Faculty Profiles - SAITOH, Koh

Presentations -

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Phase retrieval of electron rocking curves with total variation and total squared variation International conference

Koh Saitoh, Akihiro Shichi

The 20th International Microscopy Congress 2023.9.12

Event date： 2023.9

Language：English Presentation type：Oral presentation (general)

Venue：Busan Country：Korea, Republic of

This paper presents a method of phase retrieval of electron rocking curves observed in a convergent-beam electron diffraction (CBED) pattern by introducing total variation (TV) and total squared variation (TSV) regularizations. The TV and TSV regularizations contribute to suppress overfitting to noise and background in rocking curves and to reproduce the sparse characteristic of the variations of the lattice displacement fields such as stacking faults and dislocations, which are localized only in the vicinity of lattice defects. Conventionally, the phase retrieval using diffraction intensity has been limited to thin specimens, in which the diffraction intensities are approximated by the absolute squares of the Fourier transform of the structure of the specimen. The TV and TSV regularizations are also effective to suppress overfitting to dynamical diffraction intensities which are observed in CBED patterns taken from thick specimens.
The phase retrieval by the present method is demonstrated by using kinematical and dynamical simulated CBED patterns with artificial noise and background. The phase retrieval of the experimental rocking curves taken from a stacking fault in a stainless steel is also demonstrated. The accuracy of the phase reconstruction by the present method is discussed.

Dynamic Imaging of Electrochemical Reactions in All-Solid-State Li-Ion Batteries by Operando Scanning Transmission Electron Microscopy International conference

K. Saitoh

The 3rd Workshop of the Reaction Infography (R-ing) Unit 2020.12.11

Measuring Orbital Angular Momentum of Electron Beams Using Vortex Gratings Invited International conference

齋藤　晃

2020.11.12

Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography International conference

T. Hirayama, S. Anada, Y. Nomura, H. Sasaki, K. Saitoh and K. Yamamoto

Microscopy and Microanalysis 2020 2020.8.6 Microscopy Society of America

Performance of orbital-angularmomentum measurements using forked gratings International conference

K. Saitoh, Y. Noguchi, W. Li, M. Uchida

International Conference on Materials and Systems for Sustainability 2019 2019.11 ICMaSS2019, Nagoya University

Observation of Manganese Nitride Thin Films by Electron Microscopy International conference

T. Suzuta, Y. Kawasaki, K. Tanaka, T. Ishida, T. Hatano, H. Ikuta and K. Saitoh

International Conference on Materials and Systems for Sustainability 2019 2019.11 ICMaSS2019, Nagoya University

How to Use Angular Fourier Transform for Orbital Angular Momentum Spectrum Mapping International conference

W. Li, K. Saitoh and M. Uchida

International Conference on Materials and Systems for Sustainability 2019 2019.11 ICMaSS2019, Nagoya University

Image Reconstruction of HighResolution STEM Image by Dictionary Learning and Evaluation of Atom Displacement International conference

S. Hattori, Y. Nomura and K. Saitoh

International Conference on Materials and Systems for Sustainability 2019 2019.11 ICMaSS2019, Nagoya University

Orbital angular momentum spectrum measured by forked gratings and its relation to angular Fourier transform International conference

K. Saitoh

Microscopy Conference 2019 2019.9

Visualization of a Li-Ionic Space-Charge Layer in a Solid-Electrolyte by Transmission Electron Microscopy International conference

Y. Nomura, K. Yamamoto, T. Hirayama, E. Igaki, K. Saitoh

The 6th International Symposium on Advanced Microscopy and Theoretical Calculations 2019.6.14 Japan Fine Ceramics Cnter

Analysing 3D distribution of nanoparticles by aberration-corrected TEM focal series

J. Yamasaki, M. Kano, K. Saitoh, K. Yoshida, K. Kobayashi, and N. Tanaka

The Fifth Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO2019) 2019.5 Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons

In situ STEM-EELS observation in an all-solid-state lithium-ion battery International conference

Y. Nomura, K. Yamamoto, T. Hirayama, K. Saitoh