrO2 Thin Film by Wet O2 Annealing Process 国際会議
S. Shibayama, J. Nagano, M. Sakashita, O. Nakatsuka
2019 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF2019)
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Saturation of Activated Sb Atom in Heavily Sb-Doped Ge Epitaxial Thin Films 国際会議
J. Jeon, S. Shibayama, S. Zaima, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Thermoelectric properties of silicon germanium wires with a composition gradient 国際会議
M. Nakata, O. Nakatsuka, M. Tomita, T. Watanabe, and M. Kurosawa
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Theoretical Investigation of Self-organization Behavior of Si0.5Sn0.5 Nano-particles 国際会議
Y. Nagae, M. Kurosawa, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Development of in-situ cyclic metal layer oxidation to form abrupt Al2O3/4H-SiC interface 国際会議
T. Doi, S. Shibayama, W. Takeuchi, M. Sakashita, N. Taoka, M. Shimizu, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Optoelectronic Property of GeSn and GeSiSn Heterostructure 国際会議
M. Fukuda, M. Sakashita, S. Shibayama, M. Kurosawa, S. Zaima, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Improvement of thermoelectric properties of Si1-x-yGexSny thin films by ion implantation and rapid thermal annealing 国際会議
Y. Peng, L. Miao, M. Kurosawa, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Model development of MOCVD growth for realizing high-Sn-content Ge1-xSnx epitaxial layer ~ What physical properties are required for precursors? ~ 国際会議
Y. Miki, S. Shibayama, S. Zaima, and O. Nakatsuka
International Conference on Materials and Systems for Sustainability 2019 (ICMaSS2019)
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Saturation of Sb1+ Concentration in Heavily Sb-doped n+-Ge Epitaxial Layers 国際会議
J. Jeon, S. Shibayama, and O. Nakatsuka
Advanced Metallization Conference 2019: 29th Asian Session (ADMETA Plus 2019)
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Influence of Dopant on Thermoelectric Properties of Si-rich Poly-Si1-xSnx Layers Grown on Insulators 国際会議
K. Sato, O. Nakatsuka, and M. Kurosawa
2019 International Conference on Solid State Devices and Materials (SSDM 2019)
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Impact of Mechanical Uniaxial Stress on Mobility Enhancement of 4H-SiC (0001) MOSFET 国際会議
W. Takeuchi, K. Kutsuki, E. Kagoshima, T. Onishi, S. Iwasaki, M. Sakashita, H. Fujiwara, and O. Nakatsuka
2019 International Conference on Solid State Devices and Materials (SSDM 2019)
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In-situ Cyclic Metal Layer Oxidation for Further Improving Interface Properties of Al2O3/4H-SiC(0001) Gate Stacks 国際会議
T. Doi, S. Shibayama, W. Takeuchi, M. Sakashita, N. Taoka, M. Shimizu, and O. Nakatsuka
2019 International Conference on Solid State Devices and Materials (SSDM 2019)
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Strain Relaxation Enhancement of Ge1-x-ySixSny Epitaxial Layer on Ge Substrate Using Ion-Implantation Method 国際会議
H. Sofue, M. Fukuda, S. Shibayama, S. Zaima, and O. Nakatsuka
2019 International Conference on Solid State Devices and Materials (SSDM 2019)
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Fermi Level Pinning at Metal/4H-SiC Contact Induced by SiCxOy Interlayer 国際会議
K. Hashimoto, T. Doi, S. Shibayama, and O. Nakatsuka
2019 International Conference on Solid State Devices and Materials (SSDM 2019)
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GeSn and GeSiSn Heterostructures for Optoelectronic Applications 招待有り 国際会議
O. Nakatsuka, M. Fukuda, M. Kurosawa, S. Shibayama, M. Sakashita, and S. Zaima
2019 IEEE Photonics Society Summer Topicals Meeting Series
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Further reduction of Schottky barrier height of Hf-germanide/n-Ge(001) contacts by forming epitaxial HfGe2 国際会議
K. Senga, S. Shibayama, M. Sakashita, S. Zaima, and O. Nakatsuka
19th International Workshop on Junction Technology 2019 (IWJT2019)
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Development and challenges of group-IV alloy semiconductors for nanoelectronic applications 招待有り 国際会議
S. Zaima, O. Nakatsuka, M. Kurosawa, M. Sakashita, and S. Shibayama
The Eleventh International Conference on High-Performance Ceramics (CICC-11)
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Tin-incorporation effect on thermoelectric properties of p-type polycrystalline Si1-xGex layers grown on SiO2 国際会議
Y. Peng, L. Miao, J. Gao, M. Kurosawa, O. Nakatsuka, and S. Zaima
The Eleventh International Conference on High-Performance Ceramics (CICC-11)
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Crystalline and Electrical Properties of Ge1-xSnx/Ge1-x-ySixSny QuantumWell Structures 国際会議
G. R. Suwito, M. Fukuda, S. Shibayama, M. Sakashita, O. Nakatsuka, and S. Zaima
Compoud Semiconductor Week 2019 (CSW 2019)
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Formation of Strain-relaxed Ge1-x-ySixSny Epitaxial Layer using Ionimplanted Ge Substrate 国際会議
H. Sofue, M. Fukuda, S. Shibayama, O. Nakatsuka, and S. Zaima
11th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 12th International Conference on Plasma-Nano Technology and Science (ISPlasma 2019 / IC-PLANTS 2019)
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GeSn-related group-IV semiconductor heterostructures for electronic and optoelectronic applications 招待有り 国際会議
O. Nakatsuka, M. Fukuda, M. Kurosawa, M. Sakashita, and S. Zaima
12th International WorkShop on New Group IV Semiconductor Nanoelectronics
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Formation of Nickel Stanogermanide/Heavily Doped n+-Ge1-xSnx Structure with Ultra-Low Contact Resistivity 国際会議
J. Jeon, A. Suzuki, S. Shibayama, O. Nakatsuka, and S. Zaima
12th International WorkShop on New Group IV Semiconductor Nanoelectronics
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Study of factors to limit increasing Sn content in Ge1-xSnx for MOCVD method 国際会議
Y. Miki, W. Takeuchi, S. Shibayama, O. Nakatsuka, and S. Zaima
12th International WorkShop on New Group IV Semiconductor Nanoelectronics
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Formation and Optoelectronic Characterization of Strain-relaxed Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny Double-heterostructure 国際会議
M. Fukuda, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
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Thermoelectric Performance of Polycrystalline Si1-x-yGexSny Ternary Alloy Layer Prepared with Ion Implantation 国際会議
Y. Peng, M. Kurosawa, O. Nakatsuka, L. Miao, J. Gao, and S. Zaima
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)
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Impact of Crystalline Property of SixGe1-x-ySny Ternary Alloy Interlayer on Schottky Barrier Height Engineering of Metal/Ge Contact 国際会議
O. Nakatsuka, A. Suzuki, M. Sakashita, and S. Zaima
Advanced Metallization Conference 2018: 28th Asian Session (ADMETA Plus 2018)
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Composition and Strain Engineering of New Group-IV Thermoelectric Materials 招待有り 国際会議
M. Kurosawa, Y. Imai, T. Iwahashi, K. Takahashi, M. Sakashita, O. Nakatsuka, and S. Zaima
AiMES 2018 Meeting
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Formation of laterally graded SixGe1-x stripes for thermoelectric generator 国際会議
M. Nakata, K. Takahashi, T. Nishijima, S. Shimizu, I. Tsunoda, O. Nakatsuka, S. Zaima, T. Watanabe, and M. Kurosawa
The 3rd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-3)
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Growth and electronic properties of GeSn-related group-IV alloy semicondcutor thin films 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
2018 International Conference on Solid State Devices and Materials (SSDM 2018)
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Impact of Oxygen Radical Treatment on Improvement of Al2O3/SiC Interface 国際会議
T. Doi, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
2018 International Conference on Solid State Devices and Materials (SSDM 2018)
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Thin Film Growth and Characterization of Group-IV Alloy Semiconductors for Future Nanoelectronic Applications 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, and S. Zaima
The 9th International Conference on Physics and Its Applications (ICOPIA)
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Engineering optoelectronic properties of high-Sn-content GeSn, GeSiSn, and SiSn thin films 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, M. Fukuda, M. Sakashita, W. Takeuchi, and S. Zaima
IEEE Photonics Society Summer Topical Meeting Series 2018
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Engineering electronic properties of GeSn-related group-IV thin films for nanoelectronic applications 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
European Materials Research Society (2018 E-MRS Spring Meeting)
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GeSn-based thin film thermoelectric generators 招待有り 国際会議
M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
International Conference on Processing & Manufacturing of Advanced Materials Processing, Fabrication, Properties, Applications (THERMEC'2018)
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Formation of Ultra-Low Resistance Contact with Nickel Stanogermanide/Heavily Doped n+-Ge1-xSnx Structure 国際会議
J. Jihee, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
1st Joint Conference ICSI / ISTDM 2018
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Ultra-thin GeSn on Insulator structure through the direct bonding technique 国際会議
T. Maeda, W. H. Chang, T. Irisawa, H. Ishii, H. Hattori, M. Kurosawa, Y. Imai, O. Nakatsuka, and N. Uchida
1st Joint Conference ICSI / ISTDM 2018
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Optoelectronic Characterization of Ge1-x-ySixSny/Ge1-xSnx/Ge1-x-ySixSny Double-Heterostructure with High-Si-Content Ge1-x-ySixSny Layer 国際会議
M. Fukuda, D. Rainko, M. Sakashita, M. Kurosawa, D. Buca, O. Nakatsuka, and S. Zaima
1st Joint Conference ICSI / ISTDM 2018
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Domain size effects on thermoelectric properties of p-type Ge0.95Sn0.05 layers grown on GaAs and Si substrates 国際会議
Y. Imai, K. Takahashi, N. Uchida, T. Maeda, O. Nakatsuka, S. Zaima, and M. Kurosawa
The 2nd Electron Devices Technology and Manufacturing (EDTM 2018)
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Low thermal budget fabrication of poly-Ge1-xSnx thin film thermoelectric generator 国際会議
K. Takahashi, H. Ikenoue, M. Sakashita, O. Nakatsuka, S. Zaima, and M. Kurosawa
The 2nd Electron Devices Technology and Manufacturing (EDTM 2018)
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Heavily p-type Doping to Si1-xSnx Layers Grown on SOI Substrates 国際会議
Y. Inaishi, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
10th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 11th International Conference on Plasma-Nano Technology and Science (ISPlasma 2018 / IC-PLANTS 2018)
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Growth of Ge1-xSnx Layer by Metal-organic Chemical Vapor Deposition Method using Tetrakis Dimethylamino Tin 国際会議
Y. Miki, W. Takeuchi, O. Nakatsuka, and S. Zaima
10th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 11th International Conference on Plasma-Nano Technology and Science (ISPlasma 2018 / IC-PLANTS 2018)
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Heterostructure Engineering of GeSn and SiGeSn Group-IV Alloy Semiconductor Layers 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
11th International WorkShop on New Group IV Semiconductor Nanoelectronics
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Low-Temperature Chemical Vapor Deposition of SiC Thin Film Using Vinylsilane for Metal Surface Coating 国際会議
T. Doi, W. Takeuchi, Y. Jin, H. Kokubun, S. Yasuhara, O. Nakatsuka, and S. Zaima
11th International WorkShop on New Group IV Semiconductor Nanoelectronics
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Crystal growth of GeSn-based materials and its application for thin-film thermoelectric generators 招待有り 国際会議
M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
The 2017 Global Research Efforts on Energy and Nanomaterials (GREEN 2017)
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Energy Band Structure of Ga-oxide/GaN Interface Formed by Remote O2 Plasma 国際会議
T. Yamamoto, N. Taoka, A. Ohta, T. X. Nguyen, H. Yamada, T. Takahashi, M. Ikeda, K. Makihara, O. Nakatsuka, M. Shimizu, and S. Miyazaki
2017 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY (2017 IWDTF)
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Characterization of Defects in Ge1-xSnx Gate Stack Structure 国際会議
Y. Kaneda, S. Ike, M. Kanematsu, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
2017 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY (2017 IWDTF)
