Papers - YAMADA Tomoaki
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強誘電性・強磁性マルチフェロイック物質の現状と展望
脇谷尚樹, 篠崎和夫, 木口賢紀, 山田智明, 水谷惟恭
マテリアル インテグレーション TIC Vol. 19 ( 9 ) page: 9-18 2006.9
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Epitaxial/amorphous Ba0.3Sr0.7TiO3 Film Composite Structure for Tunable Applications Reviewed
T.Yamada, V.O.Sherman, A.Noeth, P.Muralt, A.K.Tagantsev, and N.Setter
Applied Physics Letters Vol. 89 page: 032905 2006
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In-plane and Out-of-plane Ferroelectric Instabilities in Epitaxial SrTiO3 Films Reviewed
T.Yamada, J.Petzelt, A.K.Tagantsev, S.Denisov, D.Noujni, P.K.Petrov, A.Mackova, K.Fujito, T.Kiguchi, K.Shinozaki, N.Mizutani, V.O.Sherman, P.Muralt, and N.Setter
Physical Review Letters Vol. 96 page: 157602 2006
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Strain Relaxation and Dislocation Confinement in Epitaxial SrTiO3 by Two-step Growth Technique and the Resulting Dielectric Response Reviewed
T.Yamada, V.O.Sherman, A.K.Tagantsev, D.Su, P.Muralt, and N.Setter
Mater. Res. Soc. Symp. Proc. Vol. 902E page: 0902-T10-02 2006
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Ferroelectric Thin Films: Review of Materials, Properties and Applications Reviewed
N.Setter, D.Damjanovic, L.Eng, G.Fox, S.Gevorgian, S.Hong, H.Kohlstedt, A.Kingon, N.Y.Park, G.B.Stephenson, I.Stolitchnov, A.K.Tagantsev, D.V.Taylor, T.Yamada, and S.Streiffer
Journal of Applied Physics Vol. 100 page: 051606 2006
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Uncertainty of Ba0.3Sr0.7TiO3 Thin Film Permittivity Extracted from Measurements of Planar Capacitors Reviewed
M.Vukadinovic, B.Malic, M.Mandeljc, M.Kosec, V.O.Sherman, T.Yamada, and N.Setter
Proc. 42nd International Conference on Microelectronics, Devices and Materials (MIDEM) page: 157 2006
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Ba0.3Sr0.7TiO3 Thin Films on Alumina Substrates: Effect of Processing Conditions on the Dielectric Response Reviewed
B.Malic, I.Boerasu, M.Mandeljc, M.Kosec, V.O.Sherman, T.Yamada, N.Setter, and M.Vukadinovic
Proc. 42nd International Conference on Microelectronics, Devices and Materials (MIDEM) page: 151 2006
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Self-selective Epitaxial Growth of BST Films: toward Nano-composite Structure for Microwave Tunable Devices Reviewed
T.Yamada, V.O.Sherman, A.Noeth, P.Muralt, A.K.Tagantsev, and N.Setter
Mater. Res. Soc. Symp. Proc. Vol. 928 page: 0928-GG01-03 2006
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Strain Relaxation of Epitaxial SrTiO3 Thin Films on LaAlO3 by Two-step Growth Technique Reviewed
T.Yamada, K.F.Astafiev, V.O.Sherman, A.K.Tagantsev, P.Muralt, and N.Setter
Applied Physics Letters Vol. 86 page: 142904 2005
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Structural and Dielectric Properties of Strain-controlled Epitaxial SrTiO3 Thin Films by Two-step Growth Technique Reviewed
T.Yamada, K.F.Astafiev, V.O.Sherman, A.K.Tagantsev, D.Su, P.Muralt, and N.Setter
Journal of Applied Physics Vol. 98 page: 054105 2005
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Structural and Physical Characterization of Ba0.3Sr0.7TiO3 Thin Films Prepared by Chemical Solution Deposition Reviewed
I.Boerasu, B.Malic, M.Mandeljc, M.Kosec, V.Bobnar, V.Sherman, T.Yamada, N.Setter
Proc. 41st International Conference on Microelectronics, Devices and Materials (MIDEM) page: 107 2005
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Effective Buffer Structures and Dielectric Properties of Epitaxial Pb(Mg1/3Nb2/3)O3 Thin Films on Si Substrates Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, N.Mizutani, M.Kondo, and K.Kurihara
Key Engineering Materials Vol. 248 page: 65 2003
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Growth Behavior of Epitaxial MgO Films on Si(001) by Pulsed Laser Deposition Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Key Engineering Materials Vol. 253 page: 119 2003
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Epitaxial Growth of SrTiO3 Films on CeO2/YSZ/Si(001) with TiO2 Atomic Layer by Pulsed Laser Deposition Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Applied Physics Letters Vol. 83 page: 4815 2003
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Role of the First Atomic Layers in Epitaxial Relationship and Interface Characteristics of SrTiO3 Films on CeO2/YSZ/Si(001) Reviewed
T.Yamada, T.Kiguchi, N.Wakiya, K.Shinozaki, and N.Mizutani
Mater. Res. Soc. Symp. Proc. Vol. 747 page: 9 2003
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Growth Mechanism of SrTiO3 Thin Film on CeO2(001) Surface Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Key Engineering Materials Vol. 228-229 page: 137 2002
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Preparation of Epitaxial YSZ Thin film Deposited on SiO2/Si(001) at Room Temperature by Pulsed Laser Deposition(PLD) Reviewed
H.Ishigaki, T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Journal of the Ceramic Society of Japan Vol. 110 page: 333 2002
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Depth Profile of Fixed Charge in Epitaxial Oxide Films on Silicon Substrate for MFIS Structure Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Proc. IEEE 13th International Symposium on the Applications of Ferroelectrics page: 159 2002
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Effect of the Thickness of SiO2 under Layer on the Initial Stage of Epitaxial Growth Process of Yttria-Stabilized Zirconia (YSZ) Thin Film Deposited on Si(001) Substrate Reviewed
H.Ishigaki, T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Journal of the Ceramic Society of Japan Vol. 109 page: 766 2001
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Effect of Yttria-Stabilized Zirconia Thickness on Crystal Structure and Electric Property of Epitaxial CeO2/Yttria-Stabilized Zirconia Buffer Layer in Metal/Ferroelectric/Insulator/Semiconductor Structure Reviewed
T.Yamada, N.Wakiya, K.Shinozaki, and N.Mizutani
Japanese Journal of Applied Physics Vol. 40 page: 281 2001