Faculty Profiles - MUTO, Shunsuke

Papers - MUTO, Shunsuke

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Energy drifts correction of electron energy-loss spectra for prolonged data accumulation of low SNR signals Reviewed

Y. Sasano and S. Muto

Journal of Electron Microscopy Vol. 57 page： 149-158 2008

Site-selective electronic structure of aluminum in oxide ceramics obtained by TEM-EELS analysis using the electron standing-wave method Reviewed

Y. Yamamoto, K. Tatsumi and S. Muto

Materials Transaction Vol. 48 page： 2590-2594 2007.12

Depth-resolved EELS and chemical state mapping of N+-implanted TiO2 photocatalyst Reviewed

T. Yoshida, S. Muto and J. Wakabayashi

Materials Transaction Vol. 48 page： 2580-2584 2007.12

Measurement of Surface/Interface Electronic States by Position-Resolved Electron Energy-Loss Spectroscopy and Its Spatial Mapping on Nanometer Scale Invited

Vol. 45 ( 2 ) page： 27-38 2007.2

Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon Reviewed

S. Muto, A. V. Vasin, Y. Ishikawa, N. Shibata, J. Salonen, and V-P. Lehto

Materials Science Forum Vol. 561-565 page： 1127-1130 2007

Site-by-site Electronic Structure Analysis of Al-containing Complex Compounds Using Channeling EELS and First Principles Calculations Reviewed

K. Tatsumi, Y Yamamoto and S. Muto

Materials Science Forum Vol. 561-565 page： 2091-2094 2007

Hydrogen Quasi-Chemically Trapped Between Defective Graphene Layers in Nanostructured Graphite Reviewed

Y. Miyabe, T. Yoshida, S, Muto and T. Kiyobayashi

Materials Science Forum Vol. 561-565 page： 1585-1588 2007

Depth selective electronic state analysis of implanted nitrogen in visible-light response TiO2 photocatalyst Reviewed

T. Yoshida, S. Muto and J. Wakabayashi

Materials Sciencd Forum Vol. 561-565 page： 567-570 2007

In situ observation of reversible oxygen absorption/release of ceria-zirconia solid solution with Pt particles by TEM and EELS Reviewed

S. Arai, S. Muto, T. Sasaki, Y. Ukyo, K. Kuroda, H. Saka

Electrochem. Solid-State Lett. Vol. 9 page： E1-E3 2006.4

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I.Principle and test examples Reviewed

S. Muto, R. C. Puetter and K. Tatsumi

Journal of Electron Microscopy Vol. 54 ( 4 ) page： 215-223 2006.4

Fe-Co and Fe-Ni magnetic fine particles encapsulated by graphite carbon Reviewed

H. Tokoro, S. Fujii, S. Muto and S. Nasu

J. Appl. Phys. Vol. 99 page： 08Q512 2006.4

Intercalated hydrogen in nanostructured graphite studied by electron energy-loss spectroscopy and molecular orbital calculation Reviewed

T. Kimura, S. Muto, K. Tatsumi, T. Tanabe and T. Kiyobayashi

Journal of Alloys and Compounds Vol. 413 ( 1-2 ) page： 150-154 2006.3

Language：English Publishing type：Research paper (scientific journal)

Hydrogen loosely trapped between graphitic basal planes in hydrogenated nanostructured graphite was detected by the change in the relative intensity ratio of the π * and σ* peaks of the C K-edge in electron energy-loss spectroscopy (EELS). The experimental spectral change was explained by model calculations of intercalated hydrogen in graphitic sheets, using an ab initio molecular orbital (DV-X

Change in mechanical properties of ion-irradiated ceramics by nanoindentation method Reviewed

S. Nakano, S. Muto and T. Tanabe

Materials Transactions Vol. 47 ( 1 ) page： 112-121 2006.1

Language：English Publishing type：Research paper (scientific journal)

Changes in hardness of several representative ceramics and semiconductors associated with ion irradiation were systematically studied using a combination of nanoindentation and finite element analysis. We established a new method for obtaining the precise hardness of the embedded damaged layer of ion-irradiated samples. The method was applied to silicon carbide,

Site-specific electronic structure analysis by channeling EELS and first principles calculations Reviewed

K. Tatsumi, S. Muto, Y. Yamamoto, H. Ikeno, S. Yoshioka and I. Tanaka

Ultramicroscopy Vol. 106 page： 1019-1023 2006

Local Oxidation Induced by Inhomogeneous Stress on Blistered Si Surface Reviewed

S. Igarashi, A. N. Itakura, M. Kitajima, S. Nakano, S. Muto, T. Tanabe, H. Yamamoto and K. Hojou

Jpn. J. Appl. Phys. Vol. 45 page： 4179-4182 2006

Substructures of gas-ion-irradiation induced surface blisters in Si studied with cross-sectional transmission electron microscopy Reviewed

Vol. 46 ( 10 ) page： 2117-2124 2005.10

微小押し込み試験法によるセラミック材料のイオン照射に伴う力学特性変化 Reviewed

中野伸祐，武藤俊介，田辺哲朗

日本金属学会誌 Vol. 69 ( 9 ) page： 815-824 2005.9

非金属材料におけるヘリウム照射損傷について Invited Reviewed

武藤俊介

プラズマ・核融合学会誌 Vol. 81 ( 1 ) page： 41-45 2005.1

Structure of Oxygen-Related Defect Centers in of Ge1-xSix Alloys Studied by Extended Energy-Loss Fine Structure Analysis Reviewed

S. Muto, H. Sugiyama, I. Yonenaga and T. Tanabe

Japanese Journal of Applied Physics Vol. 44 page： 1892-1896 2005

Transmission electron microscopy and electron energy loss spectroscopy analysis of hydrogenated nanostructured graphite prepared by mechanical milling Reviewed

S. Muto, T. Kimuta, T. Kiyobayashi, T. Tanabe and T. Maruyama

Japanese Journal of Applied Physics Vol. 44 page： 2061-2068 2005

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Papers - MUTO, Shunsuke