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Development of GeSn-Related Group-IV Semiconductor Thin Films for Future Si Nanoelectronic Applications 招待有り 国際会議
S. Zaima, O. Nakatsuka, M. Kurosawa, W. Takeuchi, and M. Sakashita
the 4th International Symposium on Hybrid Materials and Processing (HyMaP 2017)
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GeSn and related group-IV alloy thin films for future Si nanoelectronics 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita and S. Zaima
The Tenth International Conference on High-Performance Ceramics (CICC-10)
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Crystalline and electrical properties of epitaxial HfGe2/Ge contact for lowering Schottky barrier height 国際会議
O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
Advanced Metallization Conference 2017: 27th Asian Session (ADMETA Plus 2017)
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Growth and Applications of Si1-xSnx Thin Films 招待有り 国際会議
M. Kurosawa, O. Nakatsuka, and S. Zaima
The 232th Electrochemical Society Meeting (232nd ECS MEETING)
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Numerical calculation of energy band offset of Si1-xSnx by density functional calculation 国際会議
Y. Nagae, M. Kurosawa, M. Araidai, O. Nakatsuka, K. Shiraishi, and S. Zaima
The 2nd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-2)
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Heavy n- and p-type doping for polycrystalline Ge1-xSnx layers using pulsed laser annealing in water 国際会議
K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
The 2nd International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-2)
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Control of Electrical Property at Metal/Ge Interface with Group-IV Alloy Interlayer 国際会議
A. Suzuki, O. Nakatsuka, M. Sakashita, and S. Zaima
International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
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Characterization of Crystallinity and Energy Band Alignment of Ge1-xSnx/Ge1-x-ySixSny Heterostructure 国際会議
M. Fukuda, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
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Strain measurement of simulated finFET structures of Ge and GeSn prepared by MOCVD 国際会議
K. Saitoh, S. Ou, S. Ike, O. Nakatsuka and, S. Zaima
International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
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Thermal Stability Study of in-situ Sb-Doped n- Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained Ge Transistors 国際会議
J. Jeon, A. Suzuki, O. Nakatsuka and, S. Zaima
International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
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Fabrication and Thermoelectric Mechanism Study of Flexible Si1-xGex Superlattice Films 国際会議
Y. Peng, L. Miao, C. Li, R. Huang, D. Urushihara, T. Asaka, M. Kurosawa, O. Nakatsuka, and S. Zaima
International Conference on Materials and Systems for Sustainability 2017 (ICMaSS 2017)
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Sb-doping effect on thermal and electrical properties of Ge-rich Ge1-xSnx layers 国際会議
T. Iwahashi, M. Kurosawa, N. Uchida, Y. Ohishi, T. Maeda, O. Nakatsuka, and S. Zaima
2017 International Conference on Solid State Devices and Materials (SSDM 2017)
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Dopants behavior in polycrystallization of heavily doped Ge1-xSnx layer using pulsed laser annealing in water 国際会議
K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
2017 International Conference on Solid State Devices and Materials (SSDM 2017)
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Synthesis of p- and n-type Ge1-xSnx Thin Films toward New Group-IV Thermoelectric Materials 国際会議
M. Kurosawa, Y. Imai, T. Iwahashi, A. Ohta, N. Uchida, Y. Ohishi, T. Maeda, O. Nakatsuka, and S. Zaima
36th Annual International Conference on Thermoelectrics (2017 ICT)
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Characterization of energy band structure of Si1-x-ySnxCy ternary alloy layers prepared with solid-phase crystallization 国際会議
S. Yano, O. Nakatsuka, C. Lim, M. Sakashita, M. Kurosawa, and S. Zaima
29th International Conference on Defects in Semiconductors (ICDS 2017)
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Research and development of GeSn-related thin-film semiconductors for nanoelectronic and optoelectronic applications 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
Frontiers in Materials Processing Applications, Research and Technology (FiMPART 2017)
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Formation of Epitaxial Hf Germanide/Ge Contacts for Schottky Barrier Height Engineering 国際会議
O. Nakatsuka, A. Suzuki, J. McVittie, Y. Nishi, and S. Zaima
17th International Workshop on Junction Technology 2017 (IWJT 2017)
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Development of GeSn and related semiconductor thin films for next generation optoelectronic applications 招待有り 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
2017 Global Conference on Polymer and Composite Materials (PCM 2017)
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Alleviation of Fermi level pinning at metal/Ge interface using lattice-matching group-IV ternary alloy interlayer 国際会議
A. Suzuki, O. Nakatsuka, S. Toda, M. Sakashita, and S. Zaima
The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
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Control of lattice constant of Ge1-x-ySixSny layer for energy band engineering in Ge1-xSnx/Ge1-x-ySixSny heterostructure 国際会議
M. Fukuda, K. Watanabe, M. Sakashita, M. Kurosawa, O. Nakatsuka, and S. Zaima
The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
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Formation of heavily Sb and Ga doped poly-Ge1-xSnx layers on insulator using pulsed laser annealing in water 国際会議
K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, O. Nakatsuka, and S. Zaima
The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
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Solid phase epitaxy of Si1-xSnx layers on various substrates 国際会議
M. Kurosawa, M. Kato, K. Takahashi, O. Nakatsuka, and S. Zaima
The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
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Epitaxial growth of n+-Ge1-xSnxlayerswith in situ phosphorus doping using low-temperature metal-organic chemical vapor deposition method 国際会議
S. Ike, W. Takeuchi, O. Nakatsuka, and S. Zaima
The 10th International Conference on Silicon Epitaxy and Heterostructures (ICSI-10)
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Formation of SiC and SiCN Films by Chemical Vapor Deposition using Vinylsilane 国際会議
T. Doi, W. Takeuchi, Y. Jin, H. Kokubun, S. Yasuhara, O. Nakatsuka and S. Zaima
9th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 10th International Conference on Plasma-Nano Technology and Science (ISPlasma 2017 / IC-PLANTS 2017)
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Electrical Properties of AlON/4H-SiC MOS Capacitor Prepared by Plasma-Assisted Atomic Layer Deposition 国際会議
W. Takeuchi, K. Yamamoto, T. Mimura, M. Sakashita, O. Nakatsuka, and , S. Zaima
9th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 10th International Conference on Plasma-Nano Technology and Science (ISPlasma 2017 / IC-PLANTS 2017)
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Selective Growth of Ge1-xSnx Epitaxial Layer on Patterned Si Substrate using Metal-organic Chemical Vapor Deposition Method 国際会議
T. Washizu, S. Ike, W. Takeuchi, O. Nakatsuka, S. Zaima
9th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 10th International Conference on Plasma-Nano Technology and Science (ISPlasma 2017 / IC-PLANTS 2017)
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Development of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers for Source/Drain Stressor of Strained GeTransistors 国際会議
J. Jeon, A. Suzuki, K. Takahashi, O. Nakatsuka, and S. Zaima
Electron Devices Technology and Manufacturing Conference (EDTM 2017)
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Effect of Oxynitridation Annealing for SiO2/SiC Interface on Defects Properties 招待有り 国際会議
W. Takeuchi, K. Yamamoto, M. Sakashita, O. Nakatsuka and S. Zaima
10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
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Influence of atomic layer deposition temperature of GeO2 layer on electrical properties of Ge and Ge1-xSnx gate stack 国際会議
Y. Kaneda, M. Kanematsu, M. Sakashita, W. Takeuchi, O. Nakatsuka and S. Zaima
10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
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Solid phase crystallization of Ge0.98Sn0.02 layers on various insulating substrates 国際会議
I. Yoshikawa, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka and S. Zaima
10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
In situ phosphorus doping of Ge and Ge1-xSnx epitaxial layers by low-temperature metal-organic chemical vapor deposition 国際会議
S. Ike, W. Takeuchi, O. Nakatsuka and S. Zaima
10th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Growth of Si1-xSnx heteroepitaxial layers with very high Sn contents on InP(001) substrates 国際会議
JSPS Meeting 2016 : Workshop on "Atomically Controlled Processing for Ultra-large Scale Integration"
-
Formation of heavily Sb doped poly-Ge1-xSnx layer using pulsed laser annealing in water 国際会議
JSPS Meeting 2016 : Workshop on "Atomically Controlled Processing for Ultra-large Scale Integration"
-
Control of Schottky barrier height of metal/Ge contact using group-IV alloy interlayers 国際会議
JSPS Meeting 2016 : Workshop on "Atomically Controlled Processing for Ultra-large Scale Integration"
-
Characterization of Deep-Level Defects in Ge1-xSnx Epitaxial Layers using Deep Level Transient Spectroscopy 国際会議
The 7th International Symposium on Advanced Science and Technology of Silicon Materials (7th JSPS Silicon Symposium)
-
Microwave Annealing for Low-Thermal Budget Process of Nickel Monogermanide/Germanium Contact Formation 国際会議
Advanced Metallization Conference 2016: 26th Asian Session (ADMETA Plus 2016)
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Low Temperature Crystallization of SiSn Binary Alloys 招待有り 国際会議
The 1st International Symposium on Creation of Life Innovation Materials for Interdisciplinary and International Researcher Development (iLIM-1)
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Analysis of Microscopic Strain and Crystalline Structure in Ge/Ge1-xSnx Fine Structures By Using Synchrotron X-Ray Microdiffraction 国際会議
Pacific Rim Meeting 2016 Joint The 230th Electrochemical Society Meeting (PRiME 2016/230th ECS Meeting)
-
Growth of Heavily Doped n-Ge Epitaxial Layer by In situ Phosphorus-doping with Low-temperature Metal-Organic Chemical Vapor Deposition 国際会議
2016 International Conference on Solid State Devices and Materials (SSDM 2016)
-
Effect of N bonding structure in AlON on leakage current of 4H-SiC MOS capacitor 国際会議
2016 International Conference on Solid State Devices and Materials (SSDM 2016)
-
Investigation of effects of inner stress with Sn incorporation on energy band of Si1-xSnx using density functional theory and photoelectron spectroscopy 国際会議
2016 International Conference on Solid State Devices and Materials (SSDM 2016)
-
Heavy Sb-doping for poly-GeSn on insulator using pulsed laser annealing in water 国際会議
2016 International Conference on Solid State Devices and Materials (SSDM 2016)
-
Impact of SixGe1-x-ySny interlayer on reduction in Schottky barrier height of metal/n-Ge contact 国際会議
2016 International Conference on Solid State Devices and Materials (SSDM 2016)
-
Challenges in Engineering Materials Properties for GeSn Nanoelectronics 招待有り 国際会議
The 2016 European Materials Research Society (E-MRS) Fall Meeting
-
Low-Temperature Selective Epitaxial Growth of Ge on Si by using Metal Organic Chemical Vapor Deposition 国際会議
The 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)
-
Growth and applications of GeSn-related group-IV semiconductor materials 招待有り 国際会議
IEEE 2016 Summer Topicals Meeting Series
-
Control of the Fermi level pinning position at metal/Ge interface by using Ge1-xSnx interlayer 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Direct Measurement of Anisotropic Local Strain in Ge Nanostructures Strained with MOCVD-grown Ge1-xSnx by using Microdiffraction 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Electrical and Optical Properties Improvement of GeSn Layers Formed at High Temperature under Well-controlled Sn Migration 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Effect of local and global strain on thermal stability of Sn in GeSn based film 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Si1-xGex Bulk Single Crystals for Substrates of Electronic Devices 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Formation and Characterization of GeSiSn/GeSn/GeSiSn Double-Heterostructure with Strain-controlled GeSiSn layer 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Interfacial Energy Control for Low-Temperature Crystallization of Ge-rich GeSn Layers on Insulating Substrate 国際会議
