論文 - 武藤 俊介
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Application of spline wavelet transformation to the analysis of extended energy-loss fine structure 査読有り
S. Muto
Journal of Electron Microscopy 49 巻 頁: 525-529 2000年4月
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Temperature effect of electron-irradiation-induced structural modification in graphite 査読有り
S. Muto and T. Tanabe
Journal of Nuclear Materials 283-287 巻 頁: 917-921 2000年
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Extraction of three-body distribution in amorphous silicon by wavelet analysis of EXELFS
S. Muto, K. M. Yu, W. Walukiewicz, H-C. Jin and J. R. Abelson
Proceedings of 12th European Congress on Electron Microscopy, EUREM-2000 1 巻 頁: 319-320 2000年
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TEM study on deuterium irradiation-induced defects in tungsten and molybdenum 査読有り
T. Matsui, S. Muto and T. Tanabe
Journal of Nuclear Materials 283-287 巻 頁: 1139-1143 2000年
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Wavelet analysis of extended energy-loss fine structure
S. Muto
Proceedings 12th European Congress on Electron Microscopy, EUREM-2000 1 巻 頁: 321-322 2000年
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Structural Change in Graphite under Electron Irradiation at Low Temperatures
Journal of Nuclear Materials 271&272 巻 頁: 280-284 1999年4月
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Local structures of Ga atoms in amorphous silicon and hydrogenated amorphous silicon before and after synchrotron X-ray irradiation
K. M. Yu, W. Walukiewicz, S. Muto, H.-G. Jin, J. R. Abelson, C. Clerc, C. J. Glover and M. C. Ridgway
Applied Physics Letters 75 巻 ( 21 ) 頁: 3282-3284 1999年4月
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Fragmentation of graphite crystals by electron irradiation at elevated temperatures
S. Muto and T. Tanabe
Journal of Electron Microscopy 48 巻 ( 5 ) 頁: 519-523 1999年4月
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Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
S. Muto, S. Horibuchi and T. Tanabe
Journal of Electron Microscopy 48 巻 ( 6 ) 頁: 767-776 1999年4月
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Change in Chemical Bonding States in Electron-Irrodiated Graphite(共著)
Japanese Journal of Applied Physics Part(]G0001[) 38 巻 ( 3A ) 頁: 1514-1515 1999年
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On EXELFS data analysis for obtaining reliable structural parameters
Y. Kobayashi, S. Muto, C. J. Echer and T. Tanabe
Journal of Electron Microscopy 48 巻 ( 5 ) 頁: 525-529 1999年
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The effects of X-ray induced structural changes on the microstructure of a-Si after thermal crystallization
K. M. Yu, W. Walukiewicz, S. Muto, H-C. Jin and J. R. Abelson
Applied Physics Letters 75 巻 ( 14 ) 頁: 2032-2034 1999年
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TEM Analysis of Surface Ridge Network in an Ion-Irradiated Graphite Thin Film
S. Muto, T. Tanabe, M. Takeuchi, Y. Kobayashi, S. Furuno and K. Hojou
Journal of Nuclear Materials 271&272 巻 頁: 285-289 1999年
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Molecular Dynamics Study on Local Atomic Displacements Associated with Point Defects and Displacive Phase Transformations(共著)
Materials Transactions, JIM 40 巻 ( 6 ) 頁: 514-521 1999年
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The Influence of X-ray Irradiation on Structural Relaxation and Crystallization of Amorphous Silicon films
S. Muto, Y. Kobayashi, K.-M. Yu, W. Walukiewicz, C.J. Echer, S. McCormick and J.R. Abelson
Japanese Journal of Applied Physics 37 巻 ( 11 ) 頁: 5890-5893 1998年4月
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HREM-EELS Study of Structural Changes in Electron Irradiated Graphite (共著)
Proceedings of 14th International Congress on Electron Microscopy 頁: 119 1998年
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Lacal Atom Displacements Around Crystal Lattice Defects Inducing Phase Transformation Studies by Molecular Dynamics Simulation (共著)
Proceedings of Pacific Rim International Conference on Advanced Materials and Processing 頁: 1461 1998年
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Spatial and Structural Modification in Graphite by High-Energy Electron Irradiation (共著)
Proceedings of 5-th NIRIM International Symposium on Advanced Materials 頁: 129 1998年
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TEM-EELS法による黒鉛の電子照射誘起構造変化 招待有り 査読有り
まてりあ 37 巻 ( 10 ) 頁: 873-879 1998年
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A New Microscopic Model of Electron Irradiation Damage in Graphite
S. Muto, M. Takeuchi and T. Tanabe
Journal of Surface Analysis 3 巻 ( 2 ) 頁: 420-425 1997年4月