Faculty Profiles - SAITOH, Koh

Papers - SAITOH, Koh

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The Boersch effect in a picosecond pulsed electron beam emitted from a semiconductor photocathode Reviewed

M. Kuwahara, Y. Nambo, K. Aoki, K. Sameshima, X. Jin, T. Ujihara, H. Asano, K. Saitoh, Y. Takeda, and N. Tanaka

Applied Physics Letters Vol. 109 page： 013108 2016

Strain evolution of epitaxial tetragonal-like BiFeO3 thin films on LaAlO3(001) substrates prepared by sputtering and their bulk photovoltaic effect Reviewed

S. Nakashima, T. Uchida, K. Doi, K. Saitoh, H. Fujisawa, O. Sakata, Y. Katsuya, N. Tanaka, and M. Shimizu

Japanese Journal of Applied Physics Vol. 55 page： 101501 2016

Electron Diffractive imaging using Fork-Shaped Grating Masks Reviewed

H. Nambu, K. Saitoh, M. Uchida

AMTC Letters Vol. 5 page： 248-249 2016

In situ Observation of Interfaces between Metal Electrode and Solid Oxide Electrolyte Prepared by FIB Reviewed

T. Ishida, T. Tanji, M. Tomita, K, Higuchi, K. Saitoh

AMTC Letters Vol. 5 page： 62-63 2016

Measuring the Orbital Angular Momentum of Electron Vortex Beams Using a Forked Grating Reviewed

K. Saitoh, Y. Hasegawa, K. Hirakawa, N. Tanaka, and M. Uchida

Physical Review Letters Vol. 111 page： 074801 2013.8

Authorship：Lead author Language：English Publishing type：Research paper (scientific journal)

The present study experimentally examines how an electron vortex beam with orbital angular momentum (OAM) undergoes diffraction through a forked grating. The nth-order diffracted electron vortex beam after passing through a forked grating with a Burgers vector of 1 shows an OAM transfer of n@. Hence, the diffraction patterns become mirror asymmetric owing to the size difference between the electron beams. Such a forked grating, when used in combination with a pinhole located at the diffraction plane, could act as an analyzer to measure the OAM of input electrons.

DOI： 10.1103/PhysRevLett.111.074801

Propagation Dynamics of Electron Vortex Pairs Reviewed

Y. Hasegawa, K. Saitoh, N. Tanaka, and M. Uchida

Journal of the Physical Society of Japan Vol. 82 page： 073402 2013.6

Language：English Publishing type：Research paper (scientific journal)

Electron vortex beams carrying orbital angular momentum have been experimentally realized very recently. Here, we present the generation and propagation dynamics of electron vortex pairs embedded in a single beam, using a nanofabricated holographic grating. The rotation of two electron vortices with the same topological charges and the annihilation of two electron vortices with opposite charges were observed. The experimental results are well explained by the Gouy phase shift and confirmed by numerical simulations of the propagation. The results of this study may help develop an intuitive understanding of electron vortex motion and give a new viewpoint for analyzing electron microscope images and phase change in a crystal.

DOI： 10.7566/JPSJ.82.073402

らせん状の波面をもつ電子波の生成、伝播、干渉 Invited Reviewed

齋藤晃、長谷川裕也、内田正哉

顕微鏡 Vol. 48 ( 1 ) page： 39-46 2013.4

Young's Interference Experiment with Electron Beams Carrying Orbital Angular Momentum Reviewed

Y. Hasegawa, K. Saitoh, N. Tanaka, S. Tanimura and M. Uchida

Journal of the Physical Society of Japan Vol. 82 page： 033002 2013.2

Language：English Publishing type：Research paper (scientific journal)

A Young's-type double-slit experiment using electron beams carrying orbital angular momentum (OAM) is demonstrated in a transmission electron microscope. Each of the slits is replaced by a grating mask with a fork dislocation, which generates electron beams with OAM as diðracted beams. Interference fringes produced by two diðracted electron beams with OAM appear at the observation screen. The interference fringe patterns exhibit dislocation features depending on the topological charges of the two electron beams. The experimental results clearly show the wave nature of the electron beams with OAM and gives potential applications in electron physics and quantum mechanics.

DOI： 10.7566/JPSJ.82.033002

HOLZ線図形をもちいたSiGe/Si界面近傍の格子湾曲および伸張歪みの解析 Invited Reviewed

齋藤晃

まてりあ Vol. 51 ( 8 ) page： 371-378 2012

30-kV spin-polarized transmission electron microscope with GaAs-GaAsP strained superlattice photocathode Reviewed

M. Kuwahara, S. Kusunoki, X. G. Jin, T. Nakanishi, Y. Takeda, K. Saitoh, T. Ujihara, H. Asano, and N. Tanaka

Vol. 101 ( 3 ) page： 033102 2012

Electron interference from an amorphous thin film on a crystal transmission electron microscopy specimen Reviewed

Rodney A. Herring, Koh Saitoh, Takayoshi Tanji, and Nobuo Tanaka

Journal of Electron Microscopy Vol. 61 page： 17-23 2012

Production of electron vortex beams carrying large orbital angular momentum using spiral zone plates Reviewed

Koh Saitoh, Yuya Hasegawa, Nobuo Tanaka, and Masaya Uchida

Journal of Electron Microscopy Vol. 61 ( 3 ) page： 171-177 2012

Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation Invited Reviewed

Xiuguang Jin, Hirotaka Nakahara, Koh Saitoh, Takashi Saka, Toru Ujihara, Nobuo Tanaka, Yoshikazu Takeda

Journal of Crystal Growth Vol. 353 page： 84-87 2012

内殻励起をともなう非弾性散乱をもちいた電子構造異方性解析 Invited Reviewed

齋藤晃

顕微鏡 Vol. 47 ( 4 ) page： 228-237 2012

Observation of the hole state symmetry of MgB2 by inelastic scattering of fast electrons accompanied by boron K-shell excitation Reviewed

K. Saitoh, K. Momonoi, N. Tanaka, and S. Onari

Journal of Applied Physics Vol. 112 page： 113920 2012

Three-dimensional reconstruction of the atomic arrangement of icosahedral quasicrystals by binary discrete tomography Reviewed

Y. Ishibashi, H. Sugiura, K. Saitoh, and N. Tanaka

Philosophical Magazine Letters Vol. 91 ( 9 ) page： 632-639 2011

Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns Reviewed

K. Saitoh, Y. Yasuda, M. Hamabe and N. Tanaka

J. Electron Microsc. Vol. 59 page： 367-378 2010.10

Coherent electron interference from amorphous TEM specimens Reviewed

R. A. Herring, K. Saitoh, N. Tanaka and T. Tanji

J. Electron Microsc. Vol. 59 page： 321-330 2010.10

Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe Reviewed

K. Saitoh, Y. Tatara and N. Tanaka

J. Electron Microsc. Vol. 59 page： 387-394 2010.10

Factors Affecting Extreme Ultraviolet Reflectivity of Mo/Si Multilayer FilmsSynthesized by Superconducting Magnetron Sputtering Reviewed

Uichiro Mizutani, Takashi Yamaguchi, Tetsuya Tomofuji, Yousuke Yanagi,Yoshitaka Itoh, Koh Saitoh, Nobuo Tanaka, Noriaki Matsunami, and Hiroshi Ikuta

Japanese Journal of Applied Physics Vol. 48 page： 025507-1-6 2009.2

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