7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII) and International SiGe Technology and Device Meeting (ISTDM 2016)
-
Development of GeSn thin film technology for electronic and optoelectronic applications 招待有り 国際会議
2016 Energy Materials Nanotechnology (EMN) Summer Meeting and Photodetectors Meeting
-
International collaboration: the path to breakthroughs in (Si)GeSn material development 国際会議
12th International Nanotechnology Conference on Communication ans Cooperation (INC12)
-
Solid phase crystallization of Si1-x-ySnxCy ternary alloy layers and characterization of its crystalline and optical properties 国際会議
8th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 9th International Conference on Plasma-Nano Technology and Science (ISPlasma 2016 / IC-PLANTS 2016)
-
Impact of Atomic Hydrogen Irradiation on Epitaxial Growth of Ge1-xSnx and its Crystalline Property 国際会議
8th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 9th International Conference on Plasma-Nano Technology and Science (ISPlasma 2016 / IC-PLANTS 2016)
-
Structural and Electrical Properties of Low Temperature CVD-Grown SiGe Epitaxial Layers 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Formation of GeSn layer sandwiched with strain-controlled GeSiSn layers 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Crystalline and Electrical Properties of in-situ Sb-Doped Ge1-xSnx Epitaxial Layers 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Phosphorus doping into Ge with low electrical damage by liquid immersion laser doping 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Formation of poly-Si1-x-ySnxCy ternary alloy layer and characterization of its crystalline and optical properties 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Control of Schottky barrier height at metal/Ge interface by insertion of Ge1-xSnx layer 国際会議
9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Strain measurement of heteroepitaxial GeSn/Ge with a finFET structure 国際会議
K. Saitoh, K. Doi, N. Tanaka, S. Ike, O. Nakatsuka, S. Zaima
International Symposium on EcoTopia Science 2015 (ISETS '15)
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Schottky Barrier Engineering by Epitaxial Metal Germanide/Germanium Contacts 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
X-ray Microdiffraction Characterization of Local Strain Distribution in GeSn/Ge Nanostructures 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Silicon-tin semiconductors for near-infrared optoelectronic device applications 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Calculation of Si1-xSnx Energy Band Structures by using Density Functional Theory Considering Atomic Configuration 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Characterization of electrically active defects in epitaxial GeSn/n-Ge junctions 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Control of Schottky Barrier Height at Metal/Ge Interface by SnxGe1-x Interlayer 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Electrical Characteristics of Ge pn-junction Diodes Prepared by Using Liquid Immersion Laser Doping 国際会議
International Symposium on EcoTopia Science 2015 (ISETS '15)
-
Recent Progress of Silicon Tin Alloys for Advanced Semiconductor Devices 国際会議
M. Kurosawa, O. Nakatsuka, and S. Zaima
International Workshop on Advanced Nanomaterials for Future Electron Devices 2015 (IWAN 2015)
-
Crystal growth and energy band engineering of group-IV semiconductor thin films for nanoelectronic applications 国際会議
O. Nakatsuka, M. Kurosawa, W. Takeuchi, Y. Shimura, M. Sakashita, and S. Zaima
International Workshop on Advanced Nanomaterials for Future Electron Devices 2015 (IWAN 2015)
-
Influence of Atomic Layer Deposition Temperature of GeO2 Layer on Electrical Properties of Ge Gate Stack 国際会議
M. Kanematsu, S. Shibayama, M. Sakashita, W. Takeuchi, O. Nakatsuka, S. Zaima
2015 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (2015 IWDTF)
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Evaluation of Energy Band Structure of Si1-xSnx by Density Functional Theory Calculation and Photoelectron Spectroscopy 国際会議
Y. Nagae, S. Shibayama, M. Kurosawa, M. Araidai, M. Sakashita, O. Nakatsuka, K. Shiraishi, S. Zaima
2015 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (2015 IWDTF)
-
Challenges of Energy Band Engineering with New Sn-Related Group IV Semiconductor Materials for Future Integrated Circuits 招待有り 国際会議
S. Zaima, O. Nakatsuka, T. Yamaha, T. Asano, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi, and M. Sakashita
The 228th Electrochemical Society Meeting
-
Crystal Growth of GeSn-related Group-IV Thin Films for Integrating on Si Nanoelectronics Platform 招待有り 国際会議
S. Zaima, O. Nakatsuka, T. Asano, T. Yamaha, S. Ike, A. Suzuki, M. Kurosawa, W. Takeuchi and M. Sakashita
2015 International Conference on Solid State Devices and Materials (SSDM 2015)
-
Impact of Ultra-high Sn Content SnxGe1-x Interlayer on Reducing Schottky Barrier Height at Metal/n-Ge Interface 国際会議
A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa and S. Zaima
2015 International Conference on Solid State Devices and Materials (SSDM 2015)
-
Influence of in-situ Sb-Doping on Crystalline and Electrical Characteristics of n-type Ge1-xSnx Epitaxial Layer 国際会議
J. Jeon, T. Asano, W. Takeuchi, M. Kurosawa, O. Nakatsuka and S. Zaima
2015 International Conference on Solid State Devices and Materials (SSDM 2015)
-
Effect of Nitridation for SiO2/SiC Interface on Defects Properties near Conduction Band Edge 国際会議
W. Takeuchi, K. Yamamoto, M. Sakashita, T. Kanemura, O. Nakatsuka and S. Zaima
2015 International Conference on Solid State Devices and Materials (SSDM 2015)
-
Influence of Precursor Gas on SiGe Epitaxial Material Quality in Terms of Structural and Electrical Defects 国際会議
S. Ike, E. Simoen, Y. Shimura, A. Hikavyy, W. Vandervorst, R. Loo, W. Takeuchi, O. Nakatsuka and S. Zaima
2015 International Conference on Solid State Devices and Materials (SSDM 2015)
-
Crystalline Structure and Chemical Reaction of Ti Thin Layer on Highly Oriented Pyrolytic Graphite 国際会議
O. Nakatsuka, K. Hisada, S. Oida, A. Sakai, and S. Zaima
Advanced Metallization Conference 2015: 25th Asian Session (ADMETA Plus 2015)
-
Characterization of Deep-level Defects in Epitaxial Ge1-xSnx/Ge structure 招待有り 国際会議
W. Takeuchi, T. Asano, Y. Inuzuka, M. Sakashita, O. Nakatsuka and S. Zaima
JSPS International Core-to-Core Program Workshop Atomically Controlled Processing for Ultra-large Scale Integration
-
Reduction of Schottky barrier height with Sn/Ge contact 国際会議
A. Suzuki, O. Nakatsuka, S. Shibayama, M. Sakashita, W. Takeuchi, M. Kurosawa, S. Zaima
JSPS International Core-to-Core Program Workshop Atomically Controlled Processing for Ultra-large Scale Integration
-
Development of polycrystalline Sn-related group-IV semiconductor thin films - Aiming for 3D-IC 招待有り 国際会議
M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2015)
-
Formation of Ge pn-junction diode by phosphorus doping with liquid immersion laser irradiation 国際会議
K. Takahashi, M. Kurosawa, H. Ikenoue, M. Sakashita, W. Takeuchi, O. Nakatsuka, S. Zaima
15th International Workshop on Junction Technology 2015 (IWJT 2015)
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Formation of type-I energy band alignment of Ge1-x-ySixSny/Ge hetero structure 国際会議
T. Yamaha, K. Kato, S. Shibayama, T. Asano, M. Sakashita, O. Nakatsuka, and S. Zaima
The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
-
Thermophysical characterizations of Ge1-xSnx epitaxial layers aiming for thermoelectric devices 国際会議
M. Kurosawa, M. Fukuda, K. Takahashi, M. Sakashita, O. Nakatsuka, and S. Zaima
The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
-
Characterization of Crystallinity of Ge1-xSnx Epitaxial Layers Grown by using Metal-Organic Chemical Vapor Deposition 国際会議
Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, O. Nakatsuka, and S. Zaima
The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
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Control of Electrically Active Defects in Ge1-xSnx Epitaxial Layers 国際会議
T. Asano, S. Shibayama, W. Takeuchi, M. Sakashita, O. Nakatsuka, S. Zaima
The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
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Solid Phase Epitaxy of High Sn Content Si1-xSnx layer (x>0.2) on Ge Substrates for Optical Communication Applications 国際会議
M. Kato, M. Kurosawa, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
The 9th International Conference On Silicon Epitaxy And Heterostructures (ICSI-9)
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Electrically-Active Defects in Ge1-xSnx Epitaxtial Layer 国際会議
W. Takeuchi, T. Asano, M. Sakashita, O. Nakatsuka, S. Zaima
7th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 8th International Conference on Plasma-Nano Technology and Science (ISPlasma 2015 / IC-PLANTS 2015)
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Solid phase epitaxy of Ge1-x-ySnxCy ternary alloy layers 国際会議
H. Oda, T. Yamaha, M. Kurosawa, W. Takeuchi, M. Sakashita, O. Nakatsuka, S. Zaima
7th International Symposium on Advanced Plasma Science and Its Applications for Nitrides Nanomaterials / 8th International Conference on Plasma-Nano Technology and Science (ISPlasma 2015 / IC-PLANTS 2015)
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Crystal growth of Si1-xSnx alloys with high Sn contents 国際会議
M. Kurosawa, M. Kato, Y. Nagae, T. Yamaha, O. Nakatsuka and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
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Photoluminescence Property of Ge1-xSnx Epitaxial Layers Grown on Ge(001) substrates 国際会議
T. Asano, K. Hozaki, T. Koyama, N. Taoka, O. Nakatsuka, H. Kishida and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
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Behaviors of tin related defects in Sb doped n-type germanium 国際会議
W. Takeuchi, N. Taoka, M. Sakashita, O. Nakatsuka and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Crystalline and Optical Properties of Ge1-x-ySixSny Ternary Alloy Layers for Solar Cell Application 国際会議
T. Yamaha, S. Asaba, T. Terashima, T. Asano, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Formation of strain-free Si1-x-yGexSny layers on Ge surfaces by using solid-liquid coexisting annealing 国際会議
M. Kato, M. Kurosawa, T. Yamaha, N. Taoka, O. Nakatsuka and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Epitaxial Growth of Ge1-xSnx Thin Films by using Metal-Organic Chemical Vapor Deposition 国際会議
Y. Inuzuka, S. Ike, T. Asano, W. Takeuchi, O. Nakatsuka, and S. Zaima
8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Growth and Characterization of Si1-x-ySnxCy Ternary Alloy Thin Films for Solar Cell Application 国際会議
T. Yamaha, H. Oda, M. Kurosawa, W. Takeuchi, O. Nakatsuka, and S. Zaima
The 6th World Conferenceon Photovoltaic Energy Conversion (WCPEC-6)
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Development of metal/Ge contacts for engineering Schottky barriers 国際会議
O. Nakatsuka, Y. Deng, A. Suzuki, S. Shibayama, M. Kurosawa, W. Takeuchi, M. Sakashita, N. Taoka, and S. Zaima
JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Hydrogen Surfactant Epitaxy of Ge1-xSnx Layers 国際会議
T. Asano, N. Taoka, K. Hozaki, W. Takeuchi,M. Sakashita, O. Nakatsuka, and S. Zaima
JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Growth and Characterization of Ternary Alloy Ge1-x-ySnxCy Layers 国際会議
T. Yamaha, H. Oda, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Study of Local Strain Distribution in Ge1-xSnx/Ge Fine Structure by using Synchrotron X-ray Microdiffraction 国際会議
S. Ike, Y. Moriyama, M. Kurosawa, N. Taoka, O. Nakatsuka, Y. Imai, S. Kimura, T. Tezuka, and S. Zaima
JSPS Core-to-Core Program Workshop "Atomically Controlled Processing for Ultralarge Scale Integration"
-
Formation of Epitaxial NiGe Layer on Ge(001) Substrate and Influence of Interface Structure on Schottky Barrier Height 国際会議
O. Nakatsuka, Y. Deng, M. Sakashita, and S. Zaima
Advanced Metallization Conference 2014: 24th Asian Session (ADMETA Plus 2014) in conjunction with the 3rd International Workshop on Advanced Packaging & System Technology (IWAPS)
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Low Schottky barrier height contacts with Sn electrode for various orientation n-Ge substrates 国際会議
A. Suzuki, D. Yunsheng, S. Shibayama, M. Kurosawa, M. Sakashita, O. Nakatsuka, and S. Zaima
Advanced Metallization Conference 2014: 24th Asian Session (ADMETA Plus 2014) in conjunction with the 3rd International Workshop on Advanced Packaging & System Technology (IWAPS)
