講演・口頭発表等 - 田渕 雅夫
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" Investigation of hetero-interfaces formed in InP/GaInAs/InP structures with different growth rates" 国際会議
Indium Posphide and Related Materials 2006 (IPRM2006)
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" Challenge to analyze In distributions in GaInN/GaN multilayer structures at atomic-scale by X-ray CTR scattering measurement"
5th Akasaki Research Center Symp.
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" Fluorescence EXAFS study on local structures around Eu atoms implanted in Al_xGa_1-xN" 国際会議
The 23rd International Conference on Defects in Semiconductors (ICDS23)
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" Surface morphology of ErP layers on InP and GaInP" 国際会議
13th International Conference on Thin Films/8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF13/ACSIN8)
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" Realization of flat ErAs layers in GaAs/AlAs/ErAs/AlAs/GaAs RTD structure using an interface control layer" 国際会議
13th International Conference on Thin Films/8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF13/ACSIN8)
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" Realization of square quantum-well structure InP/GaInAs/InP by organometallic vapor phase epitaxy" 国際会議
2005 Inter. Conf. Indium Phosphide and Related Materials (IPRM2005)
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" X-ray non-invasive characterization of GaN/GaInN/GaN quantum-well structures "
4th Akasaki Research Center Symp.
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" How thin can we make square profiles in InP/GaInAs/InP wells by organometallic vapor phase epitaxy? --- X-ray CTR scattering measurements --- " 国際会議
2004 Inter. Conf. Indium Phosphide and Related Materials
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" Control of group-III atoms distribution in thin quantum wells analyzed by X-ray CTR scattering measurement " 国際会議
2004 Inter. Conf. Indium Phosphide and Related Materials
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"Coherent and diffuse scattering of synchrotronradiation by ultrathin InGaP and InGaAs layers" 国際会議
Modern analysis methods of diffraction data (topography, diffractometry, electron microscopy)/ II International scientific Seminar
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"Synchrotron x-ray scattering from planar nanostructures " 国際会議
Experiment and numerical modeling X-ray optics-2004 Conference
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" Investigation of InGaN nanostructures bymethods of synchrotron radiation " 国際会議
Proceedings of “Nanosizesystems" Conference
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" Interface structures of OMVPE-grown GaAs/GaInP/GaAs studied by X-ray CTR scattering measurement" 国際会議
2003 Inter. Conf. Indium Phosphede and Related Materials
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" Local structures around Er atoms doped in GaAs by low-temperature molecular beam epitaxy" 国際会議
1st Int. Symp. Point Defect and Nonstoichiometry 2003 (ISPN 2003)
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" Fluorescence EXAFS analysis for ErP grown on InP by organometallic vapor phase epitaxy using a new organometal Er(EtCp)3 " 国際会議
1st Int. Symp. Point Defect and Nonstoichiometry 2003 (ISPN 2003)
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" Composition dependences of InP/InGaAsP/InP interface structures analyzed by X-ray CTR scattering measurements "
4th Int. Symp. Control of Semiconductor Interfaces
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" High-resolution X-ray diffractometry investigation of interface layers in GaN/AlN structures grwon on sapphire substrates" 国際会議
7th International Conference on the Structure of Surfaces (ICSOS)