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Poly & Epitaxial Crystallization of Silicon-tin Binary Alloys for Future Optoelectronics 国際会議
M. Kurosawa, M. Kato, K. Takahashi, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
16th International Conference on Thin Films (ICTF16)
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Challenges and Developments in GeSn Process Technology for Si Nanoelectronics 招待有り 国際会議
S. Zaima, O. Nakatsuka, N. Taoka, K. Kato, W. Takeuchi, and M. Sakashita
226th Meeting of The Electrochemical Society (ECS) and SMEQ (Sociedad Mexicana de Electroquímica) Joint International Meeting
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Epitaxial Growth of GeSn Layers on (001), (110), and (111) Si and Ge Substrates 招待有り 国際会議
O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, W. Takeuchi, and S. Zaima
226th Meeting of The Electrochemical Society (ECS) and SMEQ (Sociedad Mexicana de Electroquímica) Joint International Meeting
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Operations of CMOS Inverter and Ring Oscillator Composed of Ultra-Thin Body Poly-Ge p- and n-MISFETs for Stacked Channel 3D-IC 国際会議
Y. Kamata, M. Koike, E. Kurosawa, M. Kurosawa, H. Ota, O. Nakatsuka, S. Zaima and T. Tezuka
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Growth of Two Inch Si0.5Ge0.5 Bulk Single Crystals 国際会議
K. Kinoshita, Y. Arai, O. Nakatsuka, K. Taguchi, H. Tomioka, R. Tanaka and S. Yoda
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Impact of Hydrogen Surfactant Epitaxy and Annealing on Crystallinity of Epitaxial Ge1-xSnx Layers 国際会議
T. Asano, N. Taoka, K. Hozaki, W. Takeuchi, M. Sakashita, O. Nakatsuka and S. Zaima
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Formation and Energy Band Engineering of Ternary Alloy Ge1-x-ySnxCy Layers 国際会議
T. Yamaha, H. Oda, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka and S. Zaima
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Electrically Active Defects in GeSnSi/Ge Junctions Formed at Low Temperature 国際会議
N. Taoka, T. Asano, T. Yamaha, T. Terashima, S. Asaba, O. Nakatsuka, P. Zaumseil, G. Capellini, T. Schroeder and S. Zaima
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Sub-300C fabrication of poly-GeSn junctionless tri-gate p-FETs enabling sequential 3D integration of CMOS circuits 国際会議
M. Kurosawa, Y. Kamata, H. Ikenoue, N. Taoka, O. Nakatsuka, T. Tezuka and S. Zaima
2014 International Conference on Solid State Devices and Materials (SSDM 2014)
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Mobility behavior of Si1-x-yGexSny polycrystals grown on insulators 国際会議
T. Ohmura, T. Yamaha, M. Kurosawa, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies - International Conference in Asia 2014 (IUMRS-ICA 2014)
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Transformation of Defects Structure in Germanium by Sn Ion Implantation 国際会議
W. Takeuchi, N. Taoka, M. Sakashita, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies - International Conference in Asia 2014 (IUMRS-ICA 2014)
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Crystalline Growth and Characterization of Group-IV Ternary Alloy Thin Films for Solar Cell 国際会議
T. Yamaha, K. Terasawa, T. Terashima, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
Grand Renewable Energy 2014 International Conference and Exhibition
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Low temperature growth of SiSn polycrystals with high Sn contents on insulating layers 国際会議
M. Kurosawa, M. Kato, T. Yamaha, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Impact of Sn incorporation on low temperature growth of polycrystalline-Si1-xGex layers on insulators 国際会議
T. Yamaha, T. Ohmura, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Epitaxial growth and crystalline properties of Ge1-x-ySixSny Layers on Ge(001) Substrates 国際会議
T. Asano, T. Terashima, T. Yamaha, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Crystal growth of Sn-related group-IV alloy thin films for advanced silicon nanoelectronics 国際会議
S. Zaima, O. Nakatsuka, N. Taoka, M. Kurosawa, T. Asano, T. Yamaha, and W. Takauchi
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Growth and crystalline properties of Ge1-x-ySnxCy ternary alloy thin films on Ge(001) substrate 国際会議
K. Terasawa, T. Yamaha, M. Kurosawa, W. Takeuchi, N. Taoka, O. Nakatsuka, E. Kamiyama, R. Matsutani, R. Suwa, K. Kashima, K. Izunome, K. Sueoka, and S. Zaima
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Impact of crystalline structure on electrical property of NiGe/Ge contact 国際会議
Y. Deng, O. Nakatsuka, N. Taoka, S. Zaima
International SiGe Technology and Device Meeting 2014 (ISTDM 2014)
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Formation and Electrical Properties of Metal/Ge1-xSnx Contacts 国際会議
O. Nakatsuka, T. Nishimura, A. Suzuki, K. Kato, Y. Deng, M. Kurosawa, W. Takeuchi, M. Sakashita, N. Taoka, and S. Zaima
14th International Workshop on Junction Technology (IWJT 2014)
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Strain Distributions at Edge of Corner in Bonded Si in Chip-on-Wafer Structures 国際会議
N. Taoka, O. Nakatsuka, Y. Mizushima, H. Kitada, Y. S. Kim, T. Nakamura, T. Ohba, and S. Zaima
Materials for Advanced metallization (MAM 2014)
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Formation and Electrical Property of Epitaxial NiGe/Ge(110) Schottky Contacts 国際会議
Y. Deng, O. Nakatsuka, N. Taoka and S. Zaima
7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
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Sn-assisted low temperature crystallization of polycrystalline Ge1-xSnx thin-films on insulating surfaces 国際会議
M. Kurosawa, T. Yamaha, W. Takeuchi, N. Taoka, O. Nakatsuka, H. Ikenoue, and S. Zaima
7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
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Substrate Orientation Dependence of Crystalline Structures of Epitaxial GeSn Layers 国際会議
T. Asano, S. Kidowaki, M. Kurosawa, N. Taoka, O. Nakatsuka and S. Zaima
7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
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Characterization of Crystalline Structures of SiGe Substrate Formed by Traveling Liquidus-Zone Method and Fabrication of Strained Ge Layer 国際会議
T. Yamaha, O. Nakatsuka, N. Taoka, K. Kinoshita, S. Yoda and S. Zaima
7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
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Sn-related Group-IV semiconductor materials for electronic and optoelectronic applications 国際会議
O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, W. Takeuchi, M. Sakashita, and S. Zaima
3rd international Conference on Nanotek and Expo (Nanotek-2013)
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Development of Ge1-xSn and Ge1-x-ySixSny thin film materials for future electronic applications 国際会議
O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, K. Kato, W. Takeuchi, M. Sakashita, and S. Zaima
8th International Conference on Processing & Manufacturing of Advanced Materials (THERMEC' 2013)
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Quantitative Guideline for Formation of Ge MOS Interface with Low Interface State Density 国際会議
S. Shibayama, K. Kato, N. Taoka, M. Sakashita, O. Nakatsuka, S. Zaima
2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF 2013)
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Robustness of Sn Precipitation During Thermal Process of Ge1-xSnx 国際会議
K. Kato, T. Asano, N. Taoka, M. Sakashita, O. Nakatsuka, S. Zaima
2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF 2013)
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Interface Properties of Al2O3/Ge MOS Structures with Thin Ge Oxide Interfacial Layer Formed by Pulsed MOCVD 国際会議
T. Yoshida, K. Kato, S. Shibayama, M. Sakashita, N. Taoka, W. Takeuchi, O. Nakatsuka, S. Zaima
2013 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF 2013)
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Heteroepitaxial Growth of Sn-Related Group-IV Materials On Si Platform for Microelectronic and Optoelectronic Applications: Challenges and Opportunities 国際会議
O. Nakatsuka, N. Taoka, T. Asano, T. Yamaha, M. Kurosawa, M. Sakashita and S. Zaima
The 224th Electrochemical Society Meeting
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Reduction of Interface States Density due to Post Oxidation with Formation of AlGeO Layer at Al2O3/Ge Interface 国際会議
S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka and S. Zaima
The 224th Electrochemical Society Meeting
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Characterization of Local Strain Structures in Heteroepitaxial Ge1-xSnx/Ge Microstructures by using Microdiffraction Method 国際会議
S. Ike, Y. Moriyama, M. Kurosawa, N. Taoka, O. Nakatsuka, Y. Imai, S. Kimura, T. Tezuka, and S. Zaima
The 224th Electrochemical Society Meeting
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Interaction between Sn atoms and Defects Introduced by Ion Implantation in Ge Substrate 国際会議
N. Taoka, M. Fukudome, T. Arahira, W. Takeuchi, M. Sakashita, O. Nakatsuka, and S. Zaima
JSPS Core-to-Core Program Workshop - Atomically Controlled Processing for Ultralarge Scale Integration -
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Stabilization for Higher-k Films with Meta-Stable Crystalline Structure 国際会議
K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
JSPS Core-to-Core Program Workshop - Atomically Controlled Processing for Ultralarge Scale Integration -
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Fluctuation of Lattice Spacing around Trough Si Vias in Wafer -on -wafer Structures 国際会議
N. Taoka, O. Nakatsuka, Y. Mizushima, H. Kitada, Y. S. Kim, T. Nakamura, T. Ohba, and S. Zaima
Advanced Metallization Conference 2013 (AMC 2013) 30th Edition
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Formation and Crystalline Structure of Ni Silicides on Si(110) Substrate 国際会議
O. Nakatsuka, M. Hasegawa, K. Kato, N. Taoka, and S. Zaima
Advanced Metallization Conference 2013:23rd Asian Session (ADMETA Plus 2013)
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Fluctuation of Lattice Spacing around Trough Si Vias in Wafer -on -wafer Structures 国際会議
N. Taoka, O. Nakatsuka, Y. Mizushima, H. Kitada, Y. S. Kim, T. Nakamura, T. Ohba, and S. Zaima
Advanced Metallization Conference 2013:23rd Asian Session (ADMETA Plus 2013)
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Thermal Stability of Epitaxial NiGe Layers Formed on Ge(110) Substrate 国際会議
Y. Deng, O. Nakatsuka, N. Taoka, and S. Zaima
Advanced Metallization Conference 2013:23rd Asian Session (ADMETA Plus 2013)
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Reduction of Schottky Barrier Height for n-type Ge Contact by using Sn Electrode 国際会議
A. Suzuki, S. Asaba, J. Yokoi, O. Nakatsuka, M. Kurosawa, K. Kato, M. Sakashita, N. Taoka and S. Zaima
2013 International Conference on Solid State Devices and Materials (SSDM 2013)
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Engineering of Energy Band Structure with Epitaxial Ge1-x-ySixSny/n-Ge Hetero Junctions for Solar Cell Applications 国際会議
S. Asaba, T. Yamaha, M. Kurosawa, M. Sakashita, N. Taoka, O. Nakatsuka and S. Zaima
2013 International Conference on Solid State Devices and Materials (SSDM 2013)
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Interaction of Sn atoms with Defects Introduced by Ion Implantation in Ge Substrate 国際会議
T. Arahira, M. Fukudome, N. Taoka, W. Takeuchi, M. Sakashita, O. Nakatsuka and S. Zaima
2013 International Conference on Solid State Devices and Materials (SSDM 2013)
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Large grain growth of poly-GeSn on insulator by pulsed laser annealing in water 国際会議
M. Kurosawa, N. Taoka, H. Ikenoue, O. Nakatsuka and S. Zaima
2013 International Conference on Solid State Devices and Materials (SSDM 2013)
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Strain Undulation around Through Si Vias in Wafer-On-Wafer Structures 国際会議
N. Taoka, O. Nakatsuka, Y. Mizushima, H. Kitada, Y. S. Kim, T. Nakamura, T. Ohba and S. Zaima
2nd international Workshop Advanced Packaging & System Technology (IWAPS 2013)
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Function of Additional Element Incorporation for Tetragonal ZrO2 Formation 国際会議
K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
NIMS Conference 2013 -Structure Control of Atomic/Molecular Thin Films and Their Applications-
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Crystalline Structures and Electrical Property of Epitaxial Ni Germanide Layers Formed on Ge(110) Substrate 国際会議
Y. Deng, J. Yokoi, O. Nakatsuka, N. Taoka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Impacts of AlGeO Formation by Post Thermal Oxidation of Al2O3/Ge Structure on Interface Properties 国際会議
S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Formation of Tetragonal ZrO2 Thin Film by ALD Method 国際会議
K. Kato, T. Saito, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Influence of Ge Substrate Orientation on Crystalline Structures of Ge1-xSnx Epitaxial Layers 国際会議
T. Asano, S. Kidowaki, M. Kurosawa, N. Taoka, O. Nakatsuka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Epitaxial Growth of Strained Ge Layer on Si1-xGex Substrate Formed with Traveling Liquidus-Zone Method 国際会議
T. Yamaha, O. Nakatsuka, N. Taoka, K. Kinoshita, S. Yoda, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Crystalline Phase Control of Pr-Oxide Films by Regulating Oxidant Partial Pressure and Si Diffusion 国際会議
K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Formation and Characterization of Locally Strained Ge1-xSnx/Ge Microstructures 国際会議
S. Ike, Y. Moriyama, M. Kurosawa, N. Taoka, O. Nakatsuka, Y. Imai, S. Kimura, T. Tezuka, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Electrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers 国際会議
S. Gupta, E. Simoen, T. Asano, O. Nakatsuka, F. Gencarelli, Y. Shimura, A. Moussa, R. Loo, S. Zaima, B. Baert, A. Dobri, N. D. Nguyen, M. Heyns
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Incorporation of a Vacancy with an Sn Atom in Epitaxial Ge1-xSnx Film Growth at Lower Temperature 国際会議
E. Kamiyama, K. Sueoka, O. Nakatsuka, N. Taoka, S. Zaima, K. Izunome, K. Kashima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Lateral Growth Enhancement of Poly-Ge1-xSnx on SiO2 using a Eutectic Reaction 国際会議
M. Kurosawa, N. Taoka, M. Sakashita, O. Nakatsuka, M. Miyao, S. Zaima
The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8) and the 6th International Symposium on Control of Semiconductor Interfaces (ISCSI-VI)
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Control of Al2O3/Ge interfacial structures by post oxidation technique using oxygen radical 国際会議
K. Kato, S. Shibayama, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
5rd International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013)
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Defects introduced in germanium substrate by reactive ion etching 国際会議
Kusumandari, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka, S. Zaima
5rd International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013)
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Formation and Stress Characterization of NiGe/Ge(110) and Ge(001) Contacts 国際会議
Y. Deng, J. Yokoi, O. Nakatsuka and S. Zaima
Advanced Metallization Conference 2012: 22nd Asian Session (ADMETA Plus 2012)
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Impedance Spectroscopy of GeSn/Ge Heterostructures by a Numerical Method 国際会議
B. Baert, O. Nakatsuka, S. Zaima and N. Nguyen
The Pacific Rim Meeting on Electrochemical and Solid-State Science (PRiME 2012) Joint International 222nd ECS Meeting
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Growth and Characterization of Heteroepitaxial Layers of Ge1-x-ySixSny Ternary Alloy 国際会議
T. Yamaha, O. Nakatsuka, S. Takeuchi, W. Takeuchi, N. Taoka, K. Araki, K. Izunome and S. Zaima
The Pacific Rim Meeting on Electrochemical and Solid-State Science (PRiME 2012) Joint International 222nd ECS Meeting
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Growth and Optical Properties of Ge1-xSnx Alloy Thin Films with a High Sn Content 国際会議
S. Zaima, O. Nakatsuka, M. Nakamura, W. Takeuchi, Y. Shimura and N. Taoka
The Pacific Rim Meeting on Electrochemical and Solid-State Science (PRiME 2012) Joint International 222nd ECS Meeting
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Potential of GeSn Alloys for Application to Future Nanoelectronics 国際会議
O. Nakatsuka, and S. Zaima
The 6th Kentingan Physics Forum (the 6th KPF): International Conference on Physics and Its Applications (ICOPIA)
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Increase of Si0.5Ge0.5 Bulk Single Crystal Size as Substrates for Strained Ge Epitaxial Layers 国際会議
K. Kinoshita, O. Nakatsuka, Y. Arai, K. Taguchi, H. Tomioka, R. Tanaka and S. Yoda
2012 International Conference on Solid State Devices and Materials (SSDM 2012)
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Interfacial Reaction Mechanism in Al2O3/Ge Structure by Oxygen Radical 国際会議
K. Kato, S. Shibayama, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
2012 International Conference on Solid State Devices and Materials (SSDM 2012)
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High Mobility Poly-GeSn Layer Formed by Low Temperature Solid Phase Crystallization 国際会議
W. Takeuchi, N. Taoka, M. Kurosawa, M. Fukutome, M. Sakashita, O. Nakatsuka, and S. Zaima
2012 International Conference on Solid State Devices and Materials (SSDM 2012)
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Impact of Sn corporation on Epitaxial Growth of Ge Layers on Si(110) Substrates 国際会議
S. Kidowaki, T. Asano, Y. Shimura, N. Taoka, O. Nakatsuka and S. Zaima
2012 International Conference on Solid State Devices and Materials (SSDM 2012)
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In situ Sb doping in Ge1-xSnx Epitaxial Layers with High Sn Contents 国際会議
K. Hozaki, M. Nakamura, Y. Shimura, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies-International Conference on Electronic Materials 2012 (IUMRS-ICEM 2012)
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Electrical Properties of Epitaxially Grown p+-Ge1-xSnx/n-Ge Diodes 国際会議
S. Asaba, J. Yokoi, H. Matsuhita, Y. Deng, N. Taoka, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies-International Conference on Electronic Materials 2012 (IUMRS-ICEM 2012)
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Importance of Si Bandbending at Zero Bias Condition for Schottky Barrier Height Control at Metal/Si Interfaces with Ultra-thin Al2O3 Layer 国際会議
H. Matsushita, W. Takeuchi, M. Sakashita, N. Taoka, O. Nakatsuka and S. Zaima
International Union of Materials Research Societies-International Conference on Electronic Materials 2012 (IUMRS-ICEM 2012)
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Thermal Oxidation Mechanism of Ge through Al2O3 Layer Formed on Ge Substrate 国際会議
S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies-International Conference on Electronic Materials 2012 (IUMRS-ICEM 2012)
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Epitaxial Growth of Ge1-xSnx Layers on (110)-oriented Si and Ge Substrates 国際会議
T. Asano, S. Kidowaki, Y. Shimura, N. Taoka, O. Nakatsuka, and S. Zaima
International Union of Materials Research Societies-International Conference on Electronic Materials 2012 (IUMRS-ICEM 2012)
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Epitaxial Growth and Characterizations of Ge1-xSnx and Ge1-x-ySixSny Thin Layers for Nanoelectronic and Optoelectronic Applications 国際会議
O. Nakatsuka, N. Taoka, M. Sakashita, W. Takeuchi, S. Zaima
University of Vigo and JSPS Core-to-Core Program Joint Seminar
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Effects of Light and Air Exposures on Electrical Properties of GeO2/Ge and Al2O3/Ge Gate Stack Structures 国際会議
Kusumandari, W. Takeuchi, K. Kato, S. Shibayama, M. Sakashita, N. Taoka, O. Nakatsuka, and S. Zaima
2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2012)
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Potential of GeSn Alloys for Application to Si Nanoelectronics 国際会議
S. Zaima, Y. Shimura, M. Nakamura, W. Takeuchi, M. Sakashita, and O. Nakatsuka
2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2012)
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Control of Interfacial and Electrical Properties of Metal/Pr-oxide/Ge Gate Stack Structures 国際会議
K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, S. Zaima
CNSE and JSPS Core-to-Core Program Joint Seminar
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GeSn Alloy for Nanoelectronic and Optoelectronic Devices 国際会議
O. Nakatsuka, Y. Shimura, W. Takeuchi, N. Taoka and S. Zaima
CNSE and JSPS Core-to-Core Program Joint Seminar
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Epitaxial Growth and Characterization of GeSn Layers on Ge(110) and Si(110) Substrates 国際会議
T. Asano, S. Kidowaki, Y. Shimura, N. Taoka, O. Nakatsuka, S. Zaima
CNSE and JSPS Core-to-Core Program Joint Seminar
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Epitaxial Growth and Anisotropic Strain Relaxation of Ge1-xSnx Layers on Ge(110) Substrates 国際会議
T. Asano, Y. Shimura, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2012 (ISTDM 2012)
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Electrical Characterization of p-Ge1-xSnx/p-Ge and p-Ge1-xSnx/n-Ge Heterostructures by Numerical Simulation of Admittance Spectroscopy 国際会議
B. Baert, D. Y. N. Truong, O. Nakatsuka, S. Zaima, and N. D. Nguyen
International SiGe Technology and Device Meeting 2012 (ISTDM 2012)
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Material properties and applications of Ge1-xSnx alloys for Ge Nanoelectronics 国際会議
O. Nakatsuka, Y. Shimura, W. Takeuchi, and S. Zaima
International SiGe Technology and Device Meeting 2012 (ISTDM 2012)
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Optical Properties of Ge1-xSnx Epitaxial Layers with Very High Sn Contents 国際会議
M. Nakamura, Y. Shimura, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2012 (ISTDM 2012)
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Effect of Gate Metal Electrode on Chemical Bonding State in Metal/Pr-oxide/Ge Gate Stack Structure 国際会議
K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka, and S. Zaima
International SiGe Technology and Device Meeting 2012 (ISTDM 2012)
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Comprehensive Study of Local Strain Structures with High Strain Resolution for Through-Silicon Via Interconnects 国際会議
O. Nakatsuka, H. Kitada, Y. S. Kim, Y. Mizushima, T. Nakamura, T. Ohba, and S. Zaima
12th International Workshop on Stress-Induced Phenomena in Metallization
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Periodic Strain Undulation around Through Si Vias in Wafer-On-Wafer Structures 国際会議
N. Taoka, O. Nakatsuka, Y. Mizushima, H. Kitada, Y. S. Kim, T. Nakamura, T. Ohba and S. Zaima
Materials for Advanced Metallization 2013 (MAM 2013)
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A comparative study of metal germanide formation on Ge1-xSnx 国際会議
J. Demeulemeester, A. Schrauwen, K. Van Stiphout, O. Nakatsuka, M. Adachi, Y. Shimura, S. Zaima, C. M. Comrie, C. Detavernier, K. Temst, and A. Vantommea
Materials for Advanced Metallization 2013 (MAM 2013)
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Feasibility of Ge Device Fabrication by Low Temperature Processes on ULSI Circuits 国際会議
N. Taoka, M. Kurosawa, K. Kato, S. Shibayama, M. Sakashita, O. Nakatsuka and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Crystalline and Electrical Properties of Ni germanium/Ge(110) Contacts 国際会議
O. Nakatsuka, J. Yokoi, Y. Deng, N. Taoka and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Growth and Characterization of Ge1-x-ySixSny Epitaxial Layers for Solar Cell 国際会議
T. Yamaha, O. Nakatsuka, N. Taoka, W. Takeuchi and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Crystalline Properties of Ge1-xSnx Epitaxial Layers on Ge(110) 国際会議
T. Asano, M. Kurosawa, N. Taoka, O. Nakatsuka and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Control of Interfacial Reactions in Al2O3/Ge Structures 国際会議
S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, N. Taoka, O. Nakatsuka and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Low temperature crystallization of group-IV semiconductors induced by eutectic metals (Al, Sn) 国際会議
M. Kurosawa, N. Taoka, M. Sakashita, O. Nakatsuka, M. Miyao and S. Zaima
6th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to Core Program Joint Seminar
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Characterization of Local Strain around Trough Silicon Via Interconnects in Wafer-on-wafer Structures 国際会議
O. Nakatsuka, H. Kitada, Y. S. Kim, Y. Mizushima, T. Nakamura, T. Ohba and S. Zaima
IEEE International 3D System Integration Conference 2011 (IEEE 3DIC 2011)
-
Analysis of Strain Structures for Semiconductor Integrated Circuits with Micro Raman Spectroscopy 国際会議
O. Nakatsuka
The latest applications by the Modern Laser Raman Microscopy
-
Materials Innovation in Si Nanoelectronics 国際会議
S. Zaima, O. Nakatsuka
2011 Tsukuba Nanotechnology Symposium (TNS'11)
-
Electrical Properties of Ultrathin-Nickel-Silicide Schottky Diodes on Si (100) 国際会議
Y. Tamura, K. Kakushima, O. Nakatsuka, P. Ahmet, H. Nohira, K. Tsutsui, A. Nishiyama, N. Sugii, K. Natori, T. Hattori, H. Iwai, and R. Yoshihara
15th The International Conference on Thin Films, 2011 (ICTF-15)
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Effect of Interfacial Reactions in Radical Process on Electrical Properties of Al2O3/Ge Gate Stack Structure 国際会議
K. Kato, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
15th The International Conference on Thin Films, 2011 (ICTF-15)
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Suppressive Effect of Interface Reaction and Water Absorption by Al Incorporation into Pr-Oxide Film 国際会議
W. Takeuchi, K. Furuta, K. Kato, M. Sakashita, H. Kondo, O. Nakatsuka, and S. Zaima
15th The International Conference on Thin Films, 2011 (ICTF-15)
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GeSn Technology: Impact of Sn on Ge CMOS Applications 国際会議
S. Zaima, O. Nakatsuka, Y. Shimura, M. Adachi, M. Nakamura, S. Takeuchi, B. Vincent, F. Gencarelli, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, M. Caymax, and R. Loo
220th The Electrochemical Society meeting (ECS 220th Meeting)
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Comprehensive Study of Local Strain Structures with High Strain Resolution for Through-Silicon Via Interconnects 国際会議
O. Nakatsuka, H. Kitada, Y. S. Kim, Y. Mizushima, T. Nakamura, T. Ohba, and S. Zaima
28th Annual Advanced Metallization Conference 2011 (AMC 2011)
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Control of Defect Properties in Ge Heteroepitaxial Layers by Sn Incorporation and H2-Annealing 国際会議
M. Adachi, Y. Shimura, O. Nakatsuka, and S. Zaima
International Conference on Solid State Devices and Materials (SSDM 2011)
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Formation and Properties of Epitaxial NiGe/Ge(110) Contacts 国際会議
J. Yokoi, O. Nakatsuka, and S. Zaima,
International Conference on Solid State Devices and Materials (SSDM 2011)
-
Strain and Dislocation Structures of Ge1-xSnx Heteroepitaxial Layers Grown on Ge(110) Substrates 国際会議
T. Asano, Y. Shimura, O. Nakatsuka, and S. Zaima
International Conference on Solid State Devices and Materials (SSDM 2011)
-
Strained Ge Layers on SiGe(Sn) Buffer Layers Formed by Solid-phase Mixing Method 国際会議
T. Yamaha, K. Mochizuki, Y. Shimura, O.Nakatsuka, and S. Zaima
International Conference on Solid State Devices and Materials (SSDM 2011)
-
Comprehensive Study of Local Strain Structures with High Strain Resolution for Through-Silicon Via Interconnects 国際会議
O. Nakatsuka, H. Kitada, Y. S. Kim, Y. Mizushima, T. Nakamura, T. Ohba, and S. Zaima
Advanced Metallization Conference 2011 (ADMETA plus 2011): 21st Asian Session
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Electrical and optical properties of GeSn alloys 国際会議
O. Nakatsuka, Y. Shimura, M. Adachi, M. Nakamura, and S. Zaima
2nd GeSnWorkshop: GeSn Development and Future Applications
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Improvement of Al2O3 Interfacial Properties by O2 Annealing 国際会議
S. Shibayama, K. Kato, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
7th International Conference on Si Epitaxy and Heterostructures (iCSi-7 2011&GeSnWorkshop)
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Homogeneous Si0.5Ge0.5 Bulk Crystal Growth as Substrates for Strained Ge Thin Films by the Traveling Liquidus-Zone Method 国際会議
K. Kinoshita, O. Nakatsuka, S. Yoda, and S. Zaima
7th International Conference on Si Epitaxy and Heterostructures (iCSi-7 2011&GeSnWorkshop)
-
Growth of Ge1-xSnx heteroepitaxial layers with very high Sn contents on InP(001) substrates 国際会議
M. Nakamura, Y. Shimura, S. Takeuchi, O. Nakatsuka, and S. Zaima
7th International Conference on Si Epitaxy and Heterostructures (iCSi-7 2011&GeSnWorkshop)
-
In-situ Ga Doping to Fully Strained Ge1-xSnx Heteroepitaxial Layers Grown on Ge(001) Substrates 国際会議
Y. Shimura, S. Takeuchi, O. Nakatsuka, B. Vincent, F. Gencarelli, T. Clarysse, W. Vandervorst, M. Caymax, R. Loo, and S. Zaima
7th International Conference on Si Epitaxy and Heterostructures (iCSi-7 2011&GeSnWorkshop)
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Low Temperature Formation of Si1-x-yGexSny-on-Insulator Structures by Using Solid-Phase Mixing of Ge1-zSnz/Si-on-Insulator Substrates 国際会議
K. Mochizuki, T. Yamaha, Y. Shimura, O. Nakatsuka, and S. Zaima
7th International Conference on Si Epitaxy and Heterostructures (iCSi-7 2011&GeSnWorkshop)
-
Epitaxial Growth of Ge1-xSnx for Strained Ge CMOS Devices 国際会議
S. Zaima, Y. Shimura, S. Takeuchi and O. Nakatsuka
International Conference on Processing & Manufacturing of Advanced Materials (THERMEC' 2011)
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Control of Surface and Interfacial Structure by Radical Nitridation Technique for Ge MOS Transistors 国際会議
K. Kato, H. Kondo, M. Sakashita, W. Takeuchi, O. Nakatsuka, and S. Zaima
The 4th International Conference on PLAsma-NanoTechnology & Science (IC-PLANTS 2011)
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Characterization of Damages of Al2O3/Ge Gate Stacks Structure Induced with Light Radiation during Plasma Nitridation 国際会議
Kusumandari, W. Takeuchi, K. Kato, M. Sakashita, O. Nakatsuka, S. Zaima
3rd International Symposium on Advanced Plasma Science and its Application for Nitrides and Nanomaterials (ISPLasma 2011)
-
Control of Interfacial Properties of Al2O3/Ge Gate Stack Structure using Radical Nitridation Technique 国際会議
K. Kato, S. Kyogoku, M. Sakashita, W. Takeuchi, H. Kondo, O. Nakatsuka, S. Zaima
2011 International Workshop on Dielectric Thin Films for Future Electron Devices: Science and Technology (IWDTF 2011)
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Influence of Light Radiation on Electrical Properties of Al2O3/Ge and GeO2/Ge Gate Stacks in Nitrogen Plasma 国際会議
Kusumandari, W. Takeuchi, K. Kato, M. Sakashita, O. Nakatsuka, S. Zaima
2011 International Workshop on Dielectric Thin Films for Future Electron Devices: Science and Technology (IWDTF 2011)
-
Theory of Workfunction Control of Silicides by Doping for Future Si-Nano-devices based on Fundamental Physics of Why Silicides Exist in Nature 国際会議
T.Nakayama, K. Kakushima, O. Nakatsuka, Y. Machida, S. Sotome, T. Matsuki, K. Ohmori, H. Iwai, S. Zaima, T. Chikyow, K. Shiraishi, and K. Yamada
2010 IEEE International Electron Devices Meeting
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Study of Ge Surface Passivation using Radical Nitridation Technique for Ge Channel MOS Transistors 国際会議
K. Kato, H. Kondo, M. Sakashita, W. Takeuchi, O. Nakatsuka, S. Zaima
The 1st Korea-Japan Symposium on Surface Technology
-
Tensile-Strained Ge and Ge1-xSnx Layers for High-Mobility Channels in Future CMOS Devices 国際会議
S. Zaima, O. Nakatsuka, Y. Shimura, S. Takeuchi
International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2010)
-
Formation of Palladium Silicide Thin Layers on Si (110) Substrates 国際会議
R. Suryana, O. Nakatsuka, and S. Zaima
Advanced Metallization Conference 2010: 20th Asian Session (ADMETA 2010)
-
Characterization of Local Strain around Through-Silicon Via Interconnects by using X-ray Microdiffraction 国際会議
O. Nakatsuka, H. Kitada, Y. S. Kim, Y. Mizushima, T. Nakamura, T. Ohba, and S. Zaima
Advanced Metallization Conference 2010: 20th Asian Session (ADMETA 2010)
-
Control of Strain Relaxation Behavior of Ge1-xSnx Layers for Tensile Strained Ge Layers 国際会議
Y. Shimura, S. Takeuchi, O. Nakatsuka, and S. Zaima
218th ECS Meeting
-
Assessment of Ge1-xSnx Alloys for Strained Ge CMOS Devices 国際会議
S. Takeuchi, Y. Shimura, T. Nishimura, B. Vincent, G. Eneman, T. Clarysse, J. Demeulemeester, K. Temst, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, A. Sakai, and S. Zaima
218th ECS Meeting
-
Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy 国際会議
M. Adachi, M. Sakashita, H. Kondo, W. Takeuchi, O. Nakatsuka, and S. Zaima
2010 International Conference on Solid State Devices and Materials (SSDM 2010)
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Effects of Al Incorporation into Pr-oxides Formed by Atomic Layer Deposition 国際会議
K. Furuta, W. Takeuchi, M. Sakashita, K. Kato, H. Kondo, O. Nakatsuka, and S. Zaima
2010 International Conference on Solid State Devices and Materials (SSDM 2010)
-
Growth and Characterization of GeSn and Tensile-Strained Ge Layers for High Mobility Channels of CMOS Devices 国際会議
O. Nakatsuka, Y. Shimura, S. Takeuchi, and S. Zaima
The 7th Pacific Rim International Conference on Advanced Materials and Processing
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Microscopic structure of directly bonded silicon substrates
T. Kato, Y. Ohara, T. Ueda, J. Kikkawa, Y. Nakamura, A. Sakai, O. Nakatsuka, M. Ogawa, S. Zaima, E. Toyoda, H. Isogai, T. Senda, K. Izunome, H. Tajiri, O. Sakata, and S. Kimura
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Strained Ge and Ge1-xSnx technology for future CMOS devices
S. Zaima, O. Nakatsuka, S. Takeuchi, Y. Shimura, A. Sakai, H. Kondo, and M. Sakashita
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Formation of Ge1-xSnx heteroepitaxial layers with high Sn content 国際会議
Y. Shimura, S. Takeuchi, O. Nakatsuka, A. Sakai, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Control of strain structure by microfabrication of Ge/Si1-xGex layers on Si(001) Substrates
K. Mochizuki, T. Mizutani, O. Nakatsuka, H. Kondo, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Dependence of electrical properties on crystalline structures of Mn5Ge3/Ge Schottky contacts 国際会議
T. Nishimura, O. Nakatsuka, S. Akimoto, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Impact of nitride interfacial layer on electrical properties of high-k/Ge stacked structures
K. Kato, H. Kondo, M. Sakashita, O. Nakatsuka, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Crystalline and electrical properties of PrAlO gate insulator films formed by atomic layer deposition
K. Furuta, W. Takeuchi, M. Sakashita, H. Kondo, O. Nakatsuka, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Nitrogen content dependence of crystalline and electrical properties of ternary transition metal gate electrodes
H. Matsushita, K. Miyamoto, K. Furumai, H. Kondo, M. Sakashita, O. Nakatsuka, and S. Zaima
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Structural change during the formation of directly bonded silicon substrates
T. Kato, T. Ueda, Y. Ohara, J. Kikkawa, Y. Nakamura, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, Y. Imai, S. Kimura, and O. Sakata
International Symposium on Technology Evolution for Silicon Nano Electronics (ISTESNE)
-
Material Assessment for uni-axial strained Ge pMOS -1: Characterization of GeSn(B) material 国際会議
B. Vincent, Y. Shimura, S. Takeuchi, T. Nishimura, J. Demeulemeester, G. Eneman, T. Clarysse, W. Vandervorst, A. Vantomme, O. Nakatsuka, S. Zaima, J. Dekoster, M. Caymax, and R. Loo
International Workshop of GeSn Developments and Future Applications
-
GeSn: future applications and strategy 国際会議
R. Loo, M. Caymax, B. Vincent, J. Dekoster, S. Takeuchi, O. Nakatsuka, S. Zaima, K. Temst, A. Vantomme
International Workshop of GeSn Developments and Future Applications
-
(Si)GeSn requirements for optical device applications and solar cells 国際会議
S. Takeuchi, B. Vincent, K. Temst, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, S. Zaima
International Workshop of GeSn Developments and Future Applications
-
Material Assessment for uni-axial strained Ge pMOS-2: Formation of Ni(GeSn) Layers with Solid-Phase Reactor 国際会議
T. Nishimura, Y. Shimura, S. Takeuchi, B. Vincent, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, and S. Zaima
International Workshop of GeSn Developments and Future Applications
-
Bi-axially strained Ge grown on GeSn SRBs 国際会議
O. Nakatsuka, S. Takeuchi, Y. Shimura, A. Sakai, and S. Zaima
International Workshop of GeSn Developments and Future Applications
-
Control of Interfacial Properties of Pr-oxide/Ge Gate Stack Structure by Introduction of Nitrogen 国際会議
K. Kato, H. Kondo, M. Sakashita, O. Nakatsuka, S. Zaima
5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
-
Ge1-xSnx stressors for strained-Ge CMOS 国際会議
S. Takeuchi, Y. Shimura, T. Nishimura, B. Vincent, G. Eneman, T. Clarysse, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, S. Zaima,
5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
-
Control of Strain Relaxation Behavior of Ge1-xSnx Layers: Toward Tensile-Strained Ge Layers with Strain Value over 1% 国際会議
Y. Shimura, S. Takeuchi, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
-
Formation of Ni(Ge1-xSnx) Layers with Solid-Phase Reaction in Ni/Ge1-xSnx/Ge Systems 国際会議
T. Nishimura, Y. Shimura, S. Takeuchi, B. Vincent, A. Vantomme, J. Dekoster, M. Caymax, R. Loo, O. Nakatsuka, S. Zaima
5th International SiGe Technology Device Meeting 2010 (ISTDM2010)
-
Crystalline Orientation Dependence of Electrical Properties on Mn Germanide/Ge(111) and (001) Schottky Contacts 国際会議
T. Nishimura, O. Nakatsuka, S. Zaima
Materials for Advanced Metallization Conference
-
Strain Relaxation Behavior of Ge1-xSnx Buffer Layers on Si and Virtual Ge Substrates 国際会議
Y. Shimura, S. Takeuchi, N. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
5th International WorkShop on New Group IV Semiconductor Nanoelectronics, pp. 43-44, Sendai, Japan, Jan. 29-30, 2010.
-
Control of Local Strain Structures by Microfabricated Shapes of Ge/Si1-xGex Layers 国際会議
K. Mochizuki, T. Mizutani, O. Nakatsuka, H. Kondo, S. Zaima
5th International WorkShop on New Group IV Semiconductor Nanoelectronics
-
Potential of Ge1-xSnx alloys as high mobility channel materials and stressors 国際会議
S. Takeuchi, Y. Shimura, T. Tsutsui, O. Nakatsuka, A. Sakai, S. Zaima
5th International WorkShop on New Group IV Semiconductor Nanoelectronics
-
Microscopic characterization of Si(011)/Si(001) direct silicon bonding substrates 国際会議
T. Kato, T. Ueda, Y. Ohara, J. Kikkawa, Y. Nakamura, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, Y. Imai, S. Kimura, and O. Sakata
5th International WorkShop on New Group IV Semiconductor Nanoelectronics
-
Formation of Palladium Silicide on Heavily Doped Si (001) Substrates Using Ti Intermediate Layer 国際会議
R. Suryana, O. Nakatsuka, and S. Zaima
Advanced Metallization Conference 2009 (ADMETA): 19th Asian Session
-
Mobility Behavior in Ge1-xSnx Layers Grown on SOI Substrates 国際会議
N. Tsutsui, Y. Shimura, O. Nakatsuka, A. Sakai, and S. Zaima,
2009 International Conference on Solid State Devices and Materials (SSDM)
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Influence of Interfacial Structure on Electrical Properties of Metal/Ge Schottky Contacts 国際会議
O. Nakatsuka, S. Akimoto, T. Nishimura and S. Zaima
The 9th International Workshop on Junction Technology (IWJT2009)
-
Structural change of direct silicon bonding substrates by interfacial oxide out-diffusion annealing 国際会議
T. Kato, T. Ueda, Y. Ohara, J. Kikkawa, Y. Nakamura, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, Y. Imai, S. Kimura, and O. Sakata
The 6th International Conference on Silicon Epitaxy and Heterostructures
-
Formation and characterization of tensile-strained Ge layers on Ge1-xSnx buffer layers 国際会議
S. Zaima, O. Nakatsuka, Y. Shimura, N. Tsutsui, and A. Sakai
The 6th International Conference on Silicon Epitaxy and Heterostructures
-
Low Temperature Growth of Ge1-xSnx Buffer Layers for Tensile-strained Ge Layers 国際会議
Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, and S. Zaima
The 6th International Conference on Silicon Epitaxy and Heterostructures
-
Analysis of Local Strain in Ge1-xSnx /Ge/Si(001) Heterostructures by X-ray Microdiffraction 国際会議
O. Nakatsuka, Y. Shimura, N. Tsutsui, A. Sakai, Y. Imai, H. Tajiri, O. Sakata, S. Kimura, and S. Zaima
The 6th International Conference on Silicon Epitaxy and Heterostructures
-
Effect of Atomic Deuterium Irradiation on Initial Growth of Sn and Ge1-xSnx on Ge(001) Substrates 国際会議
T. Shinoda, O. Nakatsuka, and S. Zaima
The 6th International Conference on Silicon Epitaxy and Heterostructures
-
Direct Silicon Bonding (DSB) 基板の接合界面欠陥解析
豊田英二,酒井朗,中塚理,財満鎭明,磯貝宏道,仙田剛士,泉妻宏治
第56回応用物理学関係連合講演会
-
低温成長による高Sn組成Ge1-xSnxバッファ層の形成
志村洋介,筒井宣匡,中塚理,酒井朗,財満鎭明
第56回応用物理学関係連合講演会
-
Ge(001)表面上のSnおよびGe1-xSnx初期成長に及ぼす原子状重水素照射の効果
篠田竜也,中塚理,財満鎭明
第56回応用物理学関係連合講演会
-
Ge/Si1-xGex/Siマイクロ構造形成による局所歪および転位挙動の制御
水谷卓也,望月健太,中塚理,近藤博基,酒井朗,財満鎭明
第56回応用物理学関係連合講演会
-
Direct Si Bonding基板の界面酸化膜消滅熱処理過程における結晶性変化
加藤哲司,大原悠司,吉川純,中村芳明,酒井朗,中塚理,財満鎭明,豊田英二,泉妻宏治,木村滋,坂田修身
第56回応用物理学関係連合講演会
-
原子状水素照射によるGe(001)表面上SnおよびGe1-xSnx初期成長構造の制御
篠田竜也,山崎理弘,中塚理,財満鎭明
第8回・日本表面科学会中部支部・学術講演会
-
伸長歪Ge層実現のための高Sn組成Ge1-xSnxバッファ層成長
志村洋介,筒井宣匡,中塚理,酒井朗,財満鎭明
第8回・日本表面科学会中部支部・学術講演会
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Atomistic analysis of directly bonded Si substrate interface 国際会議
T. Ueda, Y. Ohara, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, T. Sakata, and H. Mori
The IUMRS International Conference in Asia 2008 (IUMRS-ICA 2008)
-
Formation of Uniaxial Tensile-strained Ge by using Micro-patterning of Ge/Si1-xGex/Si Structures 国際会議
T. Mizutani, O. Nakatsuka, A. Sakai, H. Kondo, and S. Zaima
The IUMRS International Conference in Asia 2008 (IUMRS-ICA 2008)
-
Formation and Characterization of Tensile-strained Ge layers on Ge1-xSnx Buffer Layers 国際会議
Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, and S. Zaima
The IUMRS International Conference in Asia 2008 (IUMRS-ICA 2008)
-
Strain and interfacial defects in directly bonded Si substrates 国際会議
Y. Ohara, T. Ueda, A. Sakai, O. Nakatsuka, S. Zaima, E. Toyoda, K. Izunome, H. Tajiri, O. Sakata and S. Kimura
The IUMRS International Conference in Asia 2008 (IUMRS-ICA 2008)
-
Characterization and analyses of interface structures in directly bonded Si(011)/Si(001) substrates 国際会議
E. Toyoda, A. Sakai, O. Nakatsuka, H. Isogai, T. Senda, K. Izunome, K. Omote, and S. Zaima
The 5th International Symposium on Advanced Science and Technology of Silicon Materials
-
Crystalline and Electrical Properties of Thin Pd Silicide Layer/Si Contacts 国際会議
R. Suryana, S. Akimoto, O. Nakatsuka and S. Zaima
Advanced Metallization Conference 2008 (ADMETA): 18th Asian Session
-
Formation of Tensile-Strained Ge Layers on Ge1-xSnx Buffer Layers and Control of Strain and Dislocation Structures 国際会議
O. Nakatsuka, Y. Shimura, A. Sakai, and S. Zaima
4th International WorkShop on New Group IV Semiconductor Nanoelectronics
-
Analysis of Uniaxial Tensile Strain in Microfabricated Ge/Si1-x Gex Structures on Si(001) Substrates 国際会議
T. Mizutani, O. Nakatsuka, A. Sakai, H. Kondo, and S. Zaima
4th International WorkShop on New Group IV Semiconductor Nanoelectronics
-
Formation and Characterization of Compositionally Step-graded Ge1-x Snx Buffer Layers for Tensile-strained Ge Layers 国際会議
Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, and S. Zaima
4th International WorkShop on New Group IV Semiconductor Nanoelectronics, pp. 27-28, Sendai, Japan, Sept. 25-27, 2008.
-
Control of Sn Precipitation and Strain relaxation in Compositionally Step-graded Ge1-xSnx Buffer Layers for Tensile-strained Ge Layers 国際会議
Y. Shimura, N. Tsutsui, O. Nakatsuka, A. Sakai, and S. Zaima
2008 International Conference on Solid State Devices and Materials (SSDM)
-
Direct Silicon Bonding基板接合界面の原子レベル観察と評価
酒井朗,上田貴哉,大原悠司,中塚理,財満鎭明,豊田英二,泉妻宏治,坂田孝夫,森博太郎
第69回応用物理学会学術講演会
-
金属シリサイド・ジャーマナイド/半導体コンタクトの界面構造および電子物性制御
中塚理,酒井朗,財満鎭明
第69回応用物理学会学術講演会
-
伸張歪Ge形成に向けたGe1-xSnxバッファ層のSn組成及び転位構造制御
志村洋介,筒井宣匡,中塚理,酒井朗,財満鎭明
第69回応用物理学会学術講演会
-
Ge(001)表面上のSnおよびGe1-xSnx初期成長に及ぼす原子状水素照射の効果
篠田竜也,山崎理弘,中塚理,財満鎭明
第69回応用物理学会学術講演会
-
Direct Silicon Bonding (DSB) 基板の結晶性の評価
豊田英二,酒井朗,中塚理,財満鎭明,磯貝宏道,泉妻宏治,仙田剛士,表一彦,今井康彦,木村滋
第69回応用物理学会学術講演会
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Direct Si Bonding基板の微細構造
大原悠司,上田貴哉,酒井朗,中塚理,財満鎭明,豊田英二,泉妻宏治,木村滋,坂田孝夫,森博太郎
第69回応用物理学会学術講演会
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Microstructures in Directly Bonded Si Substrates 国際会議
A. Sakai, Y. Ohara, T. Ueda, O. Nakatsuka, M. Ogawa, S. Zaima, E. Toyoda
The fourth International SiGe Technology and Device Meeting, pp. 153-154, HsinChu, Taiwan, May 11-14, 2008.
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Characterization and Analyses of Interface Structures in Directly Bonded Si(011)/Si(001) Substrates 国際会議
E. Toyoda, A. Sakai, O. Nakatuka, S. Zaima, M. Ogawa, H. Isogai, T. Senda, K. Izunome, and K. Omote
The fourth International SiGe Technology and Device Meeting
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Effect of Hydrogen on Initial Growth of Sn and Ge1-xSnx on Ge(001) substrates 国際会議
M. Yamazaki, O. Nakatsuka, T. Shinoda, A. Sakai, M. Ogawa, and S. Zaima
The fourth International SiGe Technology and Device Meeting
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Novel Method to Introduce Uniaxial Tensile Strain in Ge by Microfabrication of Ge/Si1-xGex Structures on Si(001) Substrates 国際会議
T. Mizutani, O. Nakatsuka, A. Sakai, H. Kondo, M. Ogawa, and S. Zaima
The fourth International SiGe Technology and Device Meeting, pp. 149-150, HsinChu, Taiwan, May 11-14, 2008.
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高不純物濃度Si(001)基板上におけるNi/Ti/Si系の固相反応および電気特性評価
秋元信吾,中塚理,スルヤナリサ,鈴木敦之,酒井朗,小川正毅,財満鎭明
第55回応用物理学関係連合講演会
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X線マイクロ回折によるIV族半導体薄膜の局所歪構造評価
中塚理,酒井朗,小川正毅,財満鎭明
第55回応用物理学関係連合講演会
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Ge MOSゲートスタックにおける界面反応の評価および制御技術
財満鎭明,近藤博基,坂下満男,中塚理,酒井朗,小川正毅
第55回応用物理学関係連合講演会
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アルコール原料ホットフィラメントCVD法による単層カーボンナノチューブ成長機構の解明
種田智,酒井朗,中塚理,小川正毅,財満鎭明
第55回応用物理学関係連合講演会
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走査トンネル顕微鏡によるTi/Highly oriented pyrolytic graphite界面反応の評価
久田憲司,種田智,中塚理,酒井朗,小川正毅,財満鎭明
第55回応用物理学関係連合講演会
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パターン加工されたGe/Si1-xGex/Si(001)構造におけるGe層一軸性伸張歪構造の評価
水谷卓也,湯川勝規,中塚理,近藤博基,酒井朗,小川正毅,財満鎭明
第55回応用物理学関係連合講演会
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Scanning Tunneling Microscopy Observation of Initial Growth of Sn and Ge1-xSnx Layers on Ge(001) Substrates 国際会議
M. Yamazaki, S. Takeuchi, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
Fifth International Symposium on Control of Semiconductor Interfaces
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Defect Control for Ge/Si and Ge1-xSnx/Ge/Si Heterostructures 国際会議
A. Sakai, S. Takeuchi, O. Nakatsuka, M. Ogawa, and S. Zaima,
Fifth International Symposium on Control of Semiconductor Interfaces
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Characterization of Local Strains in Si1-xGex Hetero-mesa Structures on Si(001) Substrates by Using X-ray Microdiffraction 国際会議
O. Nakatsuka, K. Yukawa, S. Mochizuki, A. Sakai, K. Fukuda, S. Kimura, O. Sakata, K. Izunome, T. Senda, E. Toyoda, M. Ogawa, and S. Zaima
Fifth International Symposium on Control of Semiconductor Interfaces
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Controlling Interface Properties of Silicide/Si Contacts for Si ULSI Applications 国際会議
S. Zaima, O. Nakatsuka, A. Sakai, and M. Ogawa
9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
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Effect of alcohol sources on synthesis of single-walled carbon nanotubes 国際会議
S. Oida, A. Sakai, O. Nakatuska, M. Ogawa, and S. Zaima
9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
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Growth and Characterization of Tensile-Strained Ge Layers on Strain Relaxed Ge1-xSnx Buffer Layers 国際会議
O. Nakatsuka, S. Takeuchi, A. Sakai, M. Ogawa, and S. Zaima
The 3nd international workshop on new group IV semiconductor nanoelectronics
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Tensile Strained Ge Layers Grown on Compositionally Step-Graded Ge1-xSnx Buffer Layers 国際会議
Y. Shimura, S. Takeuchi, A. Sakai, O. Nakatsuka, M. Ogawa, and S. Zaima
The 3nd international workshop on new group IV semiconductor nanoelectronics
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Electrical and Crystalline Properties of Epitaxial NiSi2/Si Contacts Fromed in Ni/Ti/Si(001) Systems 国際会議
O. Nakatsuka, A. Suzuki, S. Akimoto, A. Sakai, M. Ogawa, and S. Zaima
The Sixth Pacific Rim International Conference on Advanced Materials and Processing
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Contact Propeties of Epitaxial NiSi2/Heavily Doped Si Structures Formed from Ni/Ti/Si Systems 国際会議
S. Akimoto, O. Nakatsuka, A. Suzuki, A. Sakai, M. Ogawa, and S. Zaima
Advanced Metallization Conference 2007: 17th Asian Session
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Silicide and Germanide Technology for Contacts and Metal Gates in MOSFET Applications 国際会議
S. Zaima, O. Nakatsuka, H. Kondo, M. Sakashita, A. Sakai, and M. Ogawa
212th Electrochemical Society Meeting
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Pr-Oxide-Based Dielectric Films on Ge Substrates 国際会議
M. Sakashita, N. Kito, A. Sakai, H. Kondo, O. Nakatsuka, M. Ogawa and S. Zaima
2007 International Conference on Solid State Devices and Materials
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Dependence of Electrical Characteristics on Interfacial Structures of Epitaxial NiSi2/Si Schottky Contacts Formed from Ni/Ti/Si System 国際会議
O. Nakatsuka, A. Suzuki, S. Akimoto, A. Sakai, M. Ogawa, and S. Zaima
2007 International Conference on Solid State Devices and Materials
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Strain and dislocations in group IV semiconductor heterostructures 国際会議
A. Sakai, O. Nakatsuka, M. Ogawa, and S. Zaima
Materials Research Society 2007 Spring Meeting
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Si1-xGex/Si(001)構造における転位および歪の評価と制御技術
中塚理,酒井朗,近藤博基,小川正毅,財満鎭明
2007年 電子情報通信学会 エレクトロニクスソサエティ大会
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Direct Silicon Bonding (DSB) 基板の接合界面および結晶性の評価
豊田英二,酒井朗3,磯貝宏道,仙田剛士,泉妻宏治,表和彦,中塚理,小川正毅,財満鎭明
第68回応用物理学会学術講演会
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ホットフィラメントCVD法による単層カーボンナノチューブ成長様式のアルコール種依存性
種田智,酒井朗,中塚理,小川正毅,財満鎭明
第68回応用物理学会学術講演会
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Ge(001)基板上におけるGe1-xSnx初期成長形態の走査トンネル顕微鏡評価
山崎理弘,竹内正太郎1,中塚理,酒井朗,小川正毅,財満鎭明
第68回応用物理学会学術講演会
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階段状組成傾斜法を用いた伸張歪Ge/歪緩和Ge1-xSnx層/仮想Ge基板構造の形成
志村洋介,竹内正太郎,酒井朗,中塚理,小川正毅,財満鎭明
第68回応用物理学会学術講演会
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Impact of Pt Incorporation on Thermal Stability of NiGe Layers on Ge(001) Substrates 国際会議
O. Nakatsuka, A. Suzuki, A. Sakai, M. Ogawa, and S. Zaima
7th International Workshop on Junction Technology 2007, pp. 87-88, Kyoto, Japan, June 8-9, 2007.
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Characterization of bonding structures of directly bonded hybrid crystal orientation substrates 国際会議
E. Toyoda, A. Sakai, H. Isogai, T. Senda, K. Izunome, O. Nakatsuka, M. Ogawa, and S. Zaima
5th International Conference on Silicon Epitaxy and Heterostructures
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Tensile strained Ge layers on strain-relaxed Ge1-xSnx/virtual Ge substrates 国際会議
S. Takeuchi, A. Sakai, O. Nakatsuka, M. Ogawa, and S. Zaima
5th International Conference on Silicon Epitaxy and Heterostructures
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Ge(001)表面の酸素エッチングおよび酸化過程の走査トンネル顕微鏡による観察評価
山崎理弘,若園恭伸,酒井朗,中塚理,小川正毅,財満鎭明
第6回・日本表面科学会中部支部・学術講演会
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ダイレクトSiウェーハボンディングにおける接合特性の評価
豊田英二,磯貝宏道,仙田剛士,泉妻宏治,中塚理,酒井朗,小川正毅,財満鎭明
第54回応用物理学関係連合講演会
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Ge(001)基板上NiGe薄膜のPt添加による熱的安定性向上
鈴木敦之,中塚理,酒井朗,小川正毅,財満鎭明
第54回応用物理学関係連合講演会
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パターン加工されたSiGe/Siヘテロメサ構造における局所歪のX線マイクロ回折評価
湯川勝規,望月省吾,中塚理,酒井朗,福田一徳,木村滋,坂田修身,泉妻宏治,仙田剛士,豊田英二,小川正毅,財満鎭明
第54回応用物理学関係連合講演会
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Hybrid Orientation Technology (HOT) 基板の接合界面および結晶性の評価
豊田英二,磯貝宏道,仙田剛士,泉妻宏治,中塚理,酒井朗,小川正毅,財満鎭明
第54回応用物理学関係連合講演会
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Ge(001)表面の酸素エッチングおよび初期酸化過程の原子スケール評価
山崎理弘,若園恭伸,酒井朗,中塚理,竹内正太郎,小川正毅,財満鎭明
応用物理学会 薄膜・表面物理分科会・シリコンテクノロジー分科会共催特別研究会「ゲートスタック研究会 ―材料・プロセス・評価の物理―」(第12回研究会)
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Scanning Tunneling Microscopy Study on the Reaction of Oxygen with Clean Ge(001) Surfaces 国際会議
A. Sakai, Y. Wakazono, O. Nakatsuka, S. Zaima, and M. Ogawa
210th Meeting of The Electrochemical Society
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Ni-Silicide/Si and SiGe(C) Contact Technology for ULSI Applications 国際会議
O. Nakastuka, S. Zaima, A. Sakai, and M. Ogawa
The 14th annual IEEE International Conference on Advanced Thermal Processing of Semiconductors
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Buffer layer technology with misfit dislocation engineering 国際会議
A. Sakai, O. Nakatsuka, M. Ogawa, and S. Zaima
The 2nd International WorkShop on New Group IV Semiconductor Nanoelectronics
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Mosaicity and Dislocations in Strain-Relaxed SiGe Buffer Layers on SOI Substrates 国際会議
O. Nakatsuka, N. Taoka, A. Sakai, S. Mochizuki, M. Ogawa, and S. Zaima
The 2nd International WorkShop on New Group IV Semiconductor Nanoelectronics, pp. 71-72, Oct. 2-3, 2006, Sendai, Japan.
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Dislocation Structure and Strain Relaxation of SiGe and Ge Sub-micron Stripe Lines on Si(001) Substrates 国際会議
O. Nakatsuka, S. Mochizuki, A. Sakai, H. Kondo, K. Yukawa, M. Ogawa, and S. Zaima
The 2nd International WorkShop on New Group IV Semiconductor Nanoelectronics
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Interfacial Structure of HfON/SiN/Si Gate Stacks 国際会議
O. Nakatsuka, M. Sakashita, H. Kondo, E. Ikenaga, M. Kobata, J.-J. Kim, H. Nohira, T. Hattori, A. Sakai, M. Ogawa, S. Zaima
The 2nd International Workshop on Hard X-ray Photoelectron Spectroscopy
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Ni/Ti/Si積層構造より形成したエピタキシャルNiSi2/Si(001)超平坦界面の電気特性評価
鈴木敦之,中塚理,酒井朗,小川正毅,財満鎭明
第67回応用物理学会学術講演会
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Ge1-xSnx層の歪緩和および転位構造に及ぼすGe基板の効果
竹内正太郎,酒井朗,中塚理,小川正毅,財満鎭明
第67回応用物理学会学術講演会
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仮想Ge(001)基板上における歪緩和Ge1-xSnxバッファ層の成長と構造評価
竹内正太郎,酒井朗,山本幸司,中塚理,小川正毅,財満鎭明
第67回応用物理学会学術講演会
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Ge(001)表面の初期酸化およびエッチング過程の走査トンネル顕微鏡評価
若園恭伸,山崎理弘,酒井朗,中塚理,竹内正太郎,小川正毅,財満鎭明
第67回応用物理学会学術講演会
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Control and characterization of strain in SiGe/Si heterostructures with engineered misfit dislocations 国際会議
A. Sakai, N. Taoka, S. Mochizuki, K. Yukawa, O. Nakatsuka, S. Takeda, S. Kimura, M. Ogawa, and S. Zaima
The third International SiGe Technology and Device Meeting
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Strain relaxation of patterned Ge and SiGe structures on Si(001) substrates 国際会議
-
Systematic Characterization of Ni Full Silicide in Sub-100 nm Gate Regions 国際会議
D. Ito, A. Sakai, O. Nakatsuka, H. Kondo, Y. Akasaka, M. Ogawa, and S. Zaima
2006 MRS Spring Meeting
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エピタキシャルAgテンプレート層上における触媒金属CVD法に よるカーボンナノチューブ成長
種田智,酒井朗,中塚理,小川正毅,財満鎭明
第5回日本表面科学会中部支部学術講演会
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Sub-100 nmゲート領域におけるNiシリサイド形成反応の観察
伊東大介,酒井朗,中塚理,近藤博基,赤坂泰志,奈良安雄,小川正毅,財満鎭明
第53回応用物理学関係連合講演会
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エピタキシャルAg/Si(111)上における触媒金属CVD法によるカーボンナノチューブ成長
種田智,酒井朗,中塚理,小川正毅,財満鎭明
第53回応用物理学関係連合講演会
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仮想Ge(001)基板上における歪緩和Ge1-xSnxバッファ層の成長と構造評価
竹内正太郎,酒井朗,山本幸司,中塚理,小川正毅,財満鎭明
第53回応用物理学関係連合講演会
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極薄Ge中間層を用いた歪緩和Ge/Si(001)界面の転位構造制御
湯川勝規,望月省吾,中塚理,酒井朗,竹田晋吾,木村滋,坂田修身,隅谷和嗣,泉妻宏治,仙田剛士,豊田英二,小川正毅,財満鎭明
第53回応用物理学関係連合講演会
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Si(001)基板上にパターン加工されたGeおよびSiGe層の歪緩和評価と制御
望月省吾,湯川勝規,中塚理,近藤博基,酒井朗,泉妻宏治,仙田剛士,豊田英二,小川正毅,財満鎭明
第53回応用物理学関係連合講演会
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Electrical properties of epitaxial NiSi2/Si contacts with extremely flat interface formed in Ni/Ti/Si(001) system 国際会議
O. Nakatsuka, A. Suzuki, A. Sakai, M. Ogawa, and S. Zaima
Materials for Advanced Metallization Conference 2006
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Epitaxial NiSi2 layers with extremely flat interfaces in Ni/Ti/Si(001) system 国際会議
A. Suzuki, K. Okubo, O. Nakatsuka, A. Sakai, M. Ogawa, and S. Zaima
Advanced Metallization Conference 2005: 15th Asian Session
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Dislocation and strain engineering for SiGe buffer layers on Si 国際会議
A. Sakai, S. Mochizuki, N. Taoka, O. Nakatsuka, S. Takeda, S. Kimura, M. Ogawa, and S. Zaima
Symposium on Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing IV (joint with 35th European Solid State Device Research Conference)
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Ni/Ti/Si(001)系におけるエピタキシャルNiSi2超平坦界面の低温形成
鈴木敦之、大久保和哉、中塚理、酒井朗、小川正毅、財満鎭明
第66回応用物理学会学術講演会
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Impact of C implantation on electrical properties of NiSi/Si contact 国際会議
O. Nakatsuka, K. Okubo, A. Sakai, M. Ogawa, and S. Zaima
The 5th International Workshop on Junction Technology
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Surface structures in the initial growth of epitaxial Si1-x-yGexCy layers in SiGe and C alternate deposition 国際会議
S. Takeuchi, O. Nakatsuka, Y. Wakazono, A. Sakai, M. Ogawa, Y. Yasuda, and S. Zaima
First International WorkShop on New Group IV Semiconductor Nanoelectronics
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Control of Solid-Phase Reaction and Electrical Properties of Ni silicide/Si Contacts by Ge and C Incorporation 国際会議
O. Nakatsuka, K. Okubo, A. Sakai, J. Murota, Y. Yasuda, M. Ogawa, and S. Zaima
First International WorkShop on New Group IV Semiconductor Nanoelectronics
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Hard X-Ray Photoelectron Spectroscopy for HfON/SiN/Si System 国際会議
O. Nakatsuka, R. Takahishi, M. Sakashita, E. Ikenaga, K. Kobayashi, H. Nohira, T. Hattori, A. Sakai, M. Ogawa, and S. Zaima
Fourth International Conference on Silicon Epitaxy and Heterostructures
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Cイオン注入を用いたNiSi界面固相反応制御
中塚理、大久保和哉、酒井朗、小川正毅、安田幸夫、財満鎭明
第4回・日本表面科学会中部支部学術講演会
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Improvement on NiSi/Si contact properties with C-implantation 国際会議
S. Zaima, O. Nakatsuka, K. Okubo, A. Sakai, M. Ogawa, and Y. Yasuda
Materials for Advanced Metallization Conference 2005
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Transmission electron microscopy analysis of dislocation structures in the strain-relaxed SiGe films on Si and silicon-on-insulator substrates 国際会議
N. Taoka, A. Sakai, S. Mochizuki, O. Nakatsuka, M. Ogawa, S. Zaima, and Y. Yasuda
International Symposium on Characterization of Real Materials and Real Processing by Transmission Electron Microscopy
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Control of initial growth of epitaxial NiSi2 on Si(001) with C incorporation 国際会議
O. Nakatsuka, E. Okada, D. Ito, A. Sakai, S.Zaima, M. Ogawa, and Y. Yasuda,
Third International Workshop on New Group IV (Si-Ge-C) Semiconductors: Control of Properties and Application to Ultrahigh Speed and Opto-Electronic Devices,
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Thermal stability and electrical properties of Ni-silicide on C-incorporation 国際会議
", O. Nakatsuka, K. Okubo, A. Sakai, M. Ogawa, S. Zaima, J. Murota, and Y. Yasuda,
Advanced Metallization Conference 2004: Asian Session
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Growth mechanism of epitaxial NiSi2 layer in the Ni/Ti/Si(001) contact for atomically flat interfaces 国際会議
O. Nakatsuka, K. Okubo, A. Sakai, S. Zaima, and Y. Yasuda
The 4th International Workshop on Junction